Browse > Article

Design of a New RF Buit-In Self-Test Circuit for Measuring 5GHz Low Noise Amplifier Specifications  

Ryu Jee-Youl (애리조나주립대학교 전기공학과)
Noh Seok-Ho (안동대학교 전자공학과)
Park Se-Hyun (안동대학교 전자공학과)
Publication Information
Journal of the Korea Institute of Information and Communication Engineering / v.8, no.8, 2004 , pp. 1705-1712 More about this Journal
Abstract
This paper presents a new low-cost RF Built-In Self-Test (BIST) circuit for measuring transducer voltage gain, noise figure and input impedance of 5.25GHz low noise amplifier (LNA). The BIST circuit is designed using 0.18${\mu}{\textrm}{m}$ SiGe technology. The test technique utilizes input impedance matching and output transient voltage measurements. The technique is simple and inexpensive. Total chip size has additional area of about 18% for BIST circuit.
Keywords
무선 근거리 통신망;저잡음 증폭기;SiGe 공정;전압이득;잡음지수;입력 임피던스;
Citations & Related Records
연도 인용수 순위
  • Reference
1 D. Lupea U. Pursche and H.-J. Jentschel, 'Spectral Signature Analysis-BIST for RF Front-Ends,' Advances in Radio Science, pp. 155-160, 2003
2 B. R. Veillette and G. W. Roberts, 'A Built-in Self-Test Strategy for Wireless Communication Systems,' Proceedings of the 1995 International Test Conference, pp. 930-939, October 1995
3 E. P.Vandamme, M. P. Schreurs, and C. van Dinther, 'Improved Three-Step De-Embedding Method to Accurately Account for the Influence of Pad Parasitics tn Silicon On-Wafer RF Test-Structures,'IEEE Tran. Electronic Devices, Vol. 48, No. 4, pp. 137-142, April 2001
4 K. C. Craig, S. P. Case, R. E. Neese and C. D. DePriest, 'Current and Future Trusting in Automated RF and Microwave Testtng,' IEEE, pp. 183-, 1994
5 J. Dabrowski, 'BiST Model for ICRF-Transceiver Front-End,' 2003 Proceedings of the 18thIEEE International Symposium on DEFECT and FAULT TOLERANCE in VLSI SYSTEMS, pp. 295-302, November 2003
6 J. -Y. Ryu, B. C. Kim, S. -T. Kim, and V. Varadarajan 'Novel Defect Testing of RF Front End Using Input Matching Meaurement,' 9th IEEE International Mixed-Signal Testing Workshop, vol, 9, pp. 31-34, June 2003
7 R. Voorakaranam, S. Cherubal and A. Chatterjee, 'A Signature Test Framework for Rapid Production Testing of RF Circuits,' Proceedings of the 2002 Design, Automation and Test in Europe Conference and Exhibition, pp. 186-191, March 2003
8 D. Lupea, U. Pursche and H. -J. Jentschel, 'RF-BIST: Loopback Spectral Signature Analysis,' IEEE Proceedings of the 2003 Design, Automation and Test in Europe Conference and Exhibition, pp. 478-483, March 2003