• Title/Summary/Keyword: 2pi-ambiguity

Search Result 14, Processing Time 0.031 seconds

A Study on 3-D Shape Measurement and Application by using Digital Projection $Moir\acute{e}$ ( I ) (디지털 영사식 무아레를 이용한 3차원 형상 측정과 응용에 관한 연구( I ))

  • Ryu Weon-Jae;Rho Hyung-Min;Lee Dong-Hwan;Kang Young-June
    • Journal of the Korean Society for Precision Engineering
    • /
    • v.22 no.7 s.172
    • /
    • pp.88-93
    • /
    • 2005
  • $Moir\acute{e}$ topography method is a well-known non-contacting 3-D measurement method. Recently, the automatic 3-D measurement by $Moir\acute{e}$ topography has been required, since the method was frequently applied to the engineering and medical fields. The 3-D measurement using projection $Moir\acute{e}$ topography is very attractive because of its high measuring speed and high sensitivity. In this paper, using two-wavelength method of projection $Moir\acute{e}$ topography was tested to measuring object with $2\pi-ambiguity$ problems. The experimental results prove that the proposed scheme is capable of finding absolute fringe orders, so that the $2\pi-ambiguity$ problems can be effectively overcome so as to treat large step discontinuities in measured objects.

A Study on the Virtual Grating Projection Moire Topography for the Shape Measurement of Human Face (인체형상 측정을 위한 가상격자 영사식 무아레 방법에 관한 연구)

  • 유원재;최정표;안중근;강영준
    • Proceedings of the Korean Society of Precision Engineering Conference
    • /
    • 2001.04a
    • /
    • pp.49-52
    • /
    • 2001
  • Moire topography method is a well-known non-contacting 3-D measurement method. Recently, the automatic 3-D measurement by moire topography has been required since the method was frequently applied to the engineering and medical fields. 3-D measurement using projection moire topogrphy is very attractive because of it s high measuring speed and high sensitivity. In this paper, using two-wavelength method of projection moire topography tested to measuring object with the $2\pi$-ambiguity problem. Experimental results prove that the proposed scheme is capable of finding absolute fringe orders, so that the $2\pi$-ambiguity problem can be effectively overcome so as to treat large step discontinuities in measured objects.

  • PDF

Two-Wavelength Phase-Shifting Projection $Moir\acute{e}$ Topography for Measurement of Three-Dimensional Profiles with High Step Discontinuities (고단차 불연속 형상의 3차원 측정을 위한 이중파장 위상천이 영사식 무아레)

  • Kim, Seung-Woo;Oh, Jung-Taek;Jung, Moon-Sik;Choi, Yi-Bae
    • Transactions of the Korean Society of Mechanical Engineers A
    • /
    • v.23 no.7 s.166
    • /
    • pp.1129-1138
    • /
    • 1999
  • [$Moir\acute{e}$] technique is now being extensively investigated as a fast non-contact means of three-dimensional profile measurement especially for reverse engineering. One problem with $moir\acute{e}$ technique is so called $2\pi$-ambiguity problem that limits the maximum step height difference between two neighboring sampling points to be less than half the equivalent wavelength of $moir\acute{e}$ fringes. In this investigation, a new two-wavelength scheme of projection $moir\acute{e}$ topography is proposed and tested to cope with the $2\pi$-ambiguity problem. Experimental results are discussed to assess the new method in measuring large objects with high step discontinuities.

Unambiguous 3D Surface Measurement Method for a Micro-Fresnel Lens-Shaped Lenticular Lens Based on a Transmissive Interferometer

  • Yoon, Do-Young;Kim, Tai-Wook;Kim, Minsu;Pahk, Heui-Jae
    • Journal of the Optical Society of Korea
    • /
    • v.18 no.1
    • /
    • pp.37-44
    • /
    • 2014
  • The use of a laser interferometer as a metrological tool in micro-optics measurement is demonstrated. A transmissive interferometer is effective in measuring an optical specimen having a high angle slope. A configuration that consists of an optical resolution of 0.62 micron is adapted to measure a specimen, which is a micro-Fresnel lens-shaped lenticular lens. The measurement result shows a good repeatability at each fraction of facets, however, a reconstruction of the lens shape profile is disturbed by a known problem of $2{\pi}$-ambiguity. To solve this $2{\pi}$-ambiguity problem, we propose a two-step phase unwrapping method. In the first step, an unwrapped phase map is obtained by using a conventional unwrapping method. Then, a proposed unwrapping method based on the shape modeling is applied to correct the wrongly unwrapped phase. A measured height of each facet is compared with a profile result measured by AFM.

A Study on 3-D Shape Measurement and Application by Using Digital Projection Moire (II) (디지털 영사식 무아레를 이용한 3차원 형상 측정과 응용에 관한 연구(II))

  • Ryu, Weon-Jae;Kang, Young-June;Rho, Hyung-Min;Lee, Dong-Hwan
    • Journal of the Korean Society for Precision Engineering
    • /
    • v.24 no.5
    • /
    • pp.62-67
    • /
    • 2007
  • A simple dimension measuring method for the measurement of human bust has been developed using projection moire. The 3-D data of a human bust was calculated from the 2dimensional image information obtained by the stripe using projection moire. The creation of 3-D geometric shape by digitizing real objects has been widely investigated in reverse engineering(RE). This procedure generally consists of three basic steps: data capture, data alignment and model reconstruction. In order to achieve a complete model, multiple scans must be taken and aligned.

