• Title/Summary/Keyword: 후방산란전자

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Method for Channel Estimation in Ambient Backscatter Communication (주변 후방산란 통신에서의 채널 추정기법)

  • Kim, Soo-Hyun;Lee, Donggu;Sun, Young-Ghyu;Sim, Issac;Hwang, Yu-Min;Shin, Yoan;Kim, Dong-In;Kim, Jin-Young
    • The Journal of the Institute of Internet, Broadcasting and Communication
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    • v.19 no.4
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    • pp.7-12
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    • 2019
  • Ambient backscatter communication is limited to channel estimation technique through a pilot signal, which is a channel estimation method in current RF communication, due to transmission power efficiency. In a limited transmission power environment, the research of traditional ambient backscatter communication has been studied assuming that it is an ideal channel without signal distortions due to channel conditions. In this paper, we propose an expectation-maximization(EM) algorithm, one of the blind channel estimation techniques, as a channel estimation method in ambient backscatter communication system which is the state of channel following normal distribution. In the proposed system model, the simulations confirm that channel estimate through EM algorithm is approaching the lower bound of the mean square error compared with the Bayesian Cramer-Rao Boundary(BCRB) to check performance. It shows that the channel parameter can be estimated in the ambient backscatter communication system.

Investigation on backscatter According to Changed in Components of Linear Accelerator Using Monte Carlo Simulation (몬테카를로 시뮬레이션을 이용한 선형가속기 구성요소 변화에 따른 후방산란에 관한 연구)

  • Kim, Hwein;Chon, Kwonsu
    • Journal of the Korean Society of Radiology
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    • v.9 no.4
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    • pp.239-247
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    • 2015
  • It should be accurate dose calculation to increase the efficiency of radiation therapy, and it is priority to figure out the beam characteristics for this purpose. The target and primary collimator in head components of the linear accelerator have the greatest influence on determining the beam characteristics which is caused by backscatter and it is the factor to consider the shielding structures and equipment management. In this study, we made modeling of the linear accelerator through the Geant4 Monte Carlo simulation and investigated backscatter according to the change of the size and shape in head components. For the scattered electrons, it showed the greatest number of distributions inside of the inner radius at primary collimator. But, for the scattered photons which have the high energy, it was mostly located outside of the inner radius at primary collimator. Scattered positrons showed a small occurrence in about 0.03%. According to the change of the inner radius at primary collimator, it was great changes in the inside of inner radius for all three scattered particles. According to the change of the outer radius at primary collimator, it was shown some considerable effects from more than 60 mm outer radius. It was no significant effect according to the change of target thickness. In this study, we found that backscatter should be considered, and figured out that geometric size and shape of the peripheral components are the factors that influences the backscatter effect.

The Measurements of Rayleigh Velocity and the Non-Destructive Evaluation by Using Backscattering Signal (후방산란신호에 의한 Rayleigh 파의 속도측정 및 비파괴검사)

  • Ban, Cheon-Sik;Kim, Jang-Kwon;Jun, Kye-Suk
    • Journal of the Korean Institute of Telematics and Electronics
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    • v.26 no.2
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    • pp.163-168
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    • 1989
  • In this paper, Rayleigh wave velocity has been measured by detecting the backscattered signal generating near the Rayleigh critical angle in the elastic medium. The rotating system has been made for the measurment of Rayleigh angle. It has been shown that the measured velocity for the stainless steel, brass aluminum, copper has been good agreement with the theoretical value. The method of non-destructive evaluation using backscattering signal has been presented and the c-scan acoustic image for internal of IC sample has been displayed.

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Microwave Forward Scattering From Earth Surfaces (지표면에서의 Forward 산란 계산)

  • Hong Jin-Young;Oh Yi-Sok
    • Proceedings of the KSRS Conference
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    • 2006.03a
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    • pp.135-138
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    • 2006
  • 본 논문은 지표면에 대한 forward 및 coherent 산란 계산으로 1차 radiative transfer 이론을 적용하여 맨땅 및 수풀층에서의 전자파 산란을 계산하였다. 원격탐사에서 전자파 후방산란계산은 많은 연구가 진행되고 있는 반면 forward 산란계산에 대한 연구는 거의 진행되어 있지 않다. 따라서 본 논문에서는 지표면에 대한 전자파의forward 및 coherent 산란을 계산함으로써 다양한 전자파산란 모델을 제시하고자 한다. 또한, 본 논문에서의 계산결과 후방산란보다 forward 및 coherent 산란 계산에서 지표면의 수분함유량, 수풀 및 나무의 길이, 밀도, 크기 등과 같은 지표 환경의 변화에 산란계수가 더 민감하게 변화함을 알 수 있었다.

