• Electrical & Electronic Materials
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• v.9 no.4
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• pp.396-403
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• 1996

In this paper, the (S $r_{0.85}$.C $a_{0.15}$)Ti $O_{3}$ of paraelectric grain boundary layer (GBL) ceramics were fabricated, and the analysis of microstructuye and the thermally stimulated current(TSC) were investigated for understanding effects of GBL's interfacial phenomenon on variations of electrical properties. As a result, the three peaks of .alpha., .alpha. and .betha. were obtained at the temperature of -20 [.deg. C], 20[.deg. C] and 80[.deg. C], respectively. The origins of these peaks are that the .alpha. peak observed at -20[.deg. C] looks like to be ascribed to the ionization excitation from donor level in the grain, and the .alpha.' peak observed at 20[.deg. C] appears to show up by detrap of the trapped carrier of border between the oxidation layer and the grain, and the .betha. peak observed at 80[.deg. C] seems to be resulted from hopping conduction of existing carrier in the trap site of the border between the oxidation and second phase. and second phase.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2001.05c
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• pp.92-95
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• 2001

고분자 복합체 절연재료는 porcelain 이나 glass 같은 세라믹 소재의 재료와 비교하여 옥외사용 시간의 관점에서 더 뛰어난 특정을 발휘한다. 그러나 노화되었을 때, 이들 옥외용 절연재료의 성질은 발수성이나 흡수성등과 같은 절연재료의 표면특성에 의해 변화한다. 이러한 표면특성의 변화는 누설전류에 의한 트래킹 (tracking), 침식 (erosion) 및 섬락현상(flashover) 등의 유전체 파괴에 이르게 한다. 본 연구에서는 고분자 복합체 절연재료로 널리 이용되고 있는 EPDM의 발수특성을 향상시키기 위해 기존에 이용되던 무기물 첨가제인 alumina hydrate(ATH)이외에 발수성이 뛰어난 실리콘 고무를 상용화제를 이용하여 블렌드하고, 각종 유기 첨가제 및 무기물 보강제를 이용하여 EPDM/Silicone 복합체를 제조하였다. EPDM/Silicone 복합체의 인장강도 및 유전강도는 실리콘의 함량이 증가할수록 낮아졌으며, 촉진 노화시험을 실시한 결과 $120^{\circ}C$까지 인장강도 및 신율을 유지하였다. 유전강도의 측정결과 복합체의 접촉각과 표면에너지 측정결과 Silicone 고무의 함량이 증가할수록 접촉각은 증가하고, 표면에너지는 낮아졌다. 경사평판법에의한 내트래킹성 측정결과 실리콘 함량이 증가할수록 내트래킹성은 우수하였으며, 실리콘 함량이 30%인 복합체에서는 트래킹 및 침식이 진행되지 않았다.

• Electrical & Electronic Materials
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• v.8 no.5
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• pp.606-610
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• 1995

In this study, Pb(Z $r_{0.52}$ $Ti_{0.48}$) $O_{3}$ ceramic thin films were fabricated from an alkoxide-based by Sol-Gel method. Pb(Z $r_{0.52}$ $Ti_{0.48}$) $O_{3}$ stock solution was made and spin-coated on the Pt/ $SiO_{2}$/Si substrate at 4000[rpm] for 30[sec.]. Coated specimens were chied at 400[.deg. C] for 10[min]. The coating process was repeated 6 times and then heat-treated at 500-800[.deg. C] and 1 hour. The final thickness of the thin films were about 4800[.angs.]. The ferroelectric perovskite phases precipitated under the sintering of 700[.deg. C] for 1 hour. Pb(Z $r_{0.52}$ $Ti_{0.48}$) $O_{3}$ thin films sintered at 700[.deg. C] for 1 hour showed good dielectric and ferroelectric properties.

