• Title/Summary/Keyword: 1/f Noise

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HEAT EQUATION IN WHITE NOISE ANALYSIS

  • KimLee, Jung-Soon
    • Journal of the Korean Mathematical Society
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    • v.33 no.3
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    • pp.541-555
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    • 1996
  • The Fourier transform plays a central role in the theory of distribution on Euclidean spaces. Although Lebesgue measure does not exist in infinite dimensional spaces, the Fourier transform can be introduced in the space $(S)^*$ of generalized white noise functionals. This has been done in the series of paper by H.-H. Kuo [1, 2, 3], [4] and [5]. The Fourier transform $F$ has many properties similar to the finite dimensional case; e.g., the Fourier transform carries coordinate differentiation into multiplication and vice versa. It plays an essential role in the theory of differential equations in infinite dimensional spaces.

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Flicker Noise Analysis in The Third-order of The PLL System (3차 PLL System에서의 Flicker Noise 분석)

  • 김형도;김경복;조형래
    • The Journal of Korean Institute of Electromagnetic Engineering and Science
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    • v.11 no.5
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    • pp.707-714
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    • 2000
  • In this paper, using third-order system of the PLL we'll analyze the aspect of flicker noise appearing troubles in the low frequency band. Since it is difficult to analyze mathematically flicker noise in the third-order system of the PLL, introducing the concept of pseudo-damping factor using the optimized second-filter has made an ease of the access of the flicker-noise variance. we'll show a numerical formula of flicker variance in the third-order system of the PLL which is compared with that of 1/f noise variance in the second-order system of the PLL.

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Flicker noise analysis in the third-order of the PLL system (3차 PLL SYSTEM에서의 flicker noise 분석)

  • 김형도;김경복;오용선;조형래
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 1999.11a
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    • pp.230-235
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    • 1999
  • In this paper, Using third-order system of the PLL we analyze the aspect of flicker noise appearing troubles In the low frequency band. Since i. Is difficult to analyze mathematically flirter noise In the third-order system of the PLL, introducing the concept of pseudo-damping factor using the optimized second-filter makes an ease of the access of the flicker-noise variance. we'll show a numerical formula of flicker variance in the third-order system of the PLL which is compared with that of 1/f-noise variance in the second-order system of the PLL.

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Fractional-N Frequency Synthesizer with a l-bit High-Order Interpolative ${\sum}{\Delta}$ Modulator for 3G Mobile Phone Application

  • Park, Byeong-Ha
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.2 no.1
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    • pp.41-48
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    • 2002
  • This paper presents a 18-mW, 2.5-㎓ fractional-N frequency synthesizer with l-bit $4^{th}$-order interpolative delta-sigma ($\Delta{\;}$\sum$)modulator to suppress fractional spurious tones while reducing in-band phase noise. A fractional-N frequency synthesizer with a quadruple prescaler has been designed and implemented in a $0.5-\mu\textrm{m}$ 15-GHz $f_t$ BiCMOS. Synthesizing 2.1 GHzwith less than 200 Hz resolution, it exhibits an in-band phase noise of less than -85 dBc/Hz at 1 KHz offset frequency with a reference spur of -85 dBc and no fractional spurs. The synthesizer also shows phase noise of -139 dBc/Hz at an offset frequency of 1.2 MHz from a 2.1GHz center frequency.

Characterization of YBCO do SQUID fabricated on sapphire substrate for biomagnetic applications (생체자기 응용을 위한 사파이어 기판 위에 제작된 YBCO dc SQUID 의 특성)

  • Lim, Hae-Ryong;Kim, In-Seon;Kim, Dong-Ho;Park, Yong-Ki;Park, Jong-Chul
    • 한국초전도학회:학술대회논문집
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    • v.10
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    • pp.155-159
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    • 2000
  • YBCO step-edge dc SQUID magnetometers on sapphire substrates have been fabricated. CeO2 buffer layer and YBCO films were deposited in situ on the low angle (${\sim}$35$^{\circ}$) steps formed on the sapphire substrates. Typical 5-${\mu}$m-wide junction has R$_n$ of 5 ${\omega}$ and I$_c$ of 50 ${\mu}$A with large I$_c$R$_n$ product of 250 ${\mu}$V at 77K. According to applied bias current, depth of voltage modulation was changed and maximum voltage was measured 16 ${\mu}$V. Field noise of do SQUID was measured 100${\sim}$300 fT/${\surd}^{Hz}$ in the 1 $^{kHz}$, and about 1.5 pT/${\surd}^{Hz}$ in the 1/f region. For ac bias reversal method, field noise was decreased in the 1/f region. The QRS peak of magnetocardiogram was measured 50 pT in the magnetically shielded room.

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Implementation of Magnetic Sensing System Using Spinning Current Method (Spinning Current 방식을 이용한 자기 감지 시스템의 제작)

  • Park, Joon-Hong;Nam, Tae-Chul
    • Proceedings of the KIEE Conference
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    • 1998.11c
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    • pp.773-775
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    • 1998
  • This paper describes the highly sensitive Si Hall magnetic sensing system which can measure the earth magnetic field. Generally, the important parameters in Hall device which degrade the ability of magnetic detection are offset voltage and 1/f noise. The offset voltage and 1/f noise in Hall plates can be reduced by spinning current method. In this paper, we implement the highly sensitive Si Hall magnetic sensing system using spinning current method. As a result, the minimum detectable magnetic field is 0.1G.