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Surface Structure Analysis of Solids by Impact Collision Ion Scattering Spectroscopy(2): Atomic Structure of Semiconductor Surface (직충돌 이온산란 분광법(ICISS)에 의한 고체 표면구조의 해석(2): 반도체 재료의 표면구조 해석)

  • Hwang, Yeon
    • Korean Journal of Crystallography
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    • v.19 no.1
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    • pp.7-13
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    • 2008
  • 고체 표면의 구조해석 방법에는 LEED(저에너지 전자선 회절법)나 RHEED(반사 고에너지 전자선 회절법) 등과 같이 표면의 2차원적 회절상을 해석하는 방법이 있고(역격자 공간의 해석), 또는 ISS(이온산란 분광법), RBS(러더포드 후방산란법) 등과 같이 표면 원자의 실공간에 대한 정보를 직접 얻는 방법이 있다. 실제로는 두 가지 종류의 분석법을 상호 보완적으로 조합하여 효율적인 구조해석을 수행한다. 본고에서는 직충돌 이온산란 분광법(ICISS: Impact Collision Ion Scattering Spectroscopy)에 대한 원리, 장치, 측정방법 등을 소개한 전고에 이어서 이를 이용한 반도체 표면구조 해석에 관하여 기술하고자 한다. 표면의 원자구조를 알아내기 위해서는 산란된 입자의 강도를 입사각도와 출사각도에 대하여 조사하여야 하는데, 이온이 원자와 충돌하여 산란될 때 원자의 후방으로 형성되는 shadow cone에 의하여 생성되는 집속 효과(focusing effect) 및 가리움 효과(blocking effect) 중에서 ICISS는 집속 효과만을 고려하여 해석하면 실공간에서의 원자구조를 해석할 수 있다. 본 고에서는 ICISS를 이용하여 금속 또는 절연체 물질이 반도체 표면 위에서 흡착 또는 성장될 때 초기의 계면 구조 해석, 금속/반도체 계면에서 시간에 따른 동적변화 해석, III-V족 반도체의 표면구조 해석, 반도체 기판 위에서 박막 성장 과정 해석 등에 관한 연구 사례를 소개하고자 한다.

Fabrication of Backscatter Electron Cones for Radiation Therapy (산란전자선을 이용한 강내측방조사기구의 제작과 특성)

  • Chu, Sung-Sil;Suh, Chang-Ok;Kim, Gwi-Eon
    • Radiation Oncology Journal
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    • v.19 no.1
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    • pp.74-80
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    • 2001
  • Purpose : Irradiation cones by using backscatter electrons are made for the treatment of superficial small lesions of skin, oral cavity, and rectum where a significant dose gradient and maximum surface dose is desired. Methods and Materials : Backscatter electrons are produced from the primary electron beams from the linear accelerators. The design consists of a cylindrical cone that has a thick circular plate of high atomic number medium (Pb or Cu) attached to the distal end, and the plate can be adjusted the reflected angle. Primary electrons strike the metal plate perpendicularly and produce backscatter electrons that reflect through the lateral hole for treatment. Using film and a parallel plate ion chamber, backscatter electron dose characteristics are measured. Results : The depth dose characteristic of the backscatter electron is very similar to that of the hard x-ray beam that is commonly used for the intracavitary and superficial lesions. The basckscatter electron energy is nearly constant and effectively about 1.5 MeV from the clinical megavoltage beams. The backscatter electron dose rate of $35\~85\;cGy/min$ could be achieved from modern accelerators without any modification. and the depth in water of $50\%$ depth dose from backscatter electron located at 6mm for $45^{\circ}$ angled lead scatter. The beam flatness is dependent on the slit size and the depth of treatment, but is satisfactory to treat small lesions. Conclusions : The measured data for backscatter electron energy, depth dose flatness dose rate and absolute dose indicates that the backscatter electrons are suitable for clinical use.

