• Proceedings of the Korea Information Processing Society Conference
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• 2011.11a
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• pp.277-278
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• 2011

본 논문에서는 공압출 다층 필름 제조공정에서 수지의 품질에 영향을 주는 외관상의 결함을 검사하는 비젼 시스템을 제안한다. 필름 생산 과정에서는 흑점이나 주름 등을 포함한 다양한 결함이 발생할 수 있는데, 명암이 명확히 구별되는 결함도 있지만 그렇지 않은 결함들은 필름의 특성에 의해 검출 및 분류가 어려운 경우가 많다. 제안된 논문에서는 전체 검사시스템의 소개와 함께 결함의 종류 분류와 검출 및 분류 방법을 제안하는데, 특히 애매한 결함의 구분을 위해 지역적 이진패턴(LBP)에 기반한 텍스쳐 분석 방법을 이용한다. 실험을 통해 제안된 시스템 및 방법이 필름 생산과정의 다양한 결함들을 잘 검출하고 분류하는 것을 알 수 있었다.

• Journal of KIISE:Databases
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• v.34 no.2
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• pp.99-108
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• 2007

In this paper, we design and implement the Film Defect Inspection System (FDIS) that detects film defects and determines their types which can be used for producing polarized films of TFT-LCD. The proposed system is designed to detect film defects from polarized film images using image segmentation techniques and to determine defect types through the image analysis of detected defects. To determine defect types, we extract features such as shape and texture of defects, and compare those features with corresponding features of referential images stored in a template database. Experimental results using FDIS show that the proposed system detects all defects of test images effectively (Precision 1.0, Recall 1.0) and efficiently (within 0.64 second in average), and achieves the considerably high correctness in determining defect types (Precision 0.96 and Recall 0.95 in average). In addition, our system shows the high robustness for rotated transformation of images, achieving Precision 0.95 and Recall 0.89 in average.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2010.05a
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• pp.775-778
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• 2010

본 논문에서는 초미세 패턴($24{\mu}m$ 이하의 선폭, $30{\mu}m$ 이하의 피치)을 가진 칩-온-필름(Chip-on-Film, COF)에 발생한 결함을 자동으로 검출할 수 있는 시스템을 제안한다. 개발된 시스템은 COF 패턴으로부터 대표적으로 발생하는 결함들, 즉 개방(open), 단락(hard short), mouse bite(near open) 및 near short(soft short)을 자동으로 신속히 검출할 수 있는 기술이 적용되어 있다. 특히 초미세 패턴의 경우, near open 및 near short과 같은 결함 검출이 불가능한 기존 검출시스템의 문제점을 극복한 기술이 제안되어 있다. 본 논문에서 제안하는 결함 검출 원리는 미세 선의 결함유무에 따른 저항 변화를 자동으로 검출하고, 그 미세한 변화를 좀 더 자세하게 판별하기 위해 고주파 공진기(resonator)를 적용하고 있다. 제안된 시스템은 미세 패턴을 가진 COF 제작 과정에서 발생한 결함을 신속히 검출할 수 있기 때문에 COF 불량 검사에 소요되는 많은 경비를 줄일 수 있으리라 기대한다.

• Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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• 2009.10a
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• pp.931-934
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• 2009

본 논문은 $24{\mu}m$ 이하의 미세 폭 및 $30{\mu}m$ 이하의 피치와 같이 미세 패턴을 가진 칩 온 필름(chip-on-film, COF)에 발생한 결함들을 자동으로 검출할 수 있는 시스템을 제안한다. 개발된 검출시스템은 미세 패턴의 COF에서 발생한 개방 (open), 단락 (hard short), mouse bite 및 near short (soft short)과 같은 다양한 결함들을 자동으로 빠르게 검출할 수 있는 기술이 적용되어 있다. 본 논문에서 제안하는 결함 검사 기술의 기본 원리는 미세 패턴내의 결함으로 인해 발생한 저항의 미세 변화를 고주파 공진기 (resonator)를 이용하여 측정 주파수에서 증폭시키고 증폭된 결함 신호와 결함이 없는 경우의 신호와의 전압차를 읽어서 0이 아니면 결함이 있음을 판단한다. 제안된 시스템은 미세 패턴 COF 검사 과정에서 결함들을 신속히 측정할 수 있으므로 불필요한 COF 복사를 위해 소요되는 경비를 줄일 수 있으리라 기대한다.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.16 no.2
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• pp.313-318
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• 2012

This paper presents an automatic system to detect variety of faults from fine pitch COF(chip-on-film) which is less than $30{\mu}m$. Developed system contains circuits and technique to detect fast various faults such as hard open, hard short, soft open and soft short from fine pattern. Basic principle for fault detection is to monitor fine differential voltage from pattern resistance differences between fault-free and faulty cases. The technique uses also radio frequency resonator arrays for easy detection to amplify fine differential voltage. We anticipate that proposed system is to be an alternative for conventional COF test systems since it can fast and accurately detect variety of faults from fine pattern COF test process.

