• Title/Summary/Keyword: 회전형 편광분석기

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보급형 He-Ne 타원해석기의 제작과 $TiO_2$ 박막 유효밀도 변화의 in situ 측정

  • 김상준;방현용;김상열
    • Proceedings of the Korean Vacuum Society Conference
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    • 1999.07a
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    • pp.101-101
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    • 1999
  • 실시간으로 변화하는 시료를 측정하고 분석할 수 있도록 비접촉시이며, 광학방식인 단파장 in situ 타원해석기를 제작하였다. He-Ne 레이저를 광원으로 사용하였고 회전편광자형 광량 측정방식을 채택하였다. 기존의 진공챔버 등에 쉽게 장착할 수 있도록 동축 구조를 사용하였으므로 소형이며 단순한 설계가 가능하였다. 전자빔 증착방법으로 성장시킨 조밀도가 82%인 이산화티타늄 박막의 분석에 이 타원해석기를 사용하여 수분탈착에 따르는 이산화티타늄 박막의 유효밀도 변화를 박막의 온도 변화와 시간 변화에 따라 실시간 in, situ방식으로 관측하였다.

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Comparison of Misalignment and Retardation Errors of Dual Rotating Quarter-Wave Plates in Muller-Matrix Ellipsometry (타원편광 분석기에서 정렬오차와 사분파장판의 지연오차로 인한 뮬러 매트릭스 오차 분석)

  • Cheong, Hai Du;Kim, Dukhyeon
    • Korean Journal of Optics and Photonics
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    • v.25 no.5
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    • pp.262-272
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    • 2014
  • Using an ellipsometer with dual rotating quarter-wave plates, we have analyzed the relationship between Fourier coefficients and Mueller matrices in the cases of an error-free optical system and of five systematic errors (alignment errors and retardation errors in the quarter-wave plates, and alignment error in the analyzer). In the case with five systematic errors, simulation results show that retardation errors cause more error in the diagonal elements of the Mueller matrix than do alignment errors. We have found that errors in the Mueller matrix caused by initial misalignment of the dual quarter-wave plates were the same. We have chosen the rotation rates of two quarter-wave plates such that the rotational frequencies ${\omega}_1$ and ${\omega}_2$ differ by a factor of 5, i.e. ${\omega}_2=5{\omega}_1$. The simulation results show 0.18% relative error in the diagonal elements ($m_{22}$ and $m_{33}$) and 200% relative error in the off-diagonal elements ($m_{23}$ and $m_{32}$), when we compare errors caused by misalignment of the analyzer to those caused by initial misalignment of the quarter-wave plates. We can use these results in measuring accurate Mueller matrices of optical materials.

A Study on the Low-Cost Fiber-Optic Gyroscope Using the Single Mode Fiber and Depolarizer (단일모드 광섬유와 편광소멸기를 이용한 저가형 광섬유 자이로스코프에 관한 연구)

  • Jang, Nam-Young;Ham, Hyung-Jae;Song, Hui-Young;Chio, Pyung-Suk;Eun, Jae-Jeong
    • Journal of the Institute of Convergence Signal Processing
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    • v.9 no.3
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    • pp.179-187
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    • 2008
  • In this paper, we carried out the performance evaluation of depolarized fiber optic gyroscope(D-FOG) that was designed and fabricated with the low-cost optical communication single mode fiber and depolarizer. In order to reduce the phase error of D-FOG, the circuit of stabilized current and temperature of the light source was made and the performance was analyzed. The current and the temperature stability of the fabricated stabilization circuit were less than $200{\mu}A$ and $0.0098^{\circ}C$, respectively. Also, the D-FOG's experimental result showed that the value of the dynamic range of rotated rate, the scale factor error with a good linearity, and the zero bias drift were ${\pm}50^{\circ}/s$, 2.8881%, and $19.49^{\circ}/h$, respectively. The results indicated that a low-cost FOG was able to fabricate which was more cost effective than conventional FOG with a high-cost high-birefringent polarization maintaining fiber.

