• Journal of Korea Society of Industrial Information Systems
• /
• v.14 no.5
• /
• pp.131-137
• /
• 2009

Ionizer is used in removal of static-electricity charge from several production processes such as flat panel display, organic EL, etc. In this paper, we introduce remote monitoring systems for ionizer which have been built to communicate with multiple ionizer and to control the power and ionizing state independently. Based on a series of tests, we verified the key functions of this controller such as unit connection, quantity of ion and electric charge, alarm, and successful communication between PC and controller. This system may be directly applicable to monitor systems for ionizer in the manufacturing processes of TFT-LCD, PDP, organic EL, and others.

• Journal of the Korea Academia-Industrial cooperation Society
• /
• v.19 no.1
• /
• pp.603-608
• /
• 2018

Although the voltage-applied discharge method is most widely used in the semiconductor and display industries, periodic management costs are incurred because the method causes defects due to the absorption of ambient fine dust and causes emitter tip contamination due to the discharge. The emitter tip contamination problem is caused by the accumulation of fine particles in ambient air due to the corona discharge of the ionizer. Fuzzy ball generation accelerates the wear of the emitter tip and deteriorates the performance of the ionizer. Although a mechanical cleaning method using a manual brush or an automatic brush is effective for contaminant removal, it requires management of additional mechanical parts by the user. In some cases, contaminants accumulated in the emitter may be transferred to the wafer or product. In order to solve this problem, we developed an ionizer for a clean environment that can remove the pencil-type emitter tip and directly ionize the surrounding gas molecules using the tungsten wire located inside the ion tank. As a result of testing and certification by the Korea Institute of Machinery and Materials, the average concentration was $0.7572particles/ft^3$, the decay time was less than two seconds, and the ion valance was 7.6 V, which is satisfactory.

• Proceedings of the Korean Society of Machine Tool Engineers Conference
• /
• 2004.04a
• /
• pp.258-262
• /
• 2004

This study has been focused on the development of automatic bottle air rinser. It is designed to rinse clean empty bottles prior to filling. The bottles are automatically indexed beneath an air nozzle that has both a clean airjet and vacuum source. The bottle is first given a burst of clean air to loosen any particles from the wall of the bottle. A vacuum sequence follows which removes all particulates into a self contained filter unit. In order to the provide the desired function, analysis is carried out by FEM simulation using FLUENT and CATIA software. The final results of analysis are applied to the design of automatic bottle rinser and the machine is successfully developed.

• Journal of the Korean Society for Precision Engineering
• /
• v.22 no.8 s.173
• /
• pp.71-75
• /
• 2005

This study has been focused on the development of automatic bottle air rinser. It is designed to rinse clean empty bottles prior to filling. The bottles are automatically indexed beneath an air nozzle that has both a clean airjet and vacuum source. The bottle is first given a burst of clean air to loosen any particles from the wall of the bottle. A vacuum sequence follows which removes all particulates into a self contained filter unit. In order to the provide the desired function, analysis is carried out by FEM simulation using FLUENT and CATIA software. The final results of analysis are applied to the design of automatic bottle rinser and the machine is successfully developed.