• Title/Summary/Keyword: 정합검사

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Adaptive Thresholding Method Using Zone Searching Based on Representative Points for Improving the Performance of LCD Defect Detection (LCD 결함 검출 성능 개선을 위한 대표점 기반의 영역 탐색을 이용한 적응적 이진화 기법)

  • Kim, Jin-Uk;Ko, Yun-Ho;Lee, Si-Woong
    • The Journal of the Korea Contents Association
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    • v.16 no.7
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    • pp.689-699
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    • 2016
  • As the demand for LCD increases, the importance of inspection equipment for improving the efficiency of LCD production is continuously emphasized. The pattern inspection apparatus is one that detects minute defects of pattern quickly using optical equipment such as line scan camera. This pattern inspection apparatus makes a decision on whether a pixel is a defect or not using a single threshold value in order to meet constraint of real time inspection. However, a method that uses an adaptive thresholding scheme with different threshold values according to characteristics of each region in a pattern can greatly improve the performance of defect detection. To apply this adaptive thresholding scheme it has to be known that a certain pixel to be inspected belongs to which region. Therefore, this paper proposes a region matching algorithm that recognizes the region of each pixel to be inspected. The proposed algorithm is based on the pattern matching scheme with the consideration of real time constraint of machine vision and implemented through GPGPU in order to be applied to a practical system. Simulation results show that the proposed method not only satisfies the requirement for processing time of practical system but also improves the performance of defect detection.

Development of an Edge-based Point Correlation Algorithm Avoiding Full Point Search in Visual Inspection System (전탐색 회피에 의한 고속 에지기반 점 상관 알고리즘의 개발)

  • Kang, Dong-Joong;Kim, Mun-Jo;Kim, Min-Sung;Lee, Eung-Joo
    • The KIPS Transactions:PartB
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    • v.11B no.3
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    • pp.327-336
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    • 2004
  • For visual inspection system in real industrial environment, it is one of most important tasks to design fast and stable pattern matching algorithm. This paper presents an edge-based point correlation algorithm avoiding full search in visual inspection system. Conventional algorithms based on NGC(normalized gray-level correlation) have to overcome some difficulties for applying to automated inspection system in factory environment. First of all, NGC algorithms need high time complexity and thus high performance hardware to satisfy real-time process. In addition, lighting condition in realistic factory environments if not stable and therefore intensity variation from uncontrolled lights gives many roubles for applying directly NGC as pattern matching algorithm in this paper, we propose an algorithm to solve these problems from using thinned and binarized edge data and skipping full point search with edge-map analysis. A point correlation algorithm with the thinned edges is introduced with image pyramid technique to reduce the time complexity. Matching edges instead of using original gray-level pixel data overcomes NGC problems and pyramid of edges also provides fast and stable processing. All proposed methods are preyed from experiments using real images.

Impact Analysis of Buildings for KOMPSAT-3 Image Co-registration (KOMPSAT-3 위성영상의 상대기하보정에 대한 건물의 영향 분석)

  • Park, Jueon;Kim, Taeheon;Yun, Yerin;Lee, Chabin;Lee, Jinmin;Lee, Changno;Han, Youkyung
    • Journal of the Korean Society of Surveying, Geodesy, Photogrammetry and Cartography
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    • v.40 no.4
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    • pp.293-304
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    • 2022
  • In this study, to analyze the effect of buildings on the image co-registration performance, co-registration results are compared according to the presence or absence of matching points extracted from buildings. To remove the matching points extracted from buildings, a building mask generated by extracting building objects from the digital topographic map was used. In addition, matching points extraction performance and image co-registration accuracy were analyzed according to the magnitude of the convergence angle. Image co-registration results were compared by applying the affine and piecewise linear transformation models, respectively. According to the experimental results, the affine transformation model showed an overall improvement in accuracy after removing the matching points extracted from buildings. On the other hand, the piecewise linear transformation model improved the accuracy at the checkpoints including the surrounding buildings, but the accuracy improvement was not significant at checkpoints in the flat area without the existence of buildings. In addition, when the piecewise linear transformation model was applied, stable accuracy of less than 2 pixels was derived from images with a convergence angle of 20° or less.

A study for bandwidth broadening of piezoelectric ultrasonic transducers (압전 초음파 탐촉자의 대역폭 확장을 위한 연구)

  • Kim Jin Ho;Kim Hee Rak;Choi Myoung Seon
    • Proceedings of the Acoustical Society of Korea Conference
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    • spring
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    • pp.393-396
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    • 2002
  • 비파괴검사, 수중탐지, 의료진단 등에 사용되는 초음파 탐촉자에 요구되는 가장 중요한 특성에는 높은 감도와 좋은 분해능이 있다. 본 연구에서는 압전초음파탐촉자의 구성요소(인덕터, 정합층, 후면재 등)가 감도와 분해능에 미치는 영향을 분석한 후, 광대역탐촉자의 구성 요소를 결정하였다. 또한 광대역탐촉자의 시작품을 제작하고 성능시험을 수행하여 이론예측과 실험결과가 잘 일치함을 보였다.

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A Study on PZT-5A Probe for Nondestructive Inspection (비파괴검사를 위한 PZT-5A 탐촉자에 관한 연구)

  • 황현석
    • Electrical & Electronic Materials
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    • v.10 no.2
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    • pp.119-125
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    • 1997
  • In this study, piezoelectric transducers were designed and manufactured using PZT-5A which had relatively high electromechanical coefficient, nondestructive testing system was developed which was able to inspect automatically using stepping motors, PC-Lab, and PC-Scope. The optimum design conditions for NDT were presented and verified comparing PZT-5A probes with comercial probes. It was proved by simulation and experiments that Epoxy is a good material as matching and backing layers. The envelope was reduced 60% with matching layer and 76% with matching and backing layer. NDT was successfully carried out for aluminum test pieces. Distance error of PZT-5A probe was 2.8%.

