• Title/Summary/Keyword: 측정두께

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Correlation of Refractive Error, Axial Length, Chamber Depth, Lens Thickness and Corneal Thickness of Normal University Students (정상 대학생의 눈 굴절이상, 안축장, 전방깊이, 수정체두께 그리고 각막두께의 연관성)

  • Kim, Chang-Sik;Lee, Hak-Jun
    • Journal of Korean Ophthalmic Optics Society
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    • v.13 no.1
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    • pp.89-94
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    • 2008
  • Purpose: To make a comparative study of correlation between biometry data of size in eyeball and refractive error. Methods: The subjects were 68 normal university students (male 36, female 32) and the average age was 22.85${\pm}$3.12. We measured the students' eyesight by A-scan ultrasound and refractor. The results were examined it's statistical significance by SPSS 12.0 version. Results: The mean of axial length was 24.31${\pm}$1.24 mm, chamber depth was 3.48${\pm}$0.28 mm, lens thickness was 3.56${\pm}$0.26 mm and corneal thickness was 0.55${\pm}$0.03 mm. Male's Axial length and chamber depth were larger than female's. As reflective error decreases the thickness of lens become thicker. The measurement data between right eye and left eye didn't had difference and there was no correlation with result of T-test. There were statistically significant correlation with length and chamber depth, axial length and corneal thickness, chamber depth and corneal thickness, and refractive error and lens thickness (p<0.01). Refractive error and axial length were minus linear regression (r=-0.56). Conclusions: Eye's refractive error was changed by axial length, chamber depth and lens thickness but it wasn't related with sex and whether it is a right eye or a left eye.

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Study of Correlation between Macular Thickness, Retina Nerve Fiber Layer Thickness and Axial Length according to Refractive Errors in Children (아동들의 굴절이상에 따른 안축장과 황반두께, 망막신경섬유층 두께의 상관성연구)

  • Choi, Hyung-Seok;Leem, Hyun-Sung
    • The Korean Journal of Vision Science
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    • v.20 no.4
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    • pp.421-429
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    • 2018
  • Purpose : We identified correlation between macular thickness and RNFL (retina nerve fiber layer) measured by OCT and axial length in Korean children divided as three groups according to refractive errors. Methods : In total, 134 eyes of 67 Korean children who experienced no eye disease and ophthalmology surgery were involved in this study and then divided as three groups such as hyperopic, emmetropic and myopic groups. Macular thickness and RNFL thickness were measured with Cirrus HD-OCT, and axial length was done with IOL Master.Macular thickness and RNFL thickness were measured by Cirrus HD-OCT, and axial length using IOL Master. Correlation between axial length and retinal thickness in three groups according to refractive errors was investigated. Results : The type of refractive error measured by axial length was myopic, emmetropic and hyperopic groups in order, showing significant difference (p<0.05). The center thickness of macular was myopic, emmetropic and hyperopic groups in order, showing significant difference(p<0.05). The thicknesses of superior, nasal and inferior regions in peripheral macula were the thinnest in myopic group (p<0.05). It was shown that positive correlation was found between the center thickness of macula and axial length (r=0.283, p<0.05), while negative correlation was found between the peripheral thickness of RNFL and axial length. The temporal thickness of RNFL represented the thickest in myopic group, showing positive correlation with axial length(r=0.39, p<0.05). The superior, nasal and inferior thickness of RNFL represented negative correlation with axial length, showing statistically significant in the nasal thickness of RNFL(r=-0.23, p<0.05). Conclusion : Through this study, we identified correlation between macular thickness, the thickness of RNFL and axial length using OCT in Korean children, and also found the differences in three refractive error groups.

Transparent Plate Thickness Measurement Approach Using a Chromatic Confocal Sensor Based on a Geometric Phase Lens (기하 위상 렌즈 기반의 색공초점 센서를 이용한 투명 물질 두께 측정 연구)

  • Song, Min Kwan;Park, Hyo Mi;Joo, Ki-Nam
    • Korean Journal of Optics and Photonics
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    • v.33 no.6
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    • pp.317-323
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    • 2022
  • In this investigation, we describe a chromatic confocal sensor based on a geometric phase lens for measuring the thicknesses of transparent plates. In order to design a compact sensor, a geometric phase lens, which has diffractive and polarizing characteristics, is used as a device to generate chromatic aberration, and a fiber optic module is adopted. The systematic error of the sensor is reduced with wavelength peak detection by Gaussian curve fitting and the common error compensation obtained by the repeatedly consecutive experimental results. An approach to calculate the plate thickness is derived and verified with sapphire and BK7 plates. Because of the simple and compact design of the proposed sensor with rapid measurement capability, it is expected to be widely used in thickness measurements of transparent plates as an alternative to traditional approaches.

