• Journal of Korean Institute of Industrial Engineers
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• v.34 no.1
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• pp.23-31
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• 2008

This paper presents accelerated degradation test plans considering adoption of tightened critical values. Under arandom coefficient degradation rate and log-linear acceleration models, the asymptotic variance of an estimatorfor a lifetime quantile at the use condition as the optimization criterion is derived where the degradation ratefollows a lognormal and Reciprocal Weibull distributions, respectively and then the low stress level andproportions ofunits allocated to each stress level are determined. We also show that the developed test plans canbe applied to the multiplicative model with measurement error.

• Proceedings of the Korean Reliability Society Conference
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• 2011.06a
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• pp.41-48
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• 2011

In order to assess the reliability of the Tire Pressure Sensor for automobiles, accelerated life test model and procedure are developed. By using this method, failure mechanism and life distribution are analyzed. The main results are as follows; i) the main failure mechanism is degradation failure that is, PCB destruction and battery Discharge by high temperature. ii) the life distribution of the Tire Pressure Sensor fitted well to Weibull life distribution and the accelerated life model of that is fitted well to Arrhenius model. iii) at the result of the life distribution, accelerated life test method is developed

• Journal of Applied Reliability
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• v.9 no.4
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• pp.291-302
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• 2009

Accelerated and field degradation tests are performed for reliability assessment of an anticorrosive paint for steel structures. Test data were analyzed to obtain the degradation model and the life time distributions of the paint. A power law degradation model and lognormal performance distribution were used to predict the lifetime of the anticorrosive paint and the method of finding an acceleration factor is provided.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.28 no.12
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• pp.843-846
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• 2015

In this paper, the failure mechanism of PTC heater were examined closely by failure analysis and based on it, accelerated life test were conducted. Finally, life distribution and acceleration model were established. The failure mechanism of PTC heater such as crack, increase of resistance due to heating were identified. Two acceleration factors such as temperature, humidity were chosen with two levels each and accelerated life test were done. Life distribution were identified as Weibull distribution with shape parameter 5.4 and Temperature-Humidity model was fitted as an acceleration model.

• Journal of the Korean Data and Information Science Society
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• v.23 no.4
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• pp.843-850
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• 2012

The inferences of data obtained from periodic inspection and type I censoring for the three step stress accelerated life test are studied in this paper. The failure rate function that a log-quadratic relation of stress and the tampered failure rate model are considered under the exponential distribution. The optimal stress change times which minimize the asymptotic variance of maximum likelihood estimators of parameters is determined and the maximum likelihood estimators of the model parameters are estimated. A numerical example will be given to illustrate the proposed inferential procedures.

• Proceedings of the Safety Management and Science Conference
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• 2006.04a
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• pp.411-419
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• 2006

This paper aims at designing an accelerated life test sampling plan for bulk material and showing its application for an arc-welded gas pipe. It is an integrated model of the accelerated life test procedure and bulk sampling procedure. The accelerated life tests were performed by the regulation, RSD 0005 of ATS at KITECH and bulk sampling was used for acceptance. Design parameters might be total sample size(segments and increments), stress level and so on. We focus on deciding the sample size by minimizing the asymptotic variance of test statistic as well as satisfying consumer's risk under Weibull life time distribution with primary information on shape parameter.

• Journal of the Korea Safety Management & Science
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• v.10 no.3
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• pp.73-79
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• 2008

Display's life time is defined as the time of 50% luminance drop. It was used luminance and temperature as accelerated factor to accelerated lifetime at test. When it's working jule-heat is generated and device's temperature is growing as any temperature because OLED is self-luminance display device. So we decided temperature condition is 25, $70^{\circ}C$, and luminance condition is $60{\sim}300cd/m^2$ in test. It's assumed accelerated lifetime model by result of the test.

• Journal of Applied Reliability
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• v.4 no.1
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• pp.1-14
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• 2004

Accelerated life test models and procedures are developed to assess the reliability of typical power relays. The main function of relays is to control high voltage circuits by operating low voltage circuits. The accelerated life test method and test equipments are developed using the relationship between stresses and life characteristics of the products. Using the developed accelerated life test method, the parameters of the ALT model and lifetime distribution are estimated and the reliability of the relays at use condition is assessed. The proposed accelerated life test method and procedure may be extended and applied to testing similar kinds of products to reduce test time and costs of the tests remarkably.

• Journal of Applied Reliability
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• v.17 no.1
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• pp.22-27
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• 2017

Purpose: The purpose of this study is to estimate the life time of OLED TV panel through electric current ADT(Accelerated Degradation Test). Methods: We performed accelerated degradation test for OLED TV Panel at the room temperature to avoid high temperature impact on the luminance. Results: we got more accurately the life time of the OLED TV when we applied ADT without temperature factor than including both current and temperature. Conclusion: Until now, the ADT of the OLED TV has been conducted with temperature and current at the same time for reducing test time and costs. We estimate incorrect life time when the temperature is adopted as an accelerated factor. Due to the high temperature impact on the luminance of the OLED TV panel. So as to solve this problem, we discard temperature and use electric current only.

• Transactions of the Korean Society of Mechanical Engineers A
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• v.32 no.5
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• pp.430-436
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• 2008

This paper proposes a way to predict electrical lifetime of a relay using Accelerated Life Testings (ALTs). The relay of interest mounting on printed circuit boards is usually under an inrush current stress. The inrush current is generated and accelerated through controlling a lamp switching device in the ALT. We find that the dominant failure mechanism under high levels of inrush current would be contact welding in the contact surface of the relay and the contact welding process is accelerated according to increase in inrush current. The electrical lifetime model based on Inverse Power Law in term of inrush current is proposed, and parameters characterizing relay's lifetime distribution are statistically estimated using ALTA 6 PRO software.