• 제목/요약/키워드: Accelerated Model

Search Result 800, Processing Time 0.036 seconds

Shock Acceleration Model for Giant Radio Relics

  • Kang, Hyesung;Ryu, Dongsu;Jones, T.W.
    • The Bulletin of The Korean Astronomical Society
    • /
    • v.42 no.1
    • /
    • pp.36.4-37
    • /
    • 2017
  • Although most of observed properties of giant radio relics detected in the outskirts of galaxy clusters could be explained by relativistic electrons accelerated at merger-driven shocks, a few significant puzzles remain. In some relics the shock Mach number inferred from X-ray observations is smaller than that estimated from radio spectral index. Such a discrepancy could be understood, if either the shock Mach number is nder-estimated in X-ray observation due to projection effects, or if pre-existing electrons with a flat spectrum are re-accelerated by a weak shock, retaining the flat spectral form. In this study, we explore these two scenarios by comparing the results of shock acceleration simulations with observed features of the so-called Toothbrush relic in the merging cluster 1RXS J060303.3. We find that both models could reproduce reasonably well the observed radio flux and spectral index profiles and the integrated radio spectrum. Either way, the broad transverse relic profile requires additional post shock electron acceleration by downstream turbulence.

  • PDF

Design of Accelerated Life Tests and Small Sample Study under Continuous and Intermittent Inspections for Lognormal Failure Distribution (수명이 대수정규분포를 따를 때 연속 및 간헐적 검사하에서 가속수명시험의 설계와 소표본 연구)

  • Seo, Sun-Keun;Chung, Won-Kee
    • Journal of Korean Institute of Industrial Engineers
    • /
    • v.23 no.1
    • /
    • pp.177-196
    • /
    • 1997
  • In this paper, statistically optimal accelerated life test(ALT) plans considering statistical efficiency only and new compromise ALT plans to sacrifice some statistical efficiency in return for improved overall properties including estimobility probability and robustness for the model assumptions are developed under the assumptions of constant stress, intermittent inspection, Type I censoring and lognormal failure distribution which has been one of the popular choices of failure distributions in the extensive engineering applications of ALT. Computational experiments are conducted to compare with four ALT plans including two proposed ones under continuous and intermittent inspections over a range of parameter values in terms of asymptotic variance, sensitivities for guessed input values, and proportion of estimable samples, etc. The small and moderate sample properties for the proposed ALT plans designed under asymptotic criterion are also investigated by Monte Carlo simulation.

  • PDF

Lifetime Estimation of an Automotive Halogen Lamp (자동차용 Halogen Lamp 의 수명 예측)

  • Kim, Chung-Sik;Shin, Seung-Jung;Kwack, Kae-Da
    • Proceedings of the KSME Conference
    • /
    • 2008.11a
    • /
    • pp.1259-1264
    • /
    • 2008
  • This paper presents an accelerated life test for burn out of tungsten filament of automotive halogen lamp. There are many failure modes and failure factors that associated with tungsten filament. But in this explain the dominant failure mode of tungsten filament is the bumout of the filament failure. At first, over voltage, high temperature, inrush current and vibration are selected as stress factors by using of two stage Quality Function Deploymeng(QFD). And we planed accelerated life test that has one factor(voltage) and three levels. By experiment it has absorbed that over voltage has an effect on the life of halogen lamp. Using ALTA programs, we estimated the common shpae parament of Weibull distribution, life-stress relationship and $B_{100p}$ life.

  • PDF

A Study on the Lifetime Prediction of Device by the Method of Bayesian Estimate (베이지안 추정법에 의한 소자의 수명 예측에 관한 연구)

  • 오종환;오영환
    • The Journal of Korean Institute of Communications and Information Sciences
    • /
    • v.19 no.8
    • /
    • pp.1446-1452
    • /
    • 1994
  • In this paper, Weibull distribution is applied to the lifetme distribution of a device. The method of Bayesian estimate used to estimate requiring parameter in order to predict lifetime of device using accelerated lifetime test data, namely failure time of device. The method of Bayesian estimate needs prior information in order to estimate parameter. But this paper proposed the method of parameter estimate without prior information. As stress is temperature, Arrhenius model is applied and the method of linear estimate is applied to predict lifetime of device at the state of normal operation.

  • PDF

A Study on the Analysis Method and Application of Accelerated Degradation Data (가속열화데이터 분석방법과 적용에 관한연구)

  • Kim, Jong-Gurl;Sung, Ki-Woo
    • Proceedings of the Safety Management and Science Conference
    • /
    • 2011.04a
    • /
    • pp.407-417
    • /
    • 2011
  • 기술 발전 속도가 빨라짐에 따라 부품의 개발기간이 단축되고 있다. 더욱이 최근에는 제품들의 신뢰성이 향상되어 가속수명시험을 실시하더라도 규정된 시험 시간 동안 고장을 발견할 수 없는 경우가 많이 발생하고 있다. 또한 현업에서는 성능열화에 대한 관심이 높아지고 있으며 특히 친환경차에 대한 관심이 많아지면서 연료전지 및 납-배터리의 가속열화시험법개발에 많은 관심이 증대되고 있다. 만약 고장이 발생하지 않는다고 해서 더 가혹한 스트레스를 인가하면 전혀 다른 고장 메커니즘이 나타날 수 있기 때문에 시험의 목적을 달성하기 곤란해진다. 따라서 이런 단점을 보완하기 위해 시간에 따라 정해진 시간마다 열화 특성을 갖는 특성치를 측정하여 수명을 예측하거나 신뢰성을 평가하는 열화시험, 가속열화시험을 이용한다. 본 연구는 열화데이터 분석 방법을 정리하여 현업에 적용 가능한 분석 과정을 제안하고 향후 연료전지 및 납-배터리 가속열화시험 적용방향을 제시하고자 한다.

