• 한국신뢰성학회:학술대회논문집
• /
• 한국신뢰성학회 2000년도 춘계학술대회 발표논문집
• /
• pp.123-129
• /
• 2000

SPC is the quality improvement technique of gathering since Motorola of U.S.A. have used SPC technique as a statistical process control method for promoting 6-sigma quality improvement strategy in 1988. In Korea, small and medium-sized enterprises are needed building of a system for statistical production control . In the present study, the methods of building SPC system with a moderate cost using a graphic programs of easy-to-use and high flexibility for small and medium-sized enterprises were inquired. The SPC system which enables statistic marking (maximum, minimum, mean, standard deviation, process capability index) and graph marking (X-Y coordinates and histogram) using LabVIEW 5.0, the graphic program by National Instrument Co., Ltd. was implemented in this study.

• Journal of the Korean Data and Information Science Society
• /
• 제18권3호
• /
• pp.773-782
• /
• 2007

The statistical process control charts are very extensively used for monitoring of process mean, deviation, defect rate or reject rate. In this paper we consider a control chart to monitor the process reject rate in the high yield process, which is based on the observed cumulative probability of the number of items inspected until r defective items are observed. We first propose selection of the optimal value of r in the CPC-r charts, and also consider the usefulness of the chart in high yield process such as semiconductor or TFT-LCD manufacturing process.

• 산업경영시스템학회지
• /
• 제25권2호
• /
• pp.1-10
• /
• 2002

Process capability indices are widely used in industries and quality assurance system. In past years, process capability analysis have been used to characterize process performance on the basis of univariate quality characteristics. However, in actual manufacturing industrial, statistical process control (SPC) often entails characterizing or assessing processes or products based on more than one engineering specification or quality characteristic. Therefore, the analysis have to be required a multivariate statistical technique. This paper introduces to multivariate capability indices and then selects a multivariate process capability index incorporated both the process variation and the process deviation from target among these indices under the multivariate normal distribution. We propose a new multivariate capability index $MC_{pm}^+$ using quality loss function instead of the process variation and this index is compared with the proposed indices when quality characteristics are independent and dependent of each other.

• 제어로봇시스템학회:학술대회논문집
• /
• 제어로봇시스템학회 2000년도 제15차 학술회의논문집
• /
• pp.391-391
• /
• 2000

Manufacturing process generally exhibits major or minor variations due to deviation of raw materials, equipment degradation, controller malfunction, and so on. Extensive research based on multivariate statistical process control has been done to monitor the unstable states and indicate a corrective action. A prototype of intelligent operation support system ("ISYS-MSPC") has been developed as a tool that supports the enhanced operation to guarantee the high productivity and a uniform high quality product. This system has been applied to the industrial batch and continuous processes and its performance has been validated .

• 경영과학
• /
• 제12권1호
• /
• pp.111-124
• /
• 1995

With the increasing interest of reducing process variation, statistical process control has served the pivotal tool in most industrial quality programs. In this study, system analyses have been performed associated with a cost incorporated version of a process control, a quadratic loss-based X over bar control chart model. Specifically, two issues, the capital/research investments for improvement of a system and the precision of a parameter estimation, have been addressed and discussed. Through the analysis of experimental results, we show that process variability is seen to be one of the most important sources of loss and quality improvement efforts should be directed to reduce this variability. We further derive the results that, even if the optimal designs may be sensitive, the model appears to be robust with regard to misspecification of parameters. The approach and discussion taken in this study provide a meaningful guide for proper process control. We conclude this study with providing general comments.

• 산업경영시스템학회지
• /
• 제26권3호
• /
• pp.39-49
• /
• 2003

Statistical process cintrol is intended to assist operators of a stable system in monitoring whether a change has occurred in the process, and it uses several control charts as main tools. In design and use of control chart, it is rational that probability of false alarm is minimized in stable process and probability of detecting shifts is maximized in out-of-control. In this study, we establish bootstrap control limits for robust M-estimator chart by applying the bootstrap method, called resampling, which could not demand assumptions about pre-distribution when the process is skewed and/or the normality assumption is doubt. The results obtained in this study are summarized as follows : bootstrap M-estimator control chart is developed for applying bootstrap method to M-estimator chart, which is more robust to keep ARL when process contain contaminate quality characteristic.

