• 제어로봇시스템학회:학술대회논문집
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• 2002.10a
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• pp.108.6-108
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• 2002

It is greatly important to understand the mechanics of AFM-based nanorobotic manipulation for efficient and reliable handling of nanoparticles. Robust motion control of an AFM-based nanorobotic manipulation is much challenging due to uncertain mechanics in tip-sample interaction dominated by surface and intermolecular force and limitations in force and visual sensing capability to observe environment. This paper investigates a nanomechanic modeling which enables simulation for AFM-based nanorobotic manipulation , and its application to motion planning of an AFM-based nanorobot. Based on the modeling of intermolecular and adhesion force in AFM-based nanomanipulation, the behaviors of an AFM ca...

• Korean Journal of Food Science and Technology
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• v.41 no.2
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• pp.215-219
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• 2009

To conduct a risk assessment of $AFB_1$ intake, $AFM_1$, which is a metabolite of $AFB_1$ in the human and porcine urine, was determined by competitive direct ELISA (cdELISA). The detection limit of cdELISA using anti-$AFM_1$ antibody and $AFB_1$-HRP conjugate was 10 pg/mL. The recoveries of $AFM_1$ were 117-167% after the addition of $AFM_1$ in the human urine in a range of 3-100 pg/mL. 165 samples (95.5%) of those obtained from 172 persons evidenced measurable levels of urinary $AFM_1$. The detected $AFM_1$ ranges were 0-11.6 pg/mL and the average level of $AFM_1$ contamination was 2.74${\pm}$ 1.89 pg/mL. The estimated amount of $AFM_1$ excretion in the human urine was 3.97 ng/day and the estimated $AFB_1$ intake amount was 79.4 ng/day. The probable daily intake (PDI) of $AFB_1$ by the subjects was estimated to be 1.28 ng/kg bw/day, which was higher than the tolerable daily intake (TDI, 0.15 ng/kg bw/day). In the case of porcine urine, the $AFM_1$ ranged between 0.97-26.7 pg/mL and the average contaminated $AFM_1$ was 10.62${\pm}$4.39 pg/mL. The estimated amount of $AFM_1$ excretion in the porcine urine was 27.6 ng/day, and the estimated $AFB_1$ intake amount was 551 ng/day.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2003.06a
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• pp.264-267
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• 2003

Pitch measurements of 150 nm pitch one-dimensional grating standards were carried out using an contact mode atomic force microscopy(C-AFM) with a high resolution three-axis laser interferometer. It was called as 'Nano-metrological AFM' In Nano-metrological AFM, Three laser interferometers were aligned well to the end of AFM tip. Laser sources of the three-axis laser interferometer in the nano-metrological AFM were calibrated with an I$_2$-stablilzed He-Ne laser at a wavelength of 633 nm. So, the Abbe error was minimized and the result of the pitch measurement using the nano-metrological AFM has a traceability to the length standard directly. The uncertainty in the pitch measurement was estimated in accordance with the Guide to the Expression of Uncertainty in Measurement(GUM). The Primary source of uncertainty in the pitch-measurements was derived from repeatability of pitch-measurement, and its value was approx 0.186 nm. Expanded uncertainty(k=2) of less than 5.23 nm was obtained. It is suggested that the metrological AFM is a useful tool for the nano-metrological standard calibration.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 1996.04a
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• pp.8-13
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• 1996

A relatively new non-traditional finishing process called Abrasive Flow Machining(AFM) is being used to deburr, polish and radius workpiece or produce compressive residual stresses by flowing an abrasive-laden viscoelastic compound across the surface to be machined. This paper presents the effects of AFM on surfaces of tool steel produced by EDM and W-EDM. Using AFM, white layer produced by EDM is erased almost equally and the amount of metal removal is significantly affected the initally machined surface condition of workpiece. The dimension of workiece is enlarged and its surface roughness is improved as AFM time is increased. The optimal AFM time can be established from the experimental results. It is considered that the grinding method lide AFM is useful to grind complex or slim geometry of workpiece even. Scanning Electron Microscopy(SEM) was used to study the surface characteristics of the workpiece before and after AFM.

• Journal of the Korean Society for Precision Engineering
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• v.15 no.3
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• pp.99-106
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• 1998

Recently, scientists introduced a new type of microscope capable of investigating nonconducting surfaces in an atomic scale, which is called AFM (Atomic Force Microscope). It was an innovative attempt to overcome the limitation of STM (Scanning Tunnelling Microscope) which has been able to obtain the image of conducting surfaces. Surfaces of samples are imaged with atomic resolution. The AFM is an imaging tool or a profiler with unprecedented 3-D resolution for various surface types. The AFM technology, however, leaves a lot of room for improvement due to its delicate and fragile probing mechanism. One of the room for improvements is gap control between probe tip and sample surface. Distance between probe tip and sample surface must be kept in below one Angtrom in order to measure the sample surface in Angstrom resolution. In this paper, AFM system modeling, experimental system identification and control scheme based on system identification are performed and finally sample surface is measured by home-built AFM with such a control scheme.

