• Journal of Korean Institute of Industrial Engineers
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• v.34 no.1
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• pp.23-31
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• 2008

This paper presents accelerated degradation test plans considering adoption of tightened critical values. Under arandom coefficient degradation rate and log-linear acceleration models, the asymptotic variance of an estimatorfor a lifetime quantile at the use condition as the optimization criterion is derived where the degradation ratefollows a lognormal and Reciprocal Weibull distributions, respectively and then the low stress level andproportions ofunits allocated to each stress level are determined. We also show that the developed test plans canbe applied to the multiplicative model with measurement error.

• Journal of the Korean Data and Information Science Society
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• v.26 no.1
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• pp.271-280
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• 2015

In this paper, the maximum likelihood estimators for parameters are derived under three step-stress accelerated life tests for Type-I hybrid censored data. The exponential distribution and the cumulative exposure model are considered based on the assumption that a log quadratic relationship exits between stress and the mean lifetime ${\theta}$. The test plan to search optimal stress change times minimizing the asymptotic variance of maximum likelihood estimators are presented. A numerical example to illustrate the proposed inferential procedures and some simulation results to investigate the sensitivity of the optimal stress change times by the guessed parameters are given.

• Journal of Korean Society for Quality Management
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• v.40 no.2
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• pp.117-125
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• 2012

For the highly reliable products, an accelerated degradation test (ADT) is a useful tool which has been employed in industry to obtain reliability-related information within an affordable amount of time and cost. In an ADT, as all other reliability tests, it is important to carefully design the ADT beforehand to obtain estimates of the quantities of interest as precisely as possible. In this paper, optimal ADTs are developed assuming that the constant-stress loading method is employed and the degradation characteristic follows a Wiener process. Under the constraint that the total cost does not exceed a pre-specified budget, the stress levels, the number of test units allocated to each stress level and the number of measurement (termination time) are determined such that the asymptotic variance of the maximum likelihood estimator of the q-th quantile of the lifetime distribution at the use condition is minimized.

• Journal of Applied Reliability
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• v.9 no.4
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• pp.291-302
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• 2009

Accelerated and field degradation tests are performed for reliability assessment of an anticorrosive paint for steel structures. Test data were analyzed to obtain the degradation model and the life time distributions of the paint. A power law degradation model and lognormal performance distribution were used to predict the lifetime of the anticorrosive paint and the method of finding an acceleration factor is provided.

• Journal of Applied Reliability
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• v.17 no.2
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• pp.112-121
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• 2017

Purpose: The most previous works on designing accelerated life tests (ALTs) are focused on the application of a single stress. Because of the difficulty to obtain the sufficient information in a reasonable duration using single stress only, there is needed in practice to use multiple-stress ALTs frequently. This paper presents new practical plans with two stresses for Weibull distribution. Methods: The four-level practical plans based on rectangle test region are proposed and compared with the corresponding three-level statistically optimal plans. Sensitivity analyses for assumed design parameters and life-stress relationship are conducted. Results: A procedure to choose practical ALT plans is illustrated with a numerical example and guidelines for planning two-stress ALTs are provided. Conclusion: The proposed two-stress ALT plans on practical constraints to assess a quantile of Weibull lifetime distribution at the use condition are efficient and robust.

• Journal of the Korean Data and Information Science Society
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• v.8 no.2
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• pp.183-194
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• 1997

In accelerated life tests, the failure time of an item is observed under a high stress level and based on the time, the failure rates of items we estimated at the normal stress level. In this paper, when the mean of the prior distribution of a parameter is known in Weibull lifetime model with censored failure time data, we study various estimating methods to obtain the empirical Bayes estimator of a parameter from the empirical Bayes approach under the normal stress level by considering the fact that the Bayes estimator is the function of prior parameters and of the acceleration parameter representing the effect of acceleration. And we compare the performance of several empirical Bayes estimators of a parameter in terms of the Bayes risk.

• Journal of the Korea Institute of Military Science and Technology
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• v.12 no.6
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• pp.719-726
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• 2009

A delay system in fuze for high explosive shell is an important safety device, but failure in the delay system usually causes failure of the shell. Root-cause analysis of failure in the delay system is required since failure in over 10-years stored delay system recently occurs. In this paper, failure in the delay system was reproduced experimentally to examine aged characteristics of the delay system, and the failed delay system shows the same characteristics as ones of failed delay systems in field. Based on the reproduced experiments, accelerated life testings and the data analysis of failure times of delay systems were performed to predict the storage lifetime.

• Journal of the Korean Society of Safety
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• v.29 no.1
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• pp.7-14
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• 2014

Inverter module, which feeds the converted power to the traction motor for EMU. Consists of the power semiconductors with their gate drive unit(GDU)s and the control computer for driving, voltage, current and speed controls. Electrolytic condenser, connected to the gate drive unit and a core component to drive the power semiconductor, has problems such as reduction in lifetime and malfunction caused by electrical and mechanical characteristic changes from heat generation during high speed switching for generation of stable power. In this study, To check the service life of electrolytic condenser, the test was carried out in two ways. First, In the case of accelerated life testing of condenser, the Arrhenius model is a way of life testing. Another way is to analyze the reliability of the failure data by the method of parametric data analysis. Eventually, life time by accelerated life test than a method of failure data analysis(Weibull distribution) was found to be slightly larger output.

• Smart Structures and Systems
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• v.22 no.2
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• pp.167-174
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• 2018

Digital input and output modules are widely used to connect digital sensors and actuators to automation systems. Digital I/O modules provide flexible connectivity extension to numerous sensors and actuators and protect systems from high voltages and currents by isolation. Components in digital I/O modules are inevitably affected by operating and environmental conditions, such as high voltage, high current, high temperature, and temperature cycling. Because digital I/O modules transfer signals or isolate the systems from unexpected voltage and current transients, their failures may result in signal transmission failures and damages to sensitive circuitry leading to system malfunction and system shutdown. In this study, the lifetime of optocouplers, one of the critical components in digital I/O modules, was predicted using Bayesian tracking approaches. Accelerated degradation tests were conducted for collecting the critical performance parameter of optocouplers, current transfer ratio (CTR), during their lifetime. Bayesian tracking approaches, including extended Kalman filter and particle filter, were applied to predict the failure. The performance of each prognostic algorithm was then compared using accuracy and robustness-based performance metrics.

• Transactions of the Korean Society of Mechanical Engineers A
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• v.40 no.3
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• pp.259-265
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• 2016

Recently, life prediction models for Pb-based and Pb-free solders used in chip resistor assemblies under thermal cycling have been introduced. The models suggest that the field lifetimes of Pb-free solders would be better than those of Pb-based solders when used for chip resistors under thermal cycling conditions, while the lifetime of the chip assemblies under accelerated test conditions show a reverse relationship. In this study, the prediction models were verified by applying the model to another research case. Finite element models were built, thermal cycling conditions were applied, and the energy densities were calculated. Finally, life prediction analysis was conducted for the cases where Pb-based and Pb-free solders were used. The prediction results were then compared with the test data of the case. It was verified that the predictions of the developed life cycle models are on the practical scale.