• Journal of the Korean Society of Manufacturing Process Engineers
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• v.10 no.3
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• pp.108-112
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• 2011

In order to obtain excellent flatness and surface roughness of glass substrate disk, uniform distribution of abrasives should be important for uniform polishing. We introduced coated-type magnetic abrasives and magnetic field to a lapping for the improvement of surface roughness and removal rate. Polishing properties with the conventional diamond abrasives and the coated-type magnetic abrasives were compared. As a result, the coated-type magnetic abrasives showed small surface roughness and large removal rate by applying magnetic field. And it also was shown that coated-type magnetic abrasives could save the more amount of polishing liquid under the same removal rate than the conventional diamond abrasives can.

• Journal of the Korean Society of Manufacturing Process Engineers
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• v.3 no.1
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• pp.45-51
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• 2004

In this paper, the relationship between the mechanical properties of alumina abrasives and grinding performance was investigated. Micro vickers hardness and fracture strength of all abrasives used in this study were measured. The grinding experiments were earned out with alumina grinding wheels made by various kinds of alumina abrasives including 32A, WA, ART, ALOMAX, and RA. The performance of such grinding wheel for grinding SKD11 was evaluated by specific grinding energy, grinding-ratio, and surface roughness. The grinding wheels composed by the harder abrasives and the lower fracture strength abrasives showed better grinding performance.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.17 no.10
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• pp.1049-1055
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• 2004

Chemical Mechanical Polishing (CMP) is referred to as a three body tribological system, because it includes two solids in relative motion and the CMP slurry. On the assumption that the abrasives between the pad and the wafer could be a major reason not only for the friction force but also for material removal during polishing, the friction force generated during CMP process was investigated with the change of abrasive size and concentration of CMP slurry. The threshold point of average coefficient of friction (COF) with increase in abrasives concentration during interlayer dielectric (ILD) CMP was found experimentally and verified mathematically based on contact mechanics. The predictable models, Mode I (wafer is in contact with abrasives and pad) and Mode II (wafer is in contact with abrasives only), were proposed and used to explain the threshold point. The average COF value increased in the low abrasives concentration region which might be explained by Mode I. In contrast the average COF value decreased at high abrasives concentration which might be regarded to as Mode II. The threshold point observed seemed to be due to the transition from Mode I to Mode II. The tendency of threshold point with the variation of abrasive size was studied. The increase of particle radius could cause contact status to reach transition area faster. The correlation between COF and material removal rate was also investigated from the tribological and energetic point of view. Due to the energy loss by vibration of polishing equipment, COF value is not proportional to the material removal rate in this experiment.

• Tribology and Lubricants
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• v.33 no.5
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• pp.228-233
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• 2017

Chemical Mechanical Polishing of chemically stable sapphire substrates is dominantly affected by the mechanical processing of abrasives, in terms of the material removal rate. In this study, we investigated the effect of electrostatic force between the abrasives and substrate, on the polishing. If potassium chloride (KCl) is added to slurry, water molecules are decomposed into $H^+$ and $OH^-$ ions, and the amount of ions in the slurry changes. The zeta potential of the abrasives decreases with an increase in the amount of $H^+$ ions in the stern layer; consequently, the electrostatic force between the abrasives and substrate decreases. The change in zeta potential of abrasives in the slurry is affected by the slurry pH. In acidic zones, the amount of ions bound to the abrasives increases if the amount of $H^+$ ions is increased by adding KCl. However, in basic zones, there is no change in the corresponding amount. In acidic zones, zeta potential decreases as molar concentration of potassium increases; however, it does not change significantly in basic zones. The removal rate tends to decrease with increase in molar amount of potassium in acidic zones, where zeta potential changes significantly. However, in basic zones, the removal rate does not change with zeta potential. The tendencies of zeta potential and that of the frictional force generated during polishing show strong correlation. Through experiments, it is confirmed that the contact probability of abrasives changes according to the electrostatic force generated between the abrasives and substrate, and variation in removal rate.