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A Study on Pattern Inspection of LCD Using Color Compensation and Pattern Matching (색상보정 및 패턴 정합기법을 이용한 LCD 패턴검사에 관한 연구)

  • Ye, Soo-Young;Yoo, Choong-Woong;Nam, Ki-Gon
    • Journal of the Institute of Convergence Signal Processing
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    • v.7 no.4
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    • pp.161-168
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    • 2006
  • In this paper, we propose a method for the pattern inspection of LCD module using the color compensation and pattern matching. The pattern matching is generally used for the inspection method of LCD module at the industry. LCD module has many defections such as the brightness difference of the back light, the optic feature of liquid crystal, the difference of the light penetrated by driving LCD and the color difference by the lighting. The conventional method without the color compensation can not solve these defections and decreases the efficiency of inspecting LCD module. The method proposed to inspect defective badness through the pattern matching after it compensated color difference of the LCD occurred by the various causes. At first, it revises with setting by standard tone of color with the LCD pattern of the reference image. And It perform the preprocessing and pattern matching algorithm on the compensated image. In experiment, we confirmed that this algorithm is useful to detect some defections of LCD module. The proposed methods was easy to detect the faulty product.

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Design of a New RF Buit-In Self-Test Circuit for Measuring 5GHz Low Noise Amplifier Specifications (5GHz 저잡음 증폭기의 성능검사를 위한 새로운 고주파 Built-In Self-Test 회로 설계)

  • Ryu Jee-Youl;Noh Seok-Ho;Park Se-Hyun
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.8 no.8
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    • pp.1705-1712
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    • 2004
  • This paper presents a new low-cost RF Built-In Self-Test (BIST) circuit for measuring transducer voltage gain, noise figure and input impedance of 5.25GHz low noise amplifier (LNA). The BIST circuit is designed using 0.18${\mu}{\textrm}{m}$ SiGe technology. The test technique utilizes input impedance matching and output transient voltage measurements. The technique is simple and inexpensive. Total chip size has additional area of about 18% for BIST circuit.

New On-Chip RF BIST(Built-In Self Test) Scheme and Circuit Design for Defect Detection of RF Front End (RF Front End의 결함 검출을 위한 새로운 온 칩 RF BIST 구조 및 회로 설계)

  • 류지열;노석호
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.8 no.2
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    • pp.449-455
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    • 2004
  • This paper presents a novel defect detection method for one chip RF front end with fault detection circuits using input matching measurement. We present a BIST circuit using 40.25{\mu}m$ CMOS technology. We monitor the input transient voltage of the RF front end to differentiate faulty and fault-free RF front end. Catastrophic as well as parametric variation fault models are used to simulate the faulty response of the RF front end. This technique has several advantages with respect to the standard approach based on current test stimulus and frequency domain measurement. Because DUT and fault detection circuits are implemented in the same chip, this test technique only requires use of digital voltmeter (RMS meter) and RF voltage source generator for simpleand inexpensive testing.

Landmark Recognition Method based on Geometric Invariant Vectors (기하학적 불변벡터기반 랜드마크 인식방법)

  • Cha Jeong-Hee
    • Journal of the Korea Society of Computer and Information
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    • v.10 no.3 s.35
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    • pp.173-182
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    • 2005
  • In this paper, we propose a landmark recognition method which is irrelevant to the camera viewpoint on the navigation for localization. Features in previous research is variable to camera viewpoint, therefore due to the wealth of information, extraction of visual landmarks for positioning is not an easy task. The proposed method in this paper, has the three following stages; first, extraction of features, second, learning and recognition, third, matching. In the feature extraction stage, we set the interest areas of the image. where we extract the corner points. And then, we extract features more accurate and resistant to noise through statistical analysis of a small eigenvalue. In learning and recognition stage, we form robust feature models by testing whether the feature model consisted of five corner points is an invariant feature irrelevant to viewpoint. In the matching stage, we reduce time complexity and find correspondence accurately by matching method using similarity evaluation function and Graham search method. In the experiments, we compare and analyse the proposed method with existing methods by using various indoor images to demonstrate the superiority of the proposed methods.

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A Study on the Automated Compatibility Standard Test System for eBook DRM (전자책 DRM을 위한 자동화된 표준정합성 검사 시스템에 관한 연구)

  • Kim, Tae-Hyun;Kang, Ho-Gap;Ahn, Chang-Ju;Cho, Seong-Hwan
    • The Journal of the Institute of Internet, Broadcasting and Communication
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    • v.13 no.2
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    • pp.127-136
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    • 2013
  • The study of the compatibility of EPUB DRM, granted by the Korea Copyright Commission, as a CT R & D project (Project Title: The Development of the standard reference software technology for International Standard EPUB-based eBook DRM) developed standards such as profile standards for encryption digital signature and authentication certificates and standards for technical terms of rights information. In 2012, these four standards have been established as the Korean Industrial Standards under the names of 'Encryption specification for EPUB DRM,' 'the Digital signature specification for EPUB DRM,' 'the Certificate specification for EPUB DRM,' and 'Definitions of Right Terms for EPUB DRM' through the ODPF(Open Digital Standardization Forum) and the TTA(Telecommunications Technology Association). The research project also proposed standards of ebook DRM license protocols in order for the four standards to practically apply to ebook DRM compatibility. It is necessary for technology standards to require a compatibility standard test process for testing whether implementations which were developed on the basis of the standard specification, comply with standards. This study suggests an automated compatible standard test method and a test model under the ebook DRM standard technical specification.