• Electrical & Electronic Materials
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• v.1 no.1
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• pp.35-43
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• 1988

In this study, PLZT ceramics were fabricated by the freeze-drying and normal sintering method. The composition rate of the specimen was selected 9/65/35(La/Zr/Ti) which had good optical and dielectric properties, sintering time was varied 1, 10, 30, 50, 55, 60 and 65(hr) at 1250(.deg.C). After sintering, the optical and dielectric properties were investigated with the grain size. As the result of the experiment, the particle size of the powder prepared by freeze-drying method was less than 1(um). The relative dielectric constant was increased linearly with the sintering time and specimen sintered for 65(hr) had the highest value, 5780. Grain was grown with increasing time, in the case of specimen sintered for 60(hr), the grain size was 8.4(um). Transmittance was increased with the grain size. In the case of 8.4(um) grain size, the transmittance was 56(%). Curie temperature was decreased linearly by the surface-layer effect of space-charge. In the case of grain size, 1.8(um), 8.4(um), curie temperatures were appeared at 100(.deg.C) and 80(.deg.C), respectively.

• Electrical & Electronic Materials
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• v.10 no.2
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• pp.97-104
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• 1997

In this paper, in order to investigate the behavior of charged particles on (Sr.Ca)TiO$_{3}$ ceramics with paraelectric properties, the characteristics of electrical conduction and thermally stimulated current was measured respectively. As a result, the conduction mechanism is divided into three regions having different mechanism as the current increased. The region I below 200[V/Cm] shows the ohmic conduction. The region B between 200[V/cm] and 2000[V/cm] can be explained by the Poole-Frenkel emission theory, and the region III above 2000[V/cm] is dominated by the tunneling effect. The three peaks of TSC were obtained at the temperature of -20[.deg. C], 20[.deg. C] and 80[.deg. C], respectively. The origins of these peaks are that the .alpha. peak observed at -20[.deg. C] looks like to be ascribed to the ionization excitation from donor level in the grain, and the .alpha.' peak observed at 20 [.deg. C] appears to show up by hopping conduction of the trapped carrier of border between the oxidation layer and the grain, and the .betha. peak observed at 80[.deg. C] seems to be resulted from hopping conduction of existing carrier in the trap site of the border between the oxidation and second phase.

• Electrical & Electronic Materials
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• v.8 no.5
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• pp.611-618
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• 1995

The (Sr$_{1-x}$ .Ca$_{x}$)TiO$_{3}$+0.6[mol%]Nb$_{2}$O$_{5}$ (0.05.leq.x.leq.0.2) ceramics were fabricated to form semiconducting ceramics by sintering at about 1350[.deg. C] in a reducing atmosphere(N$_{2}$ gas). Metal oxides, CuO, was painted on the both surface of the specimens to diffuse to the grain boundary. They were annealed at 1100 [.deg. C] for 2 hours. The 2nd phase formed by thermal diffusing from the surface lead to a very high apparent dielectric constant. According to increase of the frequency as a functional of temperature, all specimens used in this study showed the dielectric relaxation, and the relaxation frequency was above 106 [Hz], it move to low frequency with increasing resistivity of grain. The specimens showed three kinds of conduction mechanisms in the temperature range 25-125 [.deg. C] as the current increased: the region I below 200 [V/cm] shows the ohmic conduction. The region rt between 200 [V/cm] and 2000 [V/cm] can be explained by the Poole-Frenkel emission theory, and the region III above 2000 [V/cm] is dominated by the tunneling effect.fect.

• Electrical & Electronic Materials
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• v.8 no.5
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• pp.640-647
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• 1995

In this study, the BaTiO$\sub$3/ capacitor add to MnO$\sub$2/ like depressor and shifter were investigated for temperature or voltage compensation by structural and electrical analysis. The relative density of BCTM, generating poly crystall and formation of lattice defect, has a 90[%] over as the CaTiO$\sub$3/ come out to control grain size. The current density of BCTM2 increased non-ohmic in high-electric field but that BCTM3 and BCTM4 had a few changing. The BCTM3 and BCTM4 unformated grain boundary shown temperature compensation properties, so that the dielectric constant was low value. The curie point was near 140[.deg. C] in BCTM1 and BCTM4, but BCTM3 and BCTM4 not shown the curie point. It is found that the charging energy of BCTM4 was changed 6[%] according to rising temperature from room temperature to 417[K]. The formation of BaMnO$\sub$3/ was low dielectric constant to change frequency and temperature.