Phase unwrapping enhancement of phase shift interferometry by using lateral scanning (횡방향 주사를 이용한 광위상 간섭계의 페이즈 언래핑 향상에 대한 연구)

  • Park, Do-Min;Park, Sung-Lim;Gweon, Dae-Gab
    • Transactions of the Korean Society of Mechanical Engineers A
    • /
    • v.22 no.3
    • /
    • pp.684-687
    • /
    • 1998
  • The biggest problem common on to all forms of Phase Shift Interferometer is unwrapping the phase. Simple phase unwrapping algorithms assume that every pixel is within radians of its neighbors. If this is true, any reasonable algorithm will return the correct unwrapped phase. If not, correct unwrapped phase will not be obtained. In rough surface, frequently, neighboring pixels have phase steps greater than. This paper proposes the new method which makes phase steps smaller than by sub-pixel movement.

Accuracy Evaluation of DEM Produced by using KOMPSAT-5 InSAR Image (KOMPSAT 5호 InSAR영상을 이용한 DEM제작 정확도 평가)

  • Han, Seung-Hee
    • Journal of Cadastre & Land InformatiX
    • /
    • v.47 no.2
    • /
    • pp.39-47
    • /
    • 2017
  • The SAR payload of the KOMPSAT-5 is equipped with an X-band (9.66GHz) microwave-based sensor. Especially, since it has a fixed antenna that can be electronically steered with respect to the azimuth and elevation planes, various applications are expected. This study evaluates the production performance and the accuracy of the DEM by producing DEM using the HR and UH mode images of KOMPSAT-5. To evaluate the production performance of the DEM, the sensitivity of DEM was assessed through a baseline analysis and $2{\pi}$ ambiguity; it was found to have good production performance. In addition, to evaluate the accuracy of the produced DEM, 30 check points were compared with SRTM data. As a result, STDEV ${\pm}15-20m$ accuracy was obtained. If the accuracy of the DEM is improved by adjusting the parameters of the filtering method or phase unwrapping method in the future, it will be possible to widely use the KOMPSAT-5 image for environmental and disaster monitoring.

2D/3D Visual Optical Inspection System for Quad Chip (Quad Chip 외관 불량 검사를 위한 2D/3D 광학 시스템)

  • Han, Chang Ho;Lee, Sangjoon;Park, Chul-Geon;Lee, Ji Yeon;Ryu, Young-Kee;Ko, Kuk Won
    • Journal of the Korea Academia-Industrial cooperation Society
    • /
    • v.17 no.1
    • /
    • pp.684-692
    • /
    • 2016
  • In the manufacturing process of the LQFP/TQFP (Low-profile Quad Flat Package/Thin Quad Flat Package), the requirement of a 3 dimensional inspection is increasing rapidly and a 3D inspection of the shape of a chip has become an important report of quality control. This study developed a 3 dimensional measurement system based on PMP (Phase Measuring Profilometry) for an inspection of the LQFP/TQFP chip and image processing algorithms. The defects of the LQFP/TQFP chip were classified according to the dimensions. The 2 dimensional optical system was designed by the dorm illumination to achieve constant light distribution, In the 3 dimensional optical system, PZT was used for moving 90 degree in phase. The problem of 2 ambiguity was solved from the measured moir? pattern using the ambiguity elimination algorithm that finds the point of ambiguity and refines the phase value. The proposed 3D measurement system was evaluated experimentally.

A Study on the Calibration of Shape Measurement System Using Digital moire (Digital moire 형상측정 시스템의 보정에 관한 연구)

  • 유원재;김도훈;안재웅;강영준;노형민
    • Proceedings of the Korean Society of Precision Engineering Conference
    • /
    • 2002.05a
    • /
    • pp.199-202
    • /
    • 2002
  • Moire topography method is a well-known non-contacting 3-D measurement method. Recently, the automatic 3-D measurement by moire topography has been required since the method was frequently applied to the engineering and medical fields. 3-D measurement using digital projection moire topography is very attractive because of its high measuring speed and high sensitivity. In this paper, using different N-bucket algorithm method of digital projection moire topography is tested to measuring object with the 2$\pi$-ambiguity problem. Experimental results prove that the proposed scheme is capable of finding measurement errors that decreased more by using the flour-three step algorithm method than the same step in the phase shifting of different pitchs.

  • PDF

The Frequency Offset Estimation Algorithm for DBO-CSS

  • Baik, Seung-Han;Yoon, Sang-Hun;Chong, Jong-Wha
    • Proceedings of the IEEK Conference
    • /
    • 2008.06a
    • /
    • pp.319-320
    • /
    • 2008
  • In this paper, we propose a new frequency offset estimation algorithm for DBO-CSS which is a standard for wireless personal area network (WPAN). In DBO-CSS, there can be several integer multiples of $2{\pi}$ in the phase rotation caused by the frequency offset because of the long time difference between the samples of differential relation and the high permissible frequency offset of the crystal oscillators between the transmitter and the receiver. In this paper, we propose an estimation algorithm by using the relationships of each sub-chirp signals to find the integer part without phase ambiguity.

  • PDF