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CeB6 필라멘트를 탑재한 저진공 주사전자현미경의 개발

  • Seol, In-Ho;Bae, Mun-Seop;Park, In-Yong;Jo, Bok-Rae
    • Proceedings of the Korean Vacuum Society Conference
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    • 2016.02a
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    • pp.111.2-111.2
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    • 2016
  • 주사전자현미경은 시료표면에 전자빔을 주사하여 시료와 전자빔간의 상호작용으로 발생하는 이차전자(SE)와 후방산란전자(BSE)를 이용하여 시료표면을 관찰하는 장비이다. 일반적으로 텅스텐필라멘트를 사용하며, 10E-5 mbar이하 압력의 고진공에서 시료관찰이 이루어진다. 고진공 시료관찰시 도체 시료는 표면 코팅 없이 관찰이 가능하지만, 부도체 시료의 경우 전자빔에 의한 대전(Charging)현상이 발생하여 이미지가 왜곡되며, 이를 방지하기 위해 금, 백금 등의 금속을 표면에 코팅하여야 한다. 하지만 10E-1 mbar 이상 압력의 저진공에서는 부도체 시료도 전자빔에 의한 대전(Charging)현상이 발생하지 않아 생물시료 등의 부도체 시료를 표면코팅 없이 관찰할 수 있다. 본 발표에서는 현재 개발 중인 CeB6 필라멘트를 탑재한 저진공 주사전자현미경의 차동배기구조를 보여준다. 차동배기에 의해 가동 압력 10E-1 mbar이상의 저진공을 유지하는 시료실과 CeB6 필라멘트를 사용하기 위한 10E-6 mbar이하의 고진공을 유지하는 전자총실의 진공 배기특성을 보고한다.

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The Electron Detector in Scanning Electron Microscope (주사전자현미경용 전자검출기)

  • 이상욱;전종업;한상훈
    • Proceedings of the Korean Society of Machine Tool Engineers Conference
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    • 2004.04a
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    • pp.513-517
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    • 2004
  • The nature of the signals collected by an SEM(Scanning Electron Microscope) in order to form images are all dependent on the detector used to collect them, and the quality of an acquired image is strongly influenced by detector performance. Therefore, the development of detector with high performance is very important in pulling up the resolution of SEM. In this article, electron beam-specimen interactions, the detection principle of secondary electrons and backscattered electrons, and the structure of a conventional detector are described. The structure of an experimental apparatus for the future study on our hopeful novel electron detector is presented as well.

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A study on electron beam lithography for 0.1$\mu\textrm{M}$ T-gate formation at P(MMA/MAA)/PMMA structure (PMMA/P(MMA/MAA) 구조에서 0.1$\mu\textrm{M}$ T-gate 형성을 위한 전자빔 리소그래피 공정에 관한 연구)

  • Choe, Sang-Su;Lee, Jin-Hui;Yu, Hyeong-Jun;Lee, Sang-Yun
    • Korean Journal of Materials Research
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    • v.5 no.1
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    • pp.96-103
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    • 1995
  • This art~cle reports on the formation of T - Gate with O.1$\mu$m foot and 0.4$\mu$m head width at PMMA/P( MMA/MAA) resist structure using a 30KV electron beam lithography system. From the result of Monte Carlo simulation on PMMA/P( MMA/MAA)/GaAs, we obtain the dissipation energy ratio of forwardscattered electron and backscattered electron within 0.1$\mu$m scattering radius is 19.5 : 1 0.1$\mu$m T - gate has been formed with 30KV gaussian electron beam at a 440$\mu C/\textrm{cm}^2$ dosage. The gamma value of PMMA and P(MMA/MAA) at MIBK : IPA=l : 1 developer was 2.3. The overlay accuracy(3$\sigma$) from mix-andmatch of optical stepper and Ekeam lithography system for fabricating HEMT device is accomplished below 0.1$\mu$m.

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Steel Plate Thickness Gauge by means of Gamma-Ray Backscattering (감마선 빽스켓터링을 이용한 철판 두께 측정에 관하여)

  • 김덕진;김동훈
    • Journal of the Korean Institute of Telematics and Electronics
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    • v.3 no.1
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    • pp.18-23
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    • 1966
  • An experimental study of a steel plate thickness gauge by means of the measurements of backscatered gamma-rays has been carried out. The difference between this and other methods is that this method does not include any shilding matterials in the detecting probe, because the primary radiations and the backscattered radiations are detected simultaneously by an NaI (TI) scintillating crystal, and the activity of the Co-60 source used is low enough. In this thickness gauge, the thickness of the steel plates can be read directly on the counting ratemeter scale. The optimum conditions in the source-to-detector distance, window width of the analyzer, energy and strength of the gamma-ray source were found experimentally. The results have shown that the accuracy of the gauge was about $\pm$3% in the range of 3 to 8mm thickness. This gauge can be used to detect the pits or corrosions on the inner walls of the steel pipes.

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