• Progress in Superconductivity and Cryogenics
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• v.25 no.2
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• pp.10-13
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• 2023

High-T_C superconductivity (HTSC) has been the central issue in the field of condensed matter physics for decades. An essential part of the research on superconductivity is finding new exotic superconductors. It was recently suggested that Ir-substituted La_0.7Sr_0.3MnO₃ (LSMIO) is a new high-T_C superconductor. However, systematic studies to experimentally verify the superconductivity have not been done. Here, we report the growth processes of LSMIO thin films and their electrical transport properties. We observed a clear negative correlation between the intensity of the laser utilized for film deposition and the Curie temperature of the deposited film. We attributed this effect to the suppression of Sr concentration in the LSMIO films as the laser intensity increased. However, our LSMIO films show conventional ferromagnetism instead of HTSC. To realize the HTSC in LSMIO systems, further exploration of diverse compositions of LSMIO compounds is essential.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2009.11a
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• pp.100-100
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• 2009

ZnO 바리스터는 정전기 및 순간적인 surge로부터 전자기기 및 전자회로 등을 보호하기 위해 개발된 전자 세라믹스 소재이다. 최근 전자기기 등의 고속통신 추세에 따라 ZnO 바리스터는 높은 비선형 특성과 함께 보다 낮은 유전율 및 유전손실 특성이 특별히 요구되고 있다. 따라서 본 연구에서는 현재 양산되고 있는 Bi-계와 Pr-계 ZnO 바리스터가 아닌 새로운 조성계를 이용하여 Y 첨가량(0.1~3.0 at%)에 따른 ZnO 바리스터의 전기적 특성과 유전 특성을 살펴보았다. 시편은 일반적인 세라믹 공정에 따라 제조하여 $1200^{\circ}C$에서 3 시간 공기 중에서 소결하였으며, 소결 및 전기적 특성과 유전 특성(밀도, 미세구조, I-V 특성, 유전율, 유전손실, ZnO grain 비저항)은 FE-SEM, Keithley237, Agilent 4294a 및 Agilent 4991a 장비를 사용하여 Y 함량에 따른 ZnO 바리스터의 특성 변화를 고찰하였다. 그 결과, Y이 2.0 at% 첨가한 계의 바리스터 특성이 가장 우수하였다. 보다 구체적으로 살펴보면 다음과 같다. Y 함량이 증가함에 따라 상대밀도는 94~96%로 증가하였으며, 평균입경은 증가하였다. 또한 유전율은 580~215 (at 1 MHz)로 Y 함량이 증가할수록 낮아졌다. 이를 통하여 새로운 바리스터 조성계에서 Y의 첨가 효과에 대하여 논하였다.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2010.06a
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• pp.310-310
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• 2010

ZnO 바리스터는 정전기 (ESD) 및 순간적인 써지(surge)로부터 전자기기 및 전자회로 등을 보호하기 위해 개발된 전자 세라믹스 소재이다. 최근 전자기기 등의 고속통신 추세에 따라 ZnO 바리스터는 높은 비선형 특성과 함께 보다 낮은 유전율 및 유전손실 특성이 특별히 요구되고 있다. 본 연구에서는 현재 양산되고 있는 Bi-계와 Pr-계 ZnO 바리스터가 아닌 새로운 조성계에 $Mn_3O_4$를 0.0~3.0 at% 첨가하여 소결 및 전기적 특성들 살펴보았다. 시편은 일반적인 세라믹 공정에 따라 제조하여 $1200^{\circ}C$에서 1 시간 공기 중에서 소결하였으며, 소결 및 전기적 특성과 유전 특성(밀도, 미세구조, I-V 특성, 유전율, 유전손실, ZnO 비저항)은 FE-SEM, Keithley237, Agilent 4294a 및 Agilent 4991a 장비를 사용하여 첨가제에 따른 ZnO 바리스터의 특성 변화를 관찰하였다. 그 결과 Mn이 0.2 at% 첨가한 계의 바리스터의 상대밀도는 95%, 비선형계수는 14, 유전율은 140 (at 1MHz), 손실값은 0.147 (at 1 MHz)를 나타내었다. 이를 통하여 새로운 바리스터 조성계에서 Mn의 첨가에 따른 효과에 대하여 논하였다.