• Title/Summary/Keyword: 주사 전자현미경

Search Result 2,150, Processing Time 0.028 seconds

Studies on the Character of Ant(Formicidae) in Korea on the Basis of Scanning Electron Microscope(I) -On the Form-Character of Smithistruma japonica(Ito)- (주사전자현미경을 이용한 한국산 개미의 형질특성에 관한 연구(I) -Smithistruma japonica(Ito)의 형질특성에 관하여-)

  • 김창효;최병문;방종렬
    • Korean journal of applied entomology
    • /
    • v.30 no.4
    • /
    • pp.285-290
    • /
    • 1991

  • Smithistruma japonica(lto) unrecorded species of Dacetini tribe in Korea was found in Is. Kekumdo, Chonnam Province and named Saw teeth scale ant. The form-characteristics difference between Smithistruma japonica(Ito) and Strumigenys lewisi Cameron was discribed with the result of observation by the scanning electron microscope(SEM). Total species of Dacetini tribe in Korean contained two species in two genus.

  • PDF

Nanometer-scale Imaging in Thin Films by Scanning Maxwell-stress Microscopy (주사형 맥스웰 응력 현미경을 이용한 박막의 Nanometer-scale 이미지)

  • 신훈규;유승엽;권영수
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
    • /
    • 1998.11a
    • /
    • pp.133-136
    • /
    • 1998

  • The scanning Maxwell-stress microscopy (SMM) is a dynamic noncontact electric force microscopy that allows simultaneous access to the electrical properties of molecular system such as surface potential, surface charge, dielectric constant and conductivity along with the topography. Here we report our recent results of its application to nanoscopic study of domain structures and electrical functionality in organic thin films prepared by the Langmuir-Blodgett technique.

  • PDF