• Transactions of the Korean Society of Mechanical Engineers A
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• v.38 no.8
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• pp.887-892
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• 2014

In a conventional magnetic abrasive polishing process, the polishing abrasives are mixed with ferrous particles and slight cutting oil to form a cluster of abrasives. However, when a tool rotates at a high revolution speed, most of the polishing abrasives are scattered away from it due to the increase in centrifugal force. This phenomenon directly reduces the polishing efficiency. The use of a highly viscous matter such as silicone gel instead of cutting oil for mixing is one method to solve this problem and increase abrasive adhesion. Another method to avoid high abrasive scattering is the application of wet magnetic abrasive polishing (WMAP). In WMAP, abundant mineral oil is preliminarily applied to the workpiece surface. This study experimentally evaluated the effect of WMAP on abrasive adhesion. The relationship between the amount of working abrasives and polishing conditions was characterized. Despite the lower adhesion ratio of polishing abrasives, the surface roughness was found to be significantly improved as the result of WMAP.

• Journal of the Korean Ceramic Society
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• v.47 no.3
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• pp.232-236
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• 2010

In recent years abrasive water jet (AWJ) has received significant attention as a technology used in the manufacturing industry for cutting materials. In this paper we report the development of a new preparation method of abrasives for water jet by using an air bubbling sedimentation rate control technique. The SiC abrasives prepared by an air bubbling sedimentation rate control technique using latex resin are found to be superior to the conventional abrasives not only in surface roughness uniformity but also in lifetime. The AWJ test results also show that the former has also better impact-resistance and wear-resistance than the latter.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2002.05a
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• pp.968-971
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• 2002

Two decisive mechanisms of the electrorhological polishing for a small part(for example, a aspherical surface in a micro lens) are explained. Firstly, non-uniform electric field generated in the polishing structure increases a shear stress of ER fluids which is maximized dramatically near the tool, therefore, substrate adjacent to the tool can be removed effectively by mixed abrasives in the ER fluid. Secondly, abrasives in a non-uniform electric field are governed by the dielectrophoretic phenomena. Abrasives move toward the tool because the field gradient is highest near the tool and then abrasives are actively holded in that area. This phenomena is observed and evaluated by the optical measurement.

• Asian-Australasian Journal of Animal Sciences
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• v.17 no.10
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• pp.1465-1471
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• 2004

A trial was conducted to determine the effect of abrasive strips and abrasive paint in layer cages on claw length and claw sharpness, foot condition, feather cover and mortality of hens. During the preparation of the cages for the experiment it was simpler and took less time to apply the pre-prepared paint with a spatula to the egg guard compared to sticking the abrasive strips onto the egg guard. Fitting the strips took longer because it had to be cut from a 25 mm roll, cut into the appropriate lengths, the tape backing removed and then stuck onto the egg guard section. Abrasive paint was more effective as a claw shortener than abrasive strips. The birds using the abrasive paint had the shortest (p<0.05) claw length and lowest (p<0.05) claw sharpness. One of the original reasons for reducing claw length with claw shorteners was to reduce mortality by minimising skin skin abrasions caused by the claws. Surprisingly hen mortality from prolapse and cannibalism was higher (p<0.05) in cages fitted with abrasives. There are no other reports in the literature showing an increase in prolapse and cannibalism from hens using abrasives.

• Journal of the Korean Society of Manufacturing Process Engineers
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• v.2 no.1
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• pp.32-38
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• 2003

Engineering ceramics have many unique characteristics both in mechanical and physical properties such as high temperature hardness, high thermal, chemical and electrical resistance. However, its machinability is very poor in conventional machining due to its high hardness and severe tool wear. In the current experimental study alumina($Al_2O_3$) was ultrasonically machined using SiC abrasives under various machining conditions to investigate the material removal rate and surface quality of the machined samples. Under the applied amplitude of 0.02mm, 27kHz frequency, three slurry ratios (abrasives water by weight) of 11, 13 and 15 with different tool shapes and applied pressure levels, the machining was conducted. Using the mesh number of 240 abrasive, slurry ratio of 11 and static pressure of $25kg/cm^2$, maximum material removal rate of $18.97mm^3/mm$ was achieved with mesh number of 600 SiC abrasives and static pressure of $30kg/cm^2$, best surface roughness of $0.76{\mu}m$ Ra was obtained.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2004.07b
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• pp.1312-1315
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• 2004

Chemical Mechanical Polishing is referred to as a three body tribological system, because it includes two solids in relative motion and the slurry. On the assumption that the abrasives between the pad and the wafer could be a major reason of not only the friction force but also material removal during polishing. The friction force generated by the abrasives was inspected with the change of abrasive size and concentration in this paper. The variation of coefficient of friction with abrasive concentration and size could result from the condition of contact and load balance between wafer and abrasives carried by pad asperity. The simulation was performed in this paper and compared with the result of experiment. The material removal rate also estimated with abrasive concentration and size increasement.