• 대한기계학회논문집A
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• 제41권10호
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• pp.997-1004
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• 2017

엘리베이터 와이어로프의 수명은 제품의 매우 중요한 특성 가운데 하나로서 사용자의 안전 및 장비의 정비 정책과 밀접한 관계가 있다. 엘리베이터 와이어로프의 수명을 사용조건에서 측정하는 것은 매우 비경제적이다. 이 연구에서는 엘리베이터 와이어로프 (8x19W-IWRC)의 가속열화시험 데이터를 활용하여 와이어로프의 수명을 추정하는 방법을 다루었다. 굽힘피로시험기를 이용하여 가속열화시험을 진행하였으며 가속변수로는 인장하중을 사용하였다. 와이어로프의 수명은 대수정규분포를 가정하였고, 선형회귀모형을 이용하여 가수명을 구한 후 가속수명모형을 이용하여 와이어로프의 수명을 추정하는 방법과 고장 확률에 대한 로지스틱 회귀모형을 이용하여 추정하는 방법을 제시하고 두 모형의 수명 추정결과를 비교하였다.

• 대한기계학회논문집A
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• 제41권9호
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• pp.887-895
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• 2017

본 논문에서는 일반적으로 문틀과 문짝을 연결하여 개폐시 작동하는 부품인 힌지의 가속수명시험법에 대한 연구이다. 힌지는 사용하는 용도에 따라 구조와 고장모드가 상이하며 본 연구에서는 전자파 차폐시설에 사용되는 개폐장치 구성품 중 하나인 힌지에 대해서 고장모드를 분석하고 현장작동조건에서의 이론적 검증과 시험장비에 대한 타당성을 분석하였다. 그리고 형상모수와 가속지수의 추정을 통한 특성수명 예측을 위한 가속수명시험법을 설계하였다.

• 대한산업공학회지
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• 제28권4호
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• pp.407-414
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• 2002

The inherent reliability of a product is primarily determined in the design stage, and therefore, design engineers should be able to design reliability into the product in an efficient manner. Especially, the product should be designed such that its reliability is robust to various noise factors encountered in production and field environments. The Taguchi method can be effectively used for this purpose. However, there exist only a few attempts to integrate the Taguchi method with reliability design, and in addition, the existing works do not sufficiently consider the robustness and/or the distinction between noise and acceleration factors. This paper develops a unified approach to robust reliability design assuming that accelerated life tests are conducted at each combination of design and noise conditions. First, an experimental structure for assigning not only acceleration but also noise factors is presented. Second, the reliability at the use condition is estimated using the assumed accelerated life test model. Third, reliabilities are transformed into 'efforts' using an effort function which reflects the degree of difficulty involved in improving the reliability. Finally, an optimal setting of design parameters is determined based on the mean and standard deviation of the effort values. The above approach is illustrated with an example of a paper feeder design.

• 한국신뢰성학회지:신뢰성응용연구
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• 제2권1호
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• pp.1-14
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• 2002

High temperature operating test, temperature humidity test and temperature cycling were performed at various test levels for solid aluminum electrolyte capacitors made by domestic manufacturing company and foreign advanced manufacturing company. It was found that main failure mode of solid aluminum electrolyte capacitors was the decrease of their capacitances. The decrease of their capacitances has the same pattern in these tests. Test result for comparison of characteristics between domestic products and foreign advanced products shows that domestic products have the shorter lifetime and their capacitances decrease more rapidly in high temperature operating test and temperature humidity test. Also in these tests, accelerated tests for high temperature operating test and temperature humidity test were developed.

• International Journal of Reliability and Applications
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• 제11권1호
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• pp.55-67
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• 2010

There has been a recent upsurge in demand for the improvement of car reliability in the Northern American which is the primary market of South Korea automobile industry. It has been required that the warranty for transmission control unit for passenger cars directly related to passenger safety or security should be extended for 10 years and 160,000 km. In this paper, the test method for reliability and evaluation criteria is presented to evaluate the reliability on the automatic transmission controller. Reliability certification test can be roughly divided into two types: a quality test and life assessment test and a quality test can be subdivided into a basic performance test and environmental resistance test. There are 3 types of tests on the performance test for automatic transmission controller and environmental resistance test is composed of 14 items. Life test is performed with only the product passed this quality test. In this study, operation limit test at the high-temperatures, accelerated life test under specific temperature and accelerated life test for 2 or 3 stress levels are shown as a way for life test.