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Phase identification and degree of orientation measurements far fine-grained rock forming minerals using micro-area X-ray diffractometer -$Al_{2}SiO_{5}$ Polymorphs- (미소부 X-선 회절분석기를 이용한 미립조암광물의 상동정 및 배향도 측정 -$Al_{2}SiO_{5}$ 3상다형-)

  • 박찬수;김형식
    • The Journal of the Petrological Society of Korea
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    • v.9 no.4
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    • pp.205-210
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    • 2000
  • Measurements of phase identification and degree of orientation for fine-grained (about 0.3 mm in diameter) minerals in rock samples performed by micro-area X-ray diffractometer.$Al_{2}SiO_{5}$ polymorphs (andalusite, kyanite and sillimanite) were chosen for the measurements and target minerals were existed on thin sections. Micro-area X-ray diffractometer is composed of 3(${\omega}\;{\chi}\;{\phi}$)-circle oscillating goniometer and position sensitive proportional counter (PSPC). $CuK_{\alpha}$ radiation was used as X-ray source and a pin hole ($50\;\mu\textrm{m}$$ in diameter) collimator was selected to focus radiation X-ray onto the target minerals. Phase identification and diffracted X-ray peak indexing were carried out by 3(${\omega}\;{\chi}\;{\phi}$)-circle oscillation measurement. Then, 2(${\omega}\;{\phi}$)-circle oscillation measurement was made for the purpose of searching the prevailing lattice plane of the minerals on thin section surface. Finally, for a selected peak by 2-circle oscillation measurement, X-ray pole figure measurement was executed for the purpose of check the degree of orientation of the single lattice direction and examine its pole distribution. As a result of 3-circle oscillation measurement, it was possible that phase identification among $Al_{2}SiO_{5}$ polymorphs. And from the results of 2-circle oscillation measurement and X-ray pole figure measurement, we recognized that poles of andalusite (122), kyanite (200) and sillimanite (310) lattice plances were well developed with direction normal to each mineral surface plane respectively. Therfore, the measurements used with micro-area X-ray diffractometer in this study will be a useful tool of phase identification and degree of orientation measurement for fine-grained rock forming minerals.

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Development of a Microspot Spectroscopic Ellipsometer Compatible with Atomic Force Microscope (원자힘 현미경 융합형 마이크로스폿 분광타원계 개발)

  • In, Sun Ja;Lee, Min Ho;Cho, Sung Yong;Hong, Jun Seon;Baek, In Ho;Kwon, Yong Hyun;Yoon, Hee Kyu;Kim, Sang Youl
    • Korean Journal of Optics and Photonics
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    • v.33 no.5
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    • pp.201-209
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    • 2022
  • The previously developed microspot spectroscopic ellipsometer (SE) is upgraded to a microspot SE compatible with the atomic force microscope (AFM). The focusing optical system of the previous microspot SE is optimized to incorporate an AFM head. In addition, the rotating compensator ellipsometer in polarizer-sample-compensator-analyzer configuration is adopted in order to minimize the negative effects caused by beam wobble. This research leads to the derivation of the expressions needed to get spectro-ellipsometric constants despite the fact that the employed rotating compensator is far from the ideal achromatic quarter-wave plate. The spot size of the developed microspot SE is less than 20 ㎛ while the AFM head is mounted. It operates in the wavelength range of 190-850 nm and has a measurement accuracy of δΔ ≤ 0.05° and δΨ ≤ 0.02°, respectively. Fast measurement of ≤3 s/sp is realized by precisely synchronizing the azimuthal angle of a rotating compensator with the spectrograph. The microspot SE integrated with an AFM is expected to be useful in characterizing the structure and optical properties of finely patterned samples.