박막형 열전 소재의 두께 방향 열전도도 측정 장비 개발

  • Kim, Yeong-Seok;Ha, Su-Hyeon;Gang, Sang-U;Song, Jae-Yong;Park, Seon-Hwa;Hyeon, Seung-Min
    • Proceedings of the Korean Vacuum Society Conference
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    • 2016.02a
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    • pp.112-112
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    • 2016
  • 열전 발전은 버려지는 폐열을 재사용 가능한 에너지로 전환할 수 있다는 점에서 차세대 청정 에너지원으로 분류되며, 19세기 초 발견된 이래 꾸준히 연구되어온 연구 분야이다. 특히 1990년대 열전소재로의 나노 기술의 접목에 따라 열전성능(figure of merit, ZT)이 2 배 이상 증가 되면서, 고성능의 열전 소재 개발을 위해 나노구조화 연구가 활발히 진행되고 있다. 하지만, 기존의 열전 특성 측정용 상용 장비의 경우, 벌크형 소재를 대상으로 설계되어 연구실 수준에서 개발되고 있는 마이크로미터 스케일의 두께를 가지는 박막형 열전 소재의 두께 방향 (cross-plane)의 열전 특성을 평가하는데 정밀성이 떨어져서 적합하지 않다. 이러한 표준화된 측정 기술의 부재로 인하여 최근 연구되고 있는 나노소재들의 열전 특성 측정 결과를 정확하게 측정하지 못하고 있다 [1] 본 연구에서는 박막형 열전 소재의 열전성능을 평가하는데 가장 중요한 요소인 열전도도를 측정하기 위해 장비를 설계하고, 장비의 측정 능력에 대해 평가하였다. 특히, 측정 포인트 간 큰 온도 차가 발생하여 비교적 쉽게 측정이 가능한 너비 방향 (in-plane) 이 아닌, 온도 차가 작은 박막의 두께 방향의 열전도도를 측정하였다. 그리고 센서의 측정 능력을 평가하기 위해, 폴리이미드를 대상으로 $-10-70^{\circ}C$ 온도 범위에서 측정한 결과와 벌크형 소재 대상으로 신뢰성이 확보된 보호열판법을 이용해 측정한 결과를 비교하였다.

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Spray characteristics of swirl injector using liquid film thickness measurement (액막두께 측정방법을 이용한 스월 인젝터의 분무특성 연구)

  • Kim Sung-Hyuk;Kim Dong-Jun;Kim Byung-Sun;Yoon Young-Bin
    • Proceedings of the Korean Society of Propulsion Engineers Conference
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    • 2005.11a
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    • pp.251-255
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    • 2005
  • By using liquid film thickness measurement the spray characteristics of swirl injector according to the geometric parameters were investigated in this paper. A specially designed injector having a variable backhole length, swirl chamber length, orifice length was used to measure the liquid film thickness. The spray characteristics of the injector were represented by mass flow rate according to the injection pressure, liquid film thickness in the lower orifice, spray cone angle.

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Thickness Measurement of Adhesive Layer of Multilayer Using Power Cepstrum Technique (전력 켑스트럼 기법을 이용한 다층구조물 접착면의 두께측정)

  • Shin, Jin-Seob;Jun, Kye-Suk
    • The Journal of the Acoustical Society of Korea
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    • v.16 no.2
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    • pp.26-30
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    • 1997
  • In this paper, the thickness measurement method of adhesive layers of multilayers using power cepstrum signal processing technique has been proposed. The peak values for reflected signal from each layer have been separated by power cepstrum technique. Therefore, thickness of adhesive layers have been measured by the intervals of peak signal. In the experiment, the adhesive layers of 0.5mm-0.75mm thickness using epoxy(2-Ton and Plastic Steel Putty(A)) between the aluminum and the brass were formed. The adhesive layer thickness which is calculated with data of reflected signal by ultrasonic pulse-echo method was within error 1.34% of the measured values.

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Measurement of a refractive index and thickness of silicon-dioxide thin film on LCD glass substrate using a variable angle ellipsometry (가변 입사각 타원 해석법을 사용한 유리기판위의 이산화규소박막의 굴절율 및 두께 측정)

  • Pang, H. Y.;Kim, H. J.;Kim, S. Y.;Kim, B. I.
    • Korean Journal of Optics and Photonics
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    • v.8 no.1
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    • pp.31-36
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    • 1997
  • We measured refractive indices and thicknesses of SiO$_2$ thin films that have been plated on LCD glass substrate for the purpose of preventing the out-diffusion of sodium ions. The best experimental condition to determine refractive index and thickness of SiO$_2$ thin film by using ellipsometry is searched for, where ⅰ) the film thickness is increased uniformly by 20 $\AA$ from 0 $\AA$ to the period thickness while the angle of incidence is fixed and ⅱ) the angle of incidence is increased uniformly by 1$^{\circ}$ from 45$^{\circ}$ to 70$^{\circ}$ while the film thickness is fixed. We estimated the errors in determining the refractive index and thickness by comparing the measurement error of $\Delta$ and Ψ with the calculated one. The ellipsometric constants of SiO$_2$ thin film on LCD glass substrate are measured at several angle of incidence around the Brewster angle, which is the best angle if the experimental error of ellipsometer is not sensitive to the incident angle. Also the best fit refractive index and thickness of SiO$_2$ thin film to these ellipsometric constants measured at several angle of incidenc eas well as the best fit ones to the SE data are obtained using regressional analysis.