• 품질경영학회지
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• 제29권3호
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• pp.49-65
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• 2001

This paper presents new compromise ALT plan which is applied to situations that true relationship between stress and parameters is not known exactly. The assumed failure distribution of this study is one of location-scale family, i. e., exponential, Weibull, and lognormal distributions which have been ones of the popular choices of failure distributions. The method of applying the stress is constant, and the censoring mechanism is Type I censoring. Compared with existing compromise plans under true simple linear model in terms of statistical efficiency, the efficiency of new compromise plan is better than the corresponding other compromise ones in most cases. For case when true model is quadratic, this plan can be used without any severe loss in statistical efficiency. The proposed new compromise ALT plan is illustrated with a numerical example and sensitivity analyses are conducted to study effects of pre-estimates of design parameters.

• International Journal of Reliability and Applications
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• 제18권2호
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• pp.21-44
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• 2017

Accelerated life tests (ALTs) are frequently used in manufacturing industries to evaluate the reliability of products within a reasonable amount of time and cost. Test units are subjected to elevated stresses which yield quick failures. Most of the previous works on designing ALT plans are focused on tests that involve a single stress. Many times more than one stress factor influence the product's functioning. This paper deals with the design of optimum modified ramp-stress ALT plan for Burr type XII distribution with Type-I censoring under two stress factors, viz., voltage and switching rate each at two levels- low and high. It is assumed that usage time to failure is power law function of switching rate, and voltage increases linearly with time according to modified ramp-stress scheme. The cumulative exposure model is used to incorporate the effect of changing stresses. The optimum plan is devised using D-optimality criterion wherein the ${\log}_{10}$ of the determinant of Fisher information matrix is maximized. The method developed has been explained using a numerical example and sensitivity carried out.

• Journal of the Korean Data and Information Science Society
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• 제17권3호
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• pp.945-952
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• 2006

Several accelerated life test plans use tests at only two levels of stress and thus, have practical limitations. They highly depend upon the assumption of a linear relationship between stress and time-to-failure and use only two extreme stresses that can cause irrelevant failure modes. Thus 3-level stress plans are preferable. When the lifetime distribution of test unit is exponential with mean lifetime $\theta_i$ at stress $x_i$, i=0, 1, 2, 3, we derive the optimum quadratic plan under the assumption that a quadratic relationship exists between stress and log(mean lifetime), and propose the compound linear plans, as an alternative to the optimum quadratic plan. The proposed compound linear plan is better than two other compromise plans for constant stress testing and nearly as good as the optimum quadratic plan, and has the advantage of simplicity.

• 품질경영학회지
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• 제26권1호
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• pp.74-87
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• 1998

This study considers optimal design of accelerated life tests under constant stress using that the first passage time to cross a critical boundary through amount of accumulated degradation has an inverse Gaussian distribution when the degradation process follows to a Brownian motion with positive drift of log linear function of stress. Optimum plans for Type I censoring are derived by minimizing the asymptotic variance of estimated quantiles at the use stress. Sensitivity analyses are also conducted to see how sensitive the optimality criterion is with respect to the uncertainties involved in the guessed values.

• 산업공학
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• 제12권3호
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• pp.448-457
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• 1999

Accelerated degradation is concerned with models and data analyses for degradation of product performance over time at overstress and design conditions. Although there have been numerous studies with accelerated degradation theory in reliability, very few actually apply to parametric statistical analyses. This paper shows how to analyze degradation data, provides tests for how well the assumptions hold. Reel sensors, a sort of photointerrupters in home VCR, hive been tested, and least-square analyses are used to illustrate our approach. Tests for linearity of the performance-time relationship, dependence of the lognormal distribution, and the standard deviation on time are performed. The mean life of tested sensors is assessed at about 414,000 hours, and the Arrhenius activation energy of this reaction is concluded to be 0.39 eV as results.