Photoelastic evaluation of Maxillary Posterior Crossbite Appliance (Maxillary Posterior Crossbite Appliance의 적용시 응력 분포에 관한 광탄성법적 연구)

  • Jang, Sung-Ho;Yoon, Young-Jooh;Kim, Kwang-Won
    • The korean journal of orthodontics
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    • v.31 no.6 s.89
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    • pp.549-558
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    • 2001
  • This study was undertaken to demonstrate the forces in the maxillary alveolar bone generated by the activation of the maxillary posterior crossbite appliance In the treatment of posterior buccal crossbite caused by buccal ectopic eruption of the maxillary second molar. A photoelastic model was fabricated using a Photoelastic material (PL-3) to simulate alveolar bone and ivory-colored resin teeth. The model was observed throughout the anterior and posterior view in a circular polariscope and recorded photographically before and after activation of the maxillary posterior crossbite appliance. The following conclusions were reached from this investigation : 1. When the traction force was applied on the palatal surface of the second molar, stresses were concentrated at the buccal and palatal root apices and alveolar crest area. The axis of rotation of palatal root was at the root apex and that of the buccal root was at the root li4 area. In this result, palatal tipping and rotating force were generated. 2. When the traction force was applied on the buccal surface of the second molar, more stresses than loading on the palatal surface were observed in the palatal and buccal root apices. Furthermore, the heavier stresses creating an intrusive force and controlled tipping force were recorded below the buccal and palatal root apices below the palatal root surface. In addition, the axis of rotation of palatal root disappeared whereas the rotation axis of the buccal root moved to the root apex from the apical 1/4 area. 3. When the traction force was simultaneously applied on the maxillary right and left second molars, the stress intensity around the maxillary first molar root area was greater than the stress generated by the only buccal traction of the maxillary right or left second molar. As in above mentioned results, we should realize that force application on the palatal surface of second molars with the maxillary posterior crossbite appliance Produced rotation of the second molar and palatal traction, which nay cause occlusal Interference. That is to say, we have to escape the rotation and uncontrolled tipping creating occlusal interference when correcting buccal posterior crossbite. For this purpose, we recommend buccal traction rather than palatal traction force on the second molar.

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Photoelastic evaluation of Mandibula Posterior Crossbite Appliance (Mandibular Posterior Crossbite Appliance의 적용시 응력 분포에 관한 광탄성법적 연구)

  • Jung, Won-Jung;Jang, Sung-Ho;Yoon, Young-Jooh;Kim, Kwang-Won
    • The korean journal of orthodontics
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    • v.31 no.6 s.89
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    • pp.559-566
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    • 2001
  • This study was undertaken to demonstrate the forces in the mandibular alveolar bone generated by activation of the mandibular posterior crossbite appliance in the treatment of buccal crossbite caused by lingual eruption of mandibular second molar. A three-dimensional photoelastic model was fabricated using a photoelastic material (PL-3) to simulate alveolar bone. We observed the model from the anterior to the posterior view in a circular polariscope and recorded photogtaphically before and after activation of the mandibular posterior crossbite appliance. The following results were obtained : 1. When the traction force was applied on the buccal surface of the mandibular second molar, stress was concentrated at the lingual alveolar crest and root apex area. The axis of rotation also was at the middle third of the buccal toot surface and the root apex, so that uncontrolled tipping and a buccal traction force for the mandibular second molar were developed. 2. When the traction force was applied on the lingual surface of the mandibular second molar more stress was observed as opposed to those situations in which the force application was on the buccal surface. In addition, stress intensity was increased below the loot areas and the axis of rotation of the mandibular second molar was lost. In result, controlled tipping and intrusive tooth movements were developed. 3. When the traction forte was applied on either buccal or lingual surface of the second molar, the color patterns of the anchorage unit were similar to the initial color pattern of that before the force application. So we can use the lingual arch for effective anchorage in correcting the posterior buccal crossbite. As in above mentioned results, we must avoid the rotation and uncontrolled tipping, creating occlusal interference of the malpositioned mandibular second molar when correcting posterior buccal crossbite. For this purpose, we recommend the lingual traction force on the second molar as opposed to the buccal traction.

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