• 한국전기전자재료학회논문지
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• 제19권9호
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• pp.883-887
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• 2006

In order to attain high-rate deposition of Mn-Zn ferrite thin film for soft magnetic underlayer in perpendicular magnetic recording media, a reactive sputtering using powder-metal targets under the mixture gas of Ar and $O_{2}$ was performed. It was succeeded that Mn-Zn ferrite films with (111) crystal orientation were deposited on Pt(111) underlayer without any annealing process. The film revealed 3.4 kG of 4 ${\pi}Ms$, 70 Oe of coercivity. The deposition rate of the new method was 16 times as high as that of the conventional method using ferrite target.

• 한국재료학회지
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• 제7권7호
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• pp.618-622
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• 1997

상온에서 측정한 Cd$_{x}$Ni$_{1-x}$Fe$_{2}$O$_{4}$의 Mossbauer 스펙트럼은 조성비에 따라 x값이 0.4이하인 시료에서는 준강자성에 의한 여섯개의 공명 흡수선, x값이 0.5인 시료에서는 이완된 형태의 공명흡수선, 그리고 x값이 0.6시료인 상자성에 의한 두개의 공명 흡수선이 나타났다. Cd$_{x}$Ni$_{1-x}$Fe$_{2}$O$_{4}$의 x값이 0.4이하인 시료의 초미세 자기장(H$_{hf}$)과 x값이 0.6 이상인 시료의 사중극자 분열치 (Q.S.)는 Cd농도가 증가함에 따라 감소한다. 시료의자기적 성질에 따른 이성질체 이동치(I.S.)의 차이는 있으나, Ni와 Cd이온의 농도에 따른 뚜렷한 의존성은 나타나지 않았다.다.

• 한국전기전자재료학회논문지
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• 제17권2호
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• pp.223-227
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• 2004

We have studied the interfacial diffusion of Fe/Cr multilayers using synchrotron x-ray techniques, such as x-ray reflectivity, extended x-ray absorption fine structures (EXAFS), and high-resolution x-ray scattering. The results of x-ray reflectivity indicated that the interfacial roughness of Fe/Cr multilayers increased with the Cr-layer thickness. The Fourier transform (FT) of EXAFS data clearly showed that the Fe atoms dominantly diffused into the stable Cr layers at the Fe/Cr interface. The results of high-resolution x-ray scattering supported the interfacial diffusion of Fe atoms. Out study revealed that the dominantly interfacial diffusion of Fe atoms into the Cr layers effects the interfacial roughness of the Fe/Cr multilayers.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 1998년도 춘계학술대회 논문집
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• pp.49-52
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• 1998

Preparation of hexagonal strontium-ferrite by modified spray co-roasting(MSC:H) which is expected to shorkn the length of the process and to elevate the magnetic properties of hard ferrite was studied. We prapared $Fe_2O_3/SrCO_3$ mixture powders by MSCR after stirring ionized $FeCI_2$ in distilled water with solid state $SrCO_3$. And then calcined the mixture powders up to $1150^{\circ}C$ for Sr-ferrite powders It is possible to prepare hexaferrite powders with high saturation magnetization (Ms > 69 emu/g) , coercivity (Hc > 4000 Oe) The nlagnetic values of saturation magnetization iire higher than those achieved by the conventional technique.

• 한국전기전자재료학회논문지
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• 제16권3호
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• pp.238-246
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• 2003

We have performed the simulation of ferromagnetic resonance spectra on the exchange coupled bilayer thin films at perpendicular configuration. Variables considered in spectrum calculation were the interfacial exchange constants per unit area, the layer thickness, and the surface anisotropy constants. In case of antiferromagnetic coupling, variation of exchange constant gave a great effect to the absorption spectra of the low and the high magnetization layer. Variation of thickness in low magnetization layer did nt nearly influenced the resonated field of the high magnetization layer. Also, the increase of negative surface anisotropy increased the resonance field of the low and the high magnetization layer.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2003년도 춘계학술대회 논문집 초전도 자성체 연구회
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• pp.88-91
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• 2003