• 산업경영시스템학회지
• /
• 제21권45호
• /
• pp.237-246
• /
• 1998

In most statistical process control(SPC), control charts are used in which samples are taken and a suitable statistic is determined and plotted. In these control charts, control limits, ${\mu}{\pm}textsc{k{\sigma}}$, from which a decision is made are mostly ${\mu}{\pm}3{\sigma}$ and current literature in control charts are mainly concerned with detecting a shift in the mean. Therefore, when $\sigma$ is increased considerably after a long time, using control limits set at the first time causes a great deal of economic loss. In this paper the solutions to determine new control limits which maximizes the profit per unit produced and reduce $\sigma$ to economically optimal level for a certain cost when $\sigma$ is increased due to process deterioration are proposed. By applying new control limits, $\alpha$ error decreases considerably compared to apply initial control limits when $\sigma$ is increased due to process deterioration. Therefore, false alarm investigation cost drops down to the level of initial a error. And also this solution provides useful information regarding replacement of a process when the process is reviewed regularly.

• 제어로봇시스템학회논문지
• /
• 제4권2호
• /
• pp.246-255
• /
• 1998

This paper presents a novel method for real-time malfunction detection of plasma etching process using EPD signal traces. First, many reference EPD signal traces are collected using monochromator and data acquisition system in normal etching processes. Critical points are defined by applying differentiation and zero-crossing method to the collected reference signal traces. Critical parameters such as intensity, slope, time, peak, overshoot, etc., determined by critical points, and frame attributes transformed signal-to symbol of reference signal traces are saved. Also, UCL(Upper Control Limit) and LCL(Lower Control Limit) are obtained by mean and standard deviation of critical parameters. Then, test EPD signal traces are collected in the actual processes, and frame attributes and critical parameters are obtained using the above mentioned method. Process malfunctions are detected in real-time by applying SPC(Statistical Process Control) method to critical parameters. the Real-time malfunction detection method presented in this paper was applied to actual processes and the results indicated that it was proved to be able to supplement disadvantages of existing quality control check inspecting or testing random-selected devices and detect process malfunctions correctly in real-time.

• 산업경영시스템학회지
• /
• 제34권4호
• /
• pp.57-65
• /
• 2011

Monitoring auto correlated processes is prevalent in recent manufacturing environments. As a proactive control for manufacturing processes is emphasized especially in the semiconductor industry, it is natural to monitor real-time status of equipment through sensor rather than resultant output status of the processes. Equipment's sensor data show various forms of correlation features. Among them, considerable amount of sensor data, statistically autocorrelated, is well represented by Box-Jenkins autoregressive moving average (ARMA) model. In this paper, we present a design method of statistical process control (SPC) used for monitoring processes represented by the ARMA model. The proposed method shows benefits in the power of detecting process changes, and considers robustness to ARMA modeling errors simultaneously. We prove benefits through Monte carlo simulation-based investigations.

• 한국산업경영시스템학회:학술대회논문집
• /
• 한국산업경영시스템학회 2002년도 춘계학술대회
• /
• pp.1-8
• /
• 2002

At present, company has to produce a product that consumer like with a competitive price, a good quality, and a fitting time to supply. Process control and qualify control are very important to supply with a product uniformly and inexpensively In this paper, the characteristic of product quality is monitored by control chart during the machining process and construction of quality control cycle is considered to divide into two types in this case that different assignable causes lead to shifts having different magnitudes. Then we are intended to find a process shift magnitude which has economical quality cost policy and are considered to quality cost functions to find a process shift magnitude. Those costs are categorized into the well-known categories of prevention, appraisal, and internal failure and external failure. This paper ends with numerical examples that demonstrate the usefulness of the model.