• Journal of the Korean Data and Information Science Society
• /
• v.13 no.2
• /
• pp.87-95
• /
• 2002

In this paper we consider optimal designs of partially accelerated life testing which is devised for multi-component mixed systems with the considerably long lifetime. Test items are run at both use condition and accelerated condition until a specified censoring time. The optimal criterion for the sample-proportion allocated to accelerated condition is to minimize asymptotic variance of the maximum likelihood estimators of the acceleration factor and hazard rates.

• Proceedings of the KSME Conference
• /
• 2008.11a
• /
• pp.384-389
• /
• 2008

An accelerated fatigue test is essentially required to maintain the reliability of the actual structure of KTX under operation conditions. However, actual fatigue life cannot be obtained if specimens are not adequate to the conventional fatigue test. Moreover component maker did not provide data of loading stress (S) - cycles at the failure (N). In this study, we suggest a prediction method of the S-N curve for establishing an accelerating test under various load levels. Load history was acquired from the field tests. A Rainflow method was used on the cycle counting of the field load data, and then, an S-N curve was obtained through the iteration process under the condition that the damage index satisfies to 1 in the Miner's rule.

• Journal of the Korea Safety Management & Science
• /
• v.2 no.2
• /
• pp.71-83
• /
• 2000

This paper presents accelerated life tests for Type I censoring data under probabilistic stresses. Probabilistic stress, $S_j$, is the random variable for stress influenced by test environments, test equipments, sampling devices and use conditions. The hazard rate, ,$theta_j$, is the random variable of environments and the function of probabilistic stress. Also it is assumed that the general stress distribution is uniform, the life distribution for the given hazard rate, $\theta$, is exponential and inverse power law model holds. In this paper, we obtained maximum likelihood estimators of model parameters and the mean life in use stress condition.

• Journal of the Korea Safety Management & Science
• /
• v.15 no.1
• /
• pp.109-120
• /
• 2013

As information-oriented industry has been developed and electronic devices has come to be smaller, lighter, multifunctional, and high speed, the components used to the devices need to be much high density and should have find pattern due to high integration. Also, diverse reliability problems happen as user environment is getting harsher. For this reasons, establishing and securing products and components reliability comes to key factor in company's competitiveness. It makes accelerated test important to check product reliability in fast way. Out of fine pattern failure modes, failure of Electrochemical Migration(ECM) is kind of degradation of insulation resistance by electro-chemical reaction, which it comes to be accelerated by biased voltage in high temperature and high humidity environment. In this thesis, the accelerated life test for failure caused by ECM on fine pattern substrate, $20/20{\mu}m$ pattern width/space applied by Semi Additive Process, was performed, and through this test, the investigation of failure mechanism and the life-time prediction evaluation under actual user environment was implemented. The result of accelerated test has been compared and estimated with life distribution and life stress relatively by using Minitab software and its acceleration rate was also tested. Through estimated weibull distribution, B10 life has been estimated under 95% confidence level of failure data happened in each test conditions. And the life in actual usage environment has been predicted by using generalized Eyring model considering temperature and humidity by developing Arrhenius reaction rate theory, and acceleration factors by test conditions have been calculated.

• Journal of the Korean Statistical Society
• /
• v.18 no.2
• /
• pp.125-134
• /
• 1989

This paper presents optimum simple step-stress accelerated life test plans for the case where the test process is observed periodically at intervals of the same length. Two types of failure data, periodically observed complete data and periodically observed censored data, are considered. An exponential life distribution with a mean that is a log-linear function of stress, and a cumulative exposure model for the effect of changing stress are assumed. For each type of data, the optimum test plan which minimizes the asymptotic variance of the maximum likelihood estimator of the mean life at a design stress is obtained and its behaviors are studied.

• Corrosion Science and Technology
• /
• v.12 no.5
• /
• pp.209-214
• /
• 2013

In the industry, accelerated corrosion test is used for the life time prediction. When anti-corrosion test proceeds in real environments, it is difficult that we predict and evaluate the corrosion life time because of the long test time such as 10 years or more time. Accelerated corrosion test and Salt spray test are able to test corrosion life time of products in the laboratory instead of outdoor corrosion test. Experimental procedure is selected for the corrosion standard specimen, exposure of the specimens, measurements of the mass loss and evaluating the mass loss data. As a result, the acceleration factor of the accelerated corrosion test to the outdoor corrosion test is 414.8. Therefore we can predict the corrosion life time of carbon steel during a short time period.

• Journal of the Korean Data and Information Science Society
• /
• v.7 no.1
• /
• pp.37-46
• /
• 1996

In this paper, we introduce the goodness of fit test procedure for lifetime distribution using step stress accelerated lifetime data. Using the nonpapametric estimate of acceleration factor, we prove the strong consistence of empirical distribution function under null hypothesis. The critical vailues of Kolmogorov-Smirnov, Anderson-Darling, Cramer-von Mises statistics are computed when the lifetime distibution is assumed to be exponential and Weibull. The power of test statistics are compared through Monte-Cairo simulation study.

• Journal of Korean Society for Quality Management
• /
• v.25 no.2
• /
• pp.15-27
• /
• 1997

This paper describes a highly accelerated life test (HALT, USPCBT) method for rapid qualification testing of STH PWB(Silver Through Hole Printed Wiring Boards). This method was carried out to be an alternative to the present time-consuming standard 1344 hours life testing(THB). The accelerated life test conditions were $121^{\circ}C$/95%R.H. at 50V bias and without bias. Their results are compared with those observed in the standard 1344 hours life test at $40^{\circ}C$/95%R.H. at 50V bias and without bias. The studies were focused on the samples time-to-failure as well as the associated conduction and failure mechanisms. The abrupt drop of insulation resistance is due to the absorption of water vapour. And the continuous drop of insulation resistance is due to the Ag migration. The ratios of time-to-failure of HALT(USPCBT) to THB were 25 and 11 at 50V bias and without bias respectively.

• Journal of the Korean Data and Information Science Society
• /
• v.8 no.1
• /
• pp.21-30
• /
• 1997

In accelerated life tests, the failure time of an item is observed under a high stress level, and based on the time the performances of items are investigated at the normal stress level. In this paper, when the mean of the prior of a failure rate is known in the exponential lifetime distribution with censored accelerated failure time data, we utilize the empirical Bayesian method by using the moment estimators in order to estimate the parameters of the prior distribution and obtain the empirical Bayesian predictive density and predictive intervals for a future observation under the normal stress level.

• Journal of the Korea Institute of Military Science and Technology
• /
• v.22 no.2
• /
• pp.241-248
• /
• 2019

In this paper, we aim to check the reliability growth of multiple launch rocket components by the life evaluation. We apply the Crow-AMSAA model to the sets of test data obtained from the development phase. The result of the data analysis shows that the reliability of some components needs to be improved. In order to improve their reliability, we analyze the failure mechanism and change their designs. The verification of the reliability growth for those components is done by analyzing the data sets obtained by the accelerated life tests. As a result, we show that the MTBF of those components is increased and also their reliabilities improved.