• Journal of the Korean Institute of Intelligent Systems
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• v.19 no.6
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• pp.743-748
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• 2009

In this paper, we propose an effective method to extract background components in automated vision inspection system for polarized film used in TFT LCD display panels. The test image signals are typically composed of three components such as ununiform background, random noises and target defect signals. It is important to analyze the background signal for accurate extraction of defect components. Two dimensional continuous wavelets with first derivative gaussian is used. This methods can be applied for reliable extraction of defect signal by elimination of the background signal from the original image. The proposed method outperforms over conventional FFT methods.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.17 no.8
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• pp.1899-1907
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• 2013

This paper presents an efficient defect detection and classification system based on reference image for COF (Chip-on-Film) which encounters fatal defects after ultra fine pattern fabrication. These defects include typical ones such as open, mouse bite (near open), hard short and soft short. In order to detect these defects, conventionally it needs visual examination or electric circuits. However, these methods requires huge amount of time and money. In this paper, based on reference image, the proposed system detects fatal defect and efficiently classifies it to one of 4 types. The proposed system includes the preprocessing of the test image, the extraction of ROI, the analysis of local binary pattern and classification. Through simulations with lots of sample images, it is shown that the proposed system is very efficient in reducing huge amount of time and money for detecting the defects of ultra fine pattern COF.

• Journal of the Institute of Electronics Engineers of Korea CI
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• v.45 no.6
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• pp.162-169
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• 2008

Film restoration is to detect the location and extent of defected regions from a given movie film, and if present, to reconstruct the lost information of each regions. It has gained increasing attention by many researchers, to support multimedia service of high quality. Among artifacts, scratch is the most frequent degradation. In this paper, an automatic film line scratch removal system is developed that can detect and restore all kind of scratches. For this we use the spatial information of scratches: The scratch in old films has lower or higher brightness than neighboring pixels in its vicinity and usually appears as a vertically long thin line. Our systems consists of scratch detection and scratch restoration. The scratches of various types are detected by neural network based texture classifier and morphology-based shape filter and then the degraded regions are restored using bilinear interpolation. To assess the validity of the Proposed method, it has been tested with all kinds of scratches, and then experimental results show that the proposed approach is robust to various scratches and efficient to apply a real film removal system.

• Journal of the Institute of Electronics Engineers of Korea SC
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• v.40 no.3
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• pp.163-171
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• 2003

To evaluate the performance of the digital radiography(DR) system developed in our group, the modulation transfer function(MTF) was measured and compared with that of an analog X- ray detector, film/screen system. The DR system has an amorphous selenium(a-Se) layer vacuum-evaporated on a TFT flat panel detector. The speed class 400 film/screen (Fuji) system has been being used in the clinical field as analog X-ray detectors. Both the square wave and slit method were used to evaluate their MTF. The square method was applied to both film/screen and the DR system. The slit method, however, was applied to only DR system. The full-width half maximum resolution of film/screen was 357${\mu}{\textrm}{m}$(1.4 lp/mm at 50% spatial frequency), and the resolution of DR was limited to 200${\mu}{\textrm}{m}$(2.5 lp/mm at 30%). These results indicate the measured resolution limitations approximate to the pixel pitch, 139 ${\mu}{\textrm}{m}$ of TFT. The MTF of DR is higher than that of film/screen by the factor of 1.785. It is proved that our a-Se based DR system has potential usefulness in the clinical field.

• Journal of the Korean Society for Nondestructive Testing
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• v.22 no.4
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• pp.393-401
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• 2002

Pipelines in power plants, nuclear facilities and chemical industries are often affected by corrosion effects. It is important to inspect the internal defects in pipelines in oder to guarantee safe operational condition. We have taken relatively much time, cost and manpower to use conventional NDT methods because these methods are contact measuring methods. In this paper, we used digital shearography, a laser-based optical method which allows full-field measurement of surface displacement derivatives. This method has many advantages in practical use, such as low sensitivity to environmental noise, simple optical configuration and real time measurement. The experiment was performed with pressure vessels which has different internal cracks and detected internal cracks in the pressure vessels at a real time using phase shifting method.