• Journal of the Korean Crystal Growth and Crystal Technology
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• v.29 no.6
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• pp.270-275
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• 2019

Mica capacitor is being adopted for high voltage firing unit of guided weapon system because of its superior impact enduring property relative to ceramic capacitor. Reliability of localized mica high voltage capacitors was verified through environmental test like terminal strength test, humidity test, thermal shock test and accelerated life test for application to high voltage firing unit. Failure mode of mica capacitor is a decrease of insulation resistance and its final dielectric breakdown. Main constants of accelerated life model were derived experimentally and voltage constant and activation energy were 5.28 and 0.805 eV respectively. Lifetime of mica capacitor at normal use condition was calculated to be 38.5 years by acceleration factor, 496, and lifetime at accelerated condition and this long lifetime confirmed that mica high voltage capacitor could be applied for firing unit.

• Proceedings of the Korean Reliability Society Conference
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• 2011.06a
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• pp.55-60
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• 2011

Recently, the application of electronics in vehicle is increasing, in order to assess the reliability of the electronics, highly accelerated life test is used, highly accelerated life test can assess the reliability of the electronics in the short time. In this study, optimized HALT technique can be applied to the electronics is proposed. The main results are as follows; i) HALT is proceed to the 8-step process. ii) The test mode of HALT is composed of the cold step stress, hot step stress, vibration step stress and combined environments stress. iii) The time dwell is set to at least 20 minutes.

• Journal of the Microelectronics and Packaging Society
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• v.19 no.1
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• pp.1-7
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• 2012

Reliability technology has been expected to grow rapidly for new types of electronic equipments. We have selected several reliability issues in electronic package to be reviewed. This paper will provide a view of the current state of technological progress in reliability of electronic package in Japan, and will discuss future prospects for the technology.

• Journal of Applied Reliability
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• v.16 no.3
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• pp.180-191
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• 2016

Purpose: The purpose of this study was to develop the accelerated life test method for Constant Electrical Potential Electrolysis gas sensor (CEPE gas sensor). Methods: The parts and modules of CEPE gas sensor were analyzed by using Reliability Block Diagram (RBD). Failure Mode and Effect Analysis (FMEA) and Quality Function Deployment (QFD) methods were performed for each part to determine the most affecting stress factor in its life cycle. The long term testing was conducted at three different dry heat levels and the acceleration factor was developed by using Arrhenius relationship. Conclusion: The acceleration factor for CEPE gas sensor was developed by using FMEA, QFD, and statistical analysis for its failure data. Also qualification tests were designed to meet the target life.

• Journal of Digital Contents Society
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• v.15 no.1
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• pp.19-27
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• 2014

In order to estimate the life of 2,5 inch HDD which is adopted by PC environment, make the test plan which reflect the failure mode of market, make the test model of accelerated life test which reflect the stress of temperature. after an analysis of the environment of PC using, test procedure was decided that operation was write 50 % and read 50 %, and then access method was sequential 50 % and random 50%. The acceleration life test was executed on condition that temperature was $50^{\circ}C$ and $60^{\circ}C$, performance was 95 % in max performance, test time was 1000 hours. by the test of goodness of fit of anderson-darling of the failure data during test, it was confirmed that the distribution of failure fellow weibull. test for shape and scale was equal, and shape parameter was 0.7177, characteristic life was 429434 hours at normal user condition($30^{\circ}C$) by the analysis of weibull-arrhenius modeling. It made no difference about the statistics when equality test was executed. The activation energy was 0.2775eV. In analyzing between the failure samples of acceleration test and the samples of market return even though there is detail difference about the share of failure mode, the rank of share was almost same. This study suggest the test procedure of acceleration test of 2.5 inch HDD in PC using environment, and help the life estimation at manufacture and user.

• Proceedings of the KSME Conference
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• 2008.11a
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• pp.1259-1264
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• 2008

This paper presents an accelerated life test for burn out of tungsten filament of automotive halogen lamp. There are many failure modes and failure factors that associated with tungsten filament. But in this explain the dominant failure mode of tungsten filament is the bumout of the filament failure. At first, over voltage, high temperature, inrush current and vibration are selected as stress factors by using of two stage Quality Function Deploymeng(QFD). And we planed accelerated life test that has one factor(voltage) and three levels. By experiment it has absorbed that over voltage has an effect on the life of halogen lamp. Using ALTA programs, we estimated the common shpae parament of Weibull distribution, life-stress relationship and $B_{100p}$ life.

• Journal of Applied Reliability
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• v.6 no.1
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• pp.93-103
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• 2006

Basic function of calorifier system is to supply warm water to the vessel. The heater used in the calorifier system plays a very important role in its reliability. The failure mechanism of heater are compared with accelerated life test. The main cause of failed heater is pitting corrosion occurred between the surface of heater and spacer. To prevent the corrosion failure from heater, material of spacer replaces metal(SUS 304) with polymer (Acryl). The life of redesigned heater can guarantee 2.47years of B10 life under the worst condition.

• Proceedings of the Korean Reliability Society Conference
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• 2005.06a
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• pp.51-67
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• 2005

General chip SMD parts(chip resistance, chip capacitor, chip varistor etc.) are very wide sed electronics parts for IT units. But, failure modes are indistinct for these chip parts. In factory and field the failure modes are recognized to accidental failure mope caused by potential defect. In this paper used chip varistor ALT(Accelerate Life Test) test for verify general failure modes in chip SMD parts. Also the results are useful for general chip SMD ALT tests.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.19 no.8
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• pp.239-245
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• 2018

The importance of reliability in the development of weapons systems and reliability tests has been emphasized recently. Therefore, this study evaluated a reliability test design method of a bladder type accumulator and proposed a process for reliability test design. To design the reliability test of the accumulator, the main failure modes and failure mechanisms were investigated, and the main stress factors were analyzed to select the appropriate acceleration model. A steady - state reliability test was designed according to the number of samples, and the reliability level and accelerated life test time were calculated according to the acceleration factor computed using the selected acceleration model.

• Journal of Drive and Control
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• v.15 no.4
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• pp.48-54
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• 2018

The hydraulic servo actuator has always operated very precisely with high frequency and small displacement, and is used continuously for a long time. The hydraulic servo actuator of the test equipment used in the accelerated life test in order to guarantee the service life of the automotive parts failed earlier than the products before finishing the test. This study performed an analysis on the cause of the failure of the hydraulic servo actuator used in the test equipment, changed the design of the actuator to solve the root cause of the main failure mode, and developed the improved servo actuator. Based on above process, this study established a better performances and longer lifetime of the servo actuator after testing.