• 한국생물공학회:학술대회논문집
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• 2005.04a
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• pp.563-563
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• 2005

• Proceedings of the Materials Research Society of Korea Conference
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• 2007.11a
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• pp.156.1-156.1
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• 2007

• 한국초전도학회:학술대회논문집
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• v.14
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• pp.89-89
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• 2004

• Proceedings of the Korean Vacuum Society Conference
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• 2003.02a
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• pp.205-205
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• 2003

• Proceedings of the Korean Vacuum Society Conference
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• 2001.07a
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• pp.165-165
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• 2001

• 한국전기화학회:학술대회논문집
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• 2001.10a
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• pp.19-19
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• 2001

• Proceedings of the Materials Research Society of Korea Conference
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• 1993.05a
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• pp.89-90
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• 1993

• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2000.11a
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• pp.23-24
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• 2000

• Proceedings of the Korean Institute of Surface Engineering Conference
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• 2006.10a
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• pp.65-65
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• 2006

• 한국정보디스플레이학회:학술대회논문집
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• 2000.01a
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• pp.205-206
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• 2000

The capacitance-temperature (C-T) measurement technique is proposed in the present work to investigate the thermal stability of organic and polymeric thin films for organic electroluminescent display (OELD). The single layer devices with the individual materials were subjected to the C-T measurement, prior to the examination of the complete OELD. The single layer devices with the small molecules destroyed below $180\;^{\circ}C$ depending on the kinds of materials. However, the device with the hole-transporting polyimide did not show any relaxation up to $200\;^{\circ}C$. The small molecule based OELDs failed to emit light after annealing, whereas that with the hole-transporting polyimide worked well in spite of large reduction in intensity.