• Proceedings of the Korean Institute of IIIuminating and Electrical Installation Engineers Conference
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• 2009.05a
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• pp.21-23
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• 2009

The paper is to evaluate for reliability of LED Modules for Lighting by ALTs(Accelerated Life Tests). The recently, some of KS were established by law of LED Modules for Lighting(KS C 7651, KS C 7652 and KS C 7653), but reliability assessment methods of LED Modules for Lighting were not established. Therefore, the paper aided companies to test methods for accelerated life testing by themselves.

• Journal of Applied Reliability
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• v.7 no.3
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• pp.127-136
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• 2007

The accelerated life tests(ALTs) and degradation characteristics of image intensifier assembly(KIT-7) under low illuminance and high temperature were investigated. The accelerated life tests were carried out at $5{\times}10^5\;fc-40^{\circ}C,\;10{\times}10^5\;fc-40^{\circ}C,\;5{\times}10^5\;fc-50^{\circ}C,\;10{\times}10^5\;fc-50^{\circ}C$ and relationship related to illuminance and temperature was used as an accelerated life test model. An ALTA program[6] was used to calculate an acceleration factor and the test of life distribution fit, and estimate three parameters of an life test model. To sum up, MTTF 10,000 h at $5{\times}10^{-5}\;fc-40^{\circ}C$ of image intensifier assembly was certificated.

• Journal of Applied Reliability
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• v.17 no.2
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• pp.112-121
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• 2017

Purpose: The most previous works on designing accelerated life tests (ALTs) are focused on the application of a single stress. Because of the difficulty to obtain the sufficient information in a reasonable duration using single stress only, there is needed in practice to use multiple-stress ALTs frequently. This paper presents new practical plans with two stresses for Weibull distribution. Methods: The four-level practical plans based on rectangle test region are proposed and compared with the corresponding three-level statistically optimal plans. Sensitivity analyses for assumed design parameters and life-stress relationship are conducted. Results: A procedure to choose practical ALT plans is illustrated with a numerical example and guidelines for planning two-stress ALTs are provided. Conclusion: The proposed two-stress ALT plans on practical constraints to assess a quantile of Weibull lifetime distribution at the use condition are efficient and robust.

• Proceedings of the Korean Institute of IIIuminating and Electrical Installation Engineers Conference
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• 2009.05a
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• pp.208-210
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• 2009

The paper is to evaluate for reliability of LED Channel Modules by ALTs(Accelerated Life Tests). The recently, some of KS were established by law of LED Lamps for Lighting(KS C 7651, KS C 7652 and KS C 7653), but reliability assessment methods of LED Channel Modules were not established. Therefore, the paper aided companies to test methods for accelerated life testing by themselves.

• International Journal of Reliability and Applications
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• v.15 no.2
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• pp.125-150
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• 2014

Accelerated life tests (ALTs) are extensively used to determine the reliability of a product in a short period of time. Test units are subject to elevated stresses which yield quick failures. ALT can be carried out using constant-stress, step-stress, progressive-stress, cyclic-stress or random-stress loading and their various combinations. An ALT with linearly increasing stress is ramp-stress test. Much of the previous work on planning ALTs has focused on constant-stress, step-stress, ramp-stress schemes and their various combinations where the stress is generally increased. This paper presents an optimal design of ramp soak-stress ALT model which is based on the principle of Thermal cycling. Thermal cycling involves applying high and low temperatures repeatedly over time. The optimal plan consists in finding out relevant experimental variables, namely, stress rates and stress rate change points, by minimizing variance of reliability function with pre-specified mission time under normal operating conditions. The Burr type XII life distribution and time-censored data have been used for the purpose. Burr type XII life distribution has been found appropriate for accelerated life testing experiments. The method developed has been explained using a numerical example and sensitivity analysis carried out.

• Proceedings of the Korean Institute of IIIuminating and Electrical Installation Engineers Conference
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• 2009.10a
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• pp.77-79
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• 2009

The paper is to evaluate for reliability of 4W LED Lamp using internal converter by ALTs(Accelerated Life Tests). The recently, some of KS were established by law of LED Modules for Lighting(KS C 7651, 7652, 7653, 7655, 7656, 7657, 7658 and 7659), but reliability assessment methods of LED Lamps had not been established. Therefore, the paper aided companies to perform accelerated life testing(temperature 60 $^{\circ}C$, humidity 90 %) for themselves.

• Journal of Korean Society for Quality Management
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• v.29 no.3
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• pp.49-65
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• 2001

This paper presents new compromise ALT plan which is applied to situations that true relationship between stress and parameters is not known exactly. The assumed failure distribution of this study is one of location-scale family, i. e., exponential, Weibull, and lognormal distributions which have been ones of the popular choices of failure distributions. The method of applying the stress is constant, and the censoring mechanism is Type I censoring. Compared with existing compromise plans under true simple linear model in terms of statistical efficiency, the efficiency of new compromise plan is better than the corresponding other compromise ones in most cases. For case when true model is quadratic, this plan can be used without any severe loss in statistical efficiency. The proposed new compromise ALT plan is illustrated with a numerical example and sensitivity analyses are conducted to study effects of pre-estimates of design parameters.

• International Journal of Reliability and Applications
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• v.18 no.2
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• pp.21-44
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• 2017

Accelerated life tests (ALTs) are frequently used in manufacturing industries to evaluate the reliability of products within a reasonable amount of time and cost. Test units are subjected to elevated stresses which yield quick failures. Most of the previous works on designing ALT plans are focused on tests that involve a single stress. Many times more than one stress factor influence the product's functioning. This paper deals with the design of optimum modified ramp-stress ALT plan for Burr type XII distribution with Type-I censoring under two stress factors, viz., voltage and switching rate each at two levels- low and high. It is assumed that usage time to failure is power law function of switching rate, and voltage increases linearly with time according to modified ramp-stress scheme. The cumulative exposure model is used to incorporate the effect of changing stresses. The optimum plan is devised using D-optimality criterion wherein the ${\log}_{10}$ of the determinant of Fisher information matrix is maximized. The method developed has been explained using a numerical example and sensitivity carried out.