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Determining the Thickness of a Trilayer Thin-Film Structure by Fourier-Transform Analysis (푸리에 변환을 이용한 3층 구조 박막의 두께 측정)

  • Cho, Hyun-Ju;Won, Jun-Yeon;Jeong, Young-Gyu;Woo, Bong-Ju;Yoon, Jun-Ho;Hwangbo, Chang-Kwon
    • Korean Journal of Optics and Photonics
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    • v.27 no.4
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    • pp.143-150
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    • 2016
  • The thickness of each layer in a multilayered system is determined by a Fourier-transform method using spectroscopic reflectance measurements. To verify this method, we first generate theoretical reflectance spectra for three layers, and these are fast-Fourier-transformed using our own Matlab program. Each peak of the Fourier-transformed delta function denotes the optical thickness of each layer, and these are transformed to physical thicknesses. The relative thickness error of the theoretical model is less than 1.0% while a layer's optical thickness is greater than 730 nm. A PI-(thin $SiO_2$)-PImultilayeredstructure produced by the bar-coating method was analyzed, and the thickness errors compared to SEM measurements. Even though this Fourier-transform method requires knowing the film order and the refractive index of each layer prior to analysis, it is a fast and nondestructive method for the analysis of multilayered structures.

Intelligent algorithm for automatical measuring FPD thickness (FPD용 박막 두께 자동 측정을 위한 지능화 알고리즘)

  • Mun Chan-U;Choi U-Gyeong;Kim Seong-Hyeon;Kim Yong-Min;Jeon Hong-Tae
    • Proceedings of the Korean Institute of Intelligent Systems Conference
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    • 2006.05a
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    • pp.231-234
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    • 2006
  • 과거 디스플레이 장치로서 사용되던 CRT를 대신하여, 상대적으로 두께가 않고 가벼운 영상장치인 평판 디스플레이(Flat Panel Display, FPD)의 사용이 급증하고 있다. 이렇게 평판표시장치(Flat Panel Display) 산업의 폭발적인 성장과 함께 새로운 공정개발을 통해 짧은 시간에 더 많은 양을 생산하고, 불량률을 낮추는가에 생산업체의 사활이 달려있다. 본 논문은 FPD 공정에서 품질을 결정하는 여러 요인 가운데 비중이 큰 박막 두께의 제어를 지능화 알고리즘을 통해 해결하고자 한다. 이는 불필요한 과정을 줄여 공정경비를 절감 및 소요시간을 단축하고, 정밀하게 두께를 측정하는 것을 가능하게 한다. 마지막으로, 제안한 알고리즘을 광 간섭 두께 측정기를 통해 얻은 실제 값을 가지고 시료의 두께를 측정한다.

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A Study on Using Finite Difference-Time Domain Modeling of Electromagnetic Wave Propagation for Thickness Determination and Rebar Detection in Concrete Specimens (유한차분 시간영역법을 이용한 콘크리트의 두께측정과 철근위치 탐사를 위한 전자기파 전파 모델링)

  • 임홍철;조윤범
    • Journal of the Computational Structural Engineering Institute of Korea
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    • v.12 no.4
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    • pp.639-648
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    • 1999
  • 레이더법은 건축구조물에 대한 비파괴 검사의 대표적인 방법의 하나이다. 레이더법을 이용하는데 영향을 주는 요인들을 연구하고, 레이더로 측정된 결과들을 분석하기 위해서는 전자기파의 전파에 대한 수치적인 모델링을 통한 이론적인 접근이 필요하다. 콘크리트 시편에 전파되는 전자기파를 모델링 하기 위해 유한차분 시간영역법을 적용하고자 한다. 유한차분 시간영역법은 전자파 해석과 모델링을 통한 시뮬레이션에 매우 유용한 방법이다. 본 연구에서는 유한차분 시간영역법을 이용하여 두께가 다른 4개의 시편과 두께는 100㎜로 동일하고 피복두께가 다른 3개의 시편을 3차원으로 모델링 하였다. 두께 측정 모델링 결과에서는 계산영역의 셀간격과 입사파의 파장/콘크리트 시편의 두께값이 모델링의 정확성에 미치는 영향을 알 수 있었다. 철근이 있는 시편의 모델링에서는 0.08%∼0.5%의 오차로 철근의 위치를 확인할 수 있었다.

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