• Journal of Food Hygiene and Safety
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• v.16 no.3
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• pp.200-205
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• 2001

In this study, occurrence of aflatoxin M$_1$(AEM$_1$) in domestic milk and milk products was determined. The level of AFM$_1$ in market milk (0.047 ppb) was lower than that in raw milk (0.083 pub) but this looks like that is due to dilution in collecting process rather than the effect of sterilization. In the case of nonfat dry milk, level of AFM$_1$appeared high by 0.24 ppb but it is thought to be not different from market milk actually because nonfat dry milk is diluted at intake. In the case of ice cream, finished products were contaminated with AFM$_1$of 0.020 ppd and also have the possibility of the contamination of AFB$_1$due to secondary raw material such as nuts and almond. On the basis of the results of this study and previous studies, Monte-Carlo simulation is conducted to estimate the contamination level of AFM$_1$in domestic market milk. To consider uncertainty and variability fitting procedure was passed through. And we used beta distribution to estimate the prevalence and triangular distribution to estimate the concentration level of AFM$_1$in milk. As a result, the 5%, 50% and 95% points of the distribution of the probability of AFM$_1$contamination level in milk is 0.0214, 0.0946 and 0.1888 ppb, respectively. Also we estimate that AFM$_1$in almost milk was low more than 0.5 ppb that is American acceptable level but 80.4% exceeded far 0.05 ppb that is European standard.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.17 no.8
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• pp.875-881
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• 2004

Fundamental results obtained from an atomic force microscope (AFM) chemically-induced direct nano-lithography process are presented, which is regarded as a simple method for fabrication nm-scale devices such as superconducting flux flow transistors (SFFTs) and single electron tunneling transistors (SETs). Si cantilevers with Pt coating and with 30 nm thick TiO coating were used as conducting AFM tips in this study. We observed the surfaces of superconducting strip lines modified by AFM anodization' process. First, superconducting strip lines with scan size 2 ${\mu}{\textrm}{m}$${\times}$2 ${\mu}{\textrm}{m}$ have been anodized by AFM technology. The surface roughness was increased with the number of AFM scanning, The roughness variation was higher in case of the AFM tip with a positive voltage than with a negative voltage in respect of the strip surface. Second, we have patterned nm-scale oxide lines on ${YBa}-2{Cu}_3{O}_{7-x}$ superconducting microstrip surfaces by AFM conductive cantilever with a negative bias voltage. The ${YBa}-2{Cu}_3{O}_{7-x}$ oxide lines could be patterned by anodization technique. This research showed that the critical characteristics of superconducting thin films were be controlled by AFM anodization process technique. The AFM technique was expected to be used as a promising anodization technique for fabrication of an SFFT with nano-channel.

• Environmental Analysis Health and Toxicology
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• v.23 no.1
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• pp.47-51
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• 2008

The toxicity of environmental pollutants was measured between a image of the surface topography in HeLa cells using atomic force microscopy for the possibility of toxic effect measurement and environmental monitoring. A image of the surface topography by AFM were estimated as toxic endpoints. The surface topography by AFM was observed a change of the cell surface in the environmental pollutants, but the standard of the measurement requires for the dose-effect degree. The overall results indicate that the possibility of measurement using AFM were confirmed a dose-effect degree related toxic effects, but it requres correlation between more various biomarker and AFM's measurements if the possibility of the toxic effect measurement was established.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 2002.10a
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• pp.375-378
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• 2002

In this paper, the frequency response separation scheme is proposed for high scanning speed and simple structure of non-contact type of AFM. A self-sensing cantilever is attached on the actuator for detect the atomic force between tip and the media surface. VCM or PZT are used for actuator. This paper presents the method to simplify the actuator structure and the performance of each actuator for non-contact type AFM. Based on the frequency response separation scheme, the only one actuator plays roles 1311owing low frequency surface and modulating self-sensing cantilever tip in contrast with convention non-contact type AFM. 10 ${\mu}{\textrm}{m}$ standard grid sample imaged to verify proposed scheme. This result shows the possibility simplifying the actuator structure and reducing cost of non-contact type AFM.

• Transactions of the Korean Society of Mechanical Engineers A
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• v.31 no.6 s.261
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• pp.659-664
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• 2007

$Moire\'{e}$ interferometry is a useful technique to assess the reliability of electronic package because $Moire\'{e}$ interferometry can measure the whole-field and real-time deformations. The shear strain of a small crack site is important to the reliability assessment of electronic package. The optical limitation of $Moire\'{e}$ interferometry makes ambiguous the shear strain of a small area. An atomic force microscope (AFM) is used to measure the profile of a micro site. High resolution of AFM can apply to the $Moire\'{e}$ technique. AFM $Moire\'{e}$ technique is useful to measure the shear strain of a small area. In this research, the method to accurately measure the deformation of a small area by using AFM $Moire\'{e}$ is proposed. A phase-shifting method is applied to improve the resolution of AFM $Moire\'{e}$.