The magnetic porcelain materials were studied by using the porcelain materials added Sr-ferrite powders before forming and firing process. For the high magnetic property, the Sr-ferrite magnetic powders with the grain size of 1 ${\mu}m$ were agglomerated the powder size of about 1 mm. The magnetic porcelain with 30 wt% of Sr-ferrite powders indicated the magnetic characteristics such as the remanent flux density of 240 G and the intrinsic coercivity of 3910 Oe, at the firing conditions of $1250^{\circ}C$/1hr in air.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2003년도 춘계학술대회 논문집 초전도 자성체 연구회
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• pp.84-87
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• 2003

The interfacial diffusion in Fe/Cr/MgO(001) multilayers has been studied using synchrotron x-ray techniques, such as x-ray reflectivity, extended x-ray absorption fine structures (EXAFS), and anomalous x-ray scattering (AXS). The results of x-ray reflectivity indicated that the interfacial roughness of Fe/Cr multilayers with Cr-$4{\AA}$-thick was larger than that with Cr-$4{\AA}$-thick. The results of EXAFS indicated that the Fe element dominantly diffuse into the stable Cr layers at the Fe/Cr interface. The AXS was certified the existence of the interdiffused Fe element in the Cr layers. Our study revealed that the rough interface of the Fe/Cr multilayers was caused by the interfacia diffusion of Fe element into the Cr layers.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2000년도 추계학술대회 논문집
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• pp.89-92
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• 2000

Liquid Phase Epitaxy 법을 이용하여 La이 첨가된 YIG(Yitrium Ion Garnet)막을 성장시켰다. X선 회절 분석을 이용하여 La의 첨가량을 변화시키며 제조된 막의 격자상수를 조사한 결과, La의 첨가량이 증가함에 따라 성장된 막의 격자상수도 증가하였으며 Y/La이 20인 경우, 막의 격자상수가 기판으로 사용한 GGG의 격자상수와 일치하였다. VSM(Vibration Sample Magnetometer)를 이용하여 구한 막의 포화자화 값은 La의 첨가량과 관계없이 순수한 YIG의 경우와 같은 값인 1750정도로 거의 일정하였다. FMR(Ferro Magnetic Resonance) 측정장치를 이용한 막의 강자성 공명선폭을 측정결과 막의 공명선폭은 La의 첨가량과 관계없이 모든 경우에 순수한 YIG보다 감소하였다. 실험범위내의 La의 첨가에 대해서 기판과의 격자불일치가 순수한 YIG의 경우보다 감소하기 때문이다. La의 첨가량이 많은 조건에서 성장시킨 막은 공명선폭이 크고 두께의 증가에 따라서 선폭이 증가하였으며, Y/La가 20과 30일 때 성장시킨 막에서는 공명선폭의 절대값도 작고 두께에 따른 공명선폭의 변화도 관찰되지 않았다.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2003년도 춘계학술대회 논문집 센서 박막재료 반도체 세라믹
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• pp.61-65
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• 2003

A magnetic field sensor is fabricated with superconducting ceramics system The prepared material shows the superconductivity at about 95K. The sensor at liquid nitrogen temperature shows the increase in electrical resistance by applying magnetic field. Actually, the voltage drop across the sensor is changed from zero to a value more than $100{\mu}V$ by the applied magnetic field. The change in electrical resistance depends on magnetic field. The sensitivity of this sensor is 2.9 ohm/T. The increase in electrical resistance by the magnetic field is ascribed to a modification of the Josephson junctions due to the penetrating magnetic flux into the superconducting material.

• 한국전기전자재료학회논문지
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• 제23권2호
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• pp.153-158
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• 2010

The crystallization of FePt/MgO(001) magnetic thin films of various thicknesses has been studied using synchrotron x-ray scattering, atomic force microscope, and vibrating sample magnetometer. In film with a 499-$\AA$-thick, face-centered tetragonal, ordered FePt phase was dominantly crystallized into perpendicular (001) grains keeping the magnetically easy c-axis normal to the film plane during annealing. In film with a 816-$\AA$-thick, however, longitudinal (110) grains keeping the c-axis parallel to the film plane were grown on top of the perpendicular (001) grains. The behavior of the magnetic properties was consistent with the thickness dependence of the crystallization. We attribute the thickness dependence of the crystallization to the substrate effect, which prefers the growth of the c-axis oriented perpendicular grains near the film/substrate interfacial area.