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A Design of Instrumentation Amplifier using a Nested-Chopping Technique (Nested-chopping 기법을 이용한 Instrumentation Amplifier 설계)

  • Lee, Jun-Gyu;Burm, Jin-Wook;Lim, Shin-Il
    • Proceedings of the KIEE Conference
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    • 2007.10a
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    • pp.483-484
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    • 2007
  • In this paper, we describe a chip design technique for instrumentation amplifier using a nested-chopping technique. Conventional chopping technique uses a pair of chopper, but nested chopping technique uses two pairs of chopper to reduce residual offset and 1/f noise. The inner chopper pair removes the 1/f noise, while the outer chopper pair reduces the residual offset. Our instrumentation amplifier using a nested chopping technique has residual offset under 100 nV. We also implement very low frequency filter. Since this filter needs very large RC time constant, we use a technique named 'diode connected PMOS' to increase R with small die area. The total power consumption is 3.1 mW at the supply voltage of 3.3V with the 0.35um general CMOS technology. The die area of implemented chip was $530um{\times}300um$.

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The 1/f Noise Analysis of 3D SONOS Multi Layer Flash Memory Devices Fabricated on Nitride or Oxide Layer (산화막과 질화막 위에 제작된 3D SONOS 다층 구조 플래시 메모리소자의 1/f 잡음 특성 분석)

  • Lee, Sang-Youl;Oh, Jae-Sub;Yang, Seung-Dong;Jeong, Kwang-Seok;Yun, Ho-Jin;Kim, Yu-Mi;Lee, Hi-Deok;Lee, Ga-Won
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.25 no.2
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    • pp.85-90
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    • 2012
  • In this paper, we compared and analyzed 3D silicon-oxide-nitride-oxide-silicon (SONOS) multi layer flash memory devices fabricated on nitride or oxide layer, respectively. The device fabricated on nitride layer has inferior electrical properties than that fabricated on oxide layer. However, the device on nitride layer has faster program / erase speed (P/E speed) than that on the oxide layer, although having inferior electrical performance. Afterwards, to find out the reason why the device on nitride has faster P/E speed, 1/f noise analysis of both devices is investigated. From gate bias dependance, both devices follow the mobility fluctuation model which results from the lattice scattering and defects in the channel layer. In addition, the device on nitride with better memory characteristics has higher normalized drain current noise power spectral density ($S_{ID}/I^2_D$>), which means that it has more traps and defects in the channel layer. The apparent hooge's noise parameter (${\alpha}_{app}$) to represent the grain boundary trap density and the height of grain boundary potential barrier is considered. The device on nitride has higher ${\alpha}_{app}$ values, which can be explained due to more grain boundary traps. Therefore, the reason why the devices on nitride and oxide have a different P/E speed can be explained due to the trapping/de-trapping of free carriers into more grain boundary trap sites in channel layer.

Development of Automatic Program for Noise Inspection of Auto-transmission (자동변속기(Auto-Transmission)의 이상음 검사자동화 시스템개발)

  • 김재열
    • Journal of the Korean Society of Manufacturing Technology Engineers
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    • v.9 no.6
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    • pp.9-18
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    • 2000
  • This study includes noise automatic inspection system for washing machine auto-transmission one of modern home necessary. We effort to find and certificate sound noise source by sound power and sound intensity, and apply to frequency analysis in vibration related sound noise. still more we have been studying to data acquisition and programming for MS VisualBasic version 5.0. System component is below. 1) Pentium PC or data acquisition. 2) DSO for noise acquisition. 3)S/W for comparison and decision. 4) I/F Board for data communication. Wave form data through the DSO are converting to ASCII code data. The ASCII code through binary converting S/W. Finally we will making noise monitoring system and automatic inspection system.

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Evaluation of Physical Characteristics of Discovery ST scanner Using NEMA NU2-2001 Standard (NEMA NU2-2001을 이용한 PET-CT 스캐너의 물리적 특성평가)

  • Lee, Byeong-Il
    • Journal of Integrative Natural Science
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    • v.1 no.2
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    • pp.79-83
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    • 2008
  • As a new standard for performance measurement, NEMA NU2-2001 was presented recently. In this study, I investigated the spatial resolution, sensitivity, scatter fraction, and noise equivalent count ratio (NECR) in order to know the information of physical characteristics and system performance of GE discovery ST using this new standard. Bismuth germinate crystals ($6{\times}6$ array, $6.3mm{\times}6.3mm{\times}30mm$) were used in discovery ST (energy window:375-650 keV, coincidence window:11.7 nsec). To measure the sensitivity, five aluminum sleeves (Data Spectrum Corp., Chapel Hill, NC., USA, thickness:1.25 mm)-NEMA sensitivity phantom- filled with F-18 solution were used. Successive measurements in 2D and 3D acquisition mode were made with a line source at the center of transaxial field of view and 10 cm off from the center until the count was over 500,000. Spatial resolution was estimated using a point source (F-18, 0.1 mCi) at different locations in the FOV. Scatter fraction and NECR was tested using a NEMA scatter phantom. Dynamic data were acquired for 7 half-lives using F-18 solution. And true to background ratio was averaged at last three frames when the random rate was as small as ignorable for the calculation of scatter fraction. We anticipate this overall evaluated results could be used for the quality assurance and optimized image acquisition for clinical research.

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