  • PDF

Hardware accelerated Voxelization using a Stencil Buffer (Stencil Buffer를 이용한 형상의 복셀화)

  • Jang Dong Go;Kim Gwang Su
    • Proceedings of the Korean Operations and Management Science Society Conference
    • /
    • 2002.05a
    • /
    • pp.266-271
    • /
    • 2002
  • We propose a hardware accelerated voxelization method for various 3D object model such as surface models, solid models, and volumetric CSG models. The algorithm utilizes the stencil buffer that is one of modern Open히 graphics hardware features. The stencil buffer is originally used to restrict drawing to certain portions of the screen. The volumetric representations of given 3D objects are constructed slice-by-slice. For each slice, the algorithm restricts the drawing areas constructed inner region of 3D objects using the stencil buffer, and generates slices of the volumetric representation for target objects. As a result, we can provide volume graphics support for various engineering applications such as multi-axis machining simulation, collision detection and finite element analysis.

  • PDF

An Evaluation of Reliability of the Spur Gear Using the Accelerated Durability Analysis (가속내구해석을 이용한 평기어의 신뢰성 평가)

  • Kim Chul-Su;Kim Jung-Kyu;Kwon Yeo-Hyoun
    • Proceedings of the KSR Conference
    • /
    • 2004.10a
    • /
    • pp.722-727
    • /
    • 2004
  • The gear that is used in various mechanical components occurs easily damages due to the repeated torque and the high oil temperature. The main failure mode of the gear is the surface deterioration with the tooth surface fatigue. Therefore, the life evaluation and the failure analysis of the gear were very important since it may cause fatal damage of entire gear box system. In this paper, the failure mechanism and the life of the gear were evaluated using the durability analysis simulator such as MSC.FATIGUE. Moreover, the reliability analysis model of the spur gear with the accelerated life testing technique was proposed.

  • PDF

Reconstruction Characteristics of MgO (111) Textured Protective Layer by Over-Frequency Accelerated Discharge in AC Plasma Display Pannel

  • Kwon, Sang-Koo;Kim, Jeong-Ho;Moon, Seung-Kyu;Kim, Hyun-Ha;Park, Kyu-Ho;Kim, Sung-Tae
    • 한국정보디스플레이학회:학술대회논문집
    • /
    • 2007.08a
    • /
    • pp.224-227
    • /
    • 2007
  • The reconstruction characteristics of MgO (111) textured protective layer by over-frequency accelerated discharge in AC-PDP were investigated and correlated to the variations of electronic structures. The reconstruction process and exaggerated grain growth (EGG) were explained by defect-assisted 2-D nucleation and growth mechanism combined with charged cluster model.

  • PDF

A Failure-Censored Accelerated Life Test Sampling Plan with Both Life Specification Limits (수명의 양쪽규격을 고려한 정수중단 ALT 샘플링검사 계획)

  • 류근중;강창욱
    • Journal of Korean Society of Industrial and Systems Engineering
    • /
    • v.21 no.45
    • /
    • pp.319-328
    • /
    • 1998
  • In this paper, the design of ALT(Accelerated Life Test) requires a sampling plan based on failure-censored(Type II censored) ALT with lognormal life distribution. Specially the environmental effect of products has been emphasized, so we considered the upper life limit as well as lower life limit in the ALT sampling plan. The optimal plan with a high stress and a low stress is used as test plan, and the total sample size for test and lot acceptability constant which minimize an asymptotic variance of maximum likelihood estimator of assumed model parameters and satisfy the given producer's risk and customer's risk are drawn out. These values can be acquired by means of the computer program that we coded for resolving the difficulty and complexity of calculation.

  • PDF

Reliability Assessment Criteria of Power Light Emitting Diodes for Lighting fittings (조명용 Power LED의 신뢰성평가기준)

  • Park, Chang-Kyu;Jeong, Hee-Suk;Jeong, Hai-Sung;Baik, Jai-Wook
    • Journal of Applied Reliability
    • /
    • v.9 no.3
    • /
    • pp.219-231
    • /
    • 2009
  • Power light emitting diodes(LED) for lighting fittings are so much environment-friendly, highly reliable and consume less energy that they are widely used at home and in industries such as electronics, telecommunications and industrial machineries. However, they are exposed to a very diverse environment and consists of complex components and, therefore needs careful approach to the enhancement and assessment of reliability of the item. In this article reliability assessment criteria for LED are established in terms of performance assessment test, reliability assessment test and accelerated test.

  • PDF