• 제목/요약/키워드: 용량센서

검색결과 458건 처리시간 0.026초

비접촉식 4-전극형 전기용량 센서를 이용한 in situ 정밀측정 (Precision in situ Measurement using Non-Contacting Capacitive Sensor with 4-Electrodes)

  • 김재열;이래덕;박기형;마상동;양동조
    • 한국정밀공학회지
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    • 제19권3호
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    • pp.33-38
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    • 2002
  • To establish the national standard of capacitance, four main electrodes of the cross capacitor which were evaluated to linearity and roundness less the $\pm 1 \mu m$ respectively have to be adjusted symmetrically in an inner cylinder. Four LM shafts with diameter of 5 mm were installed between main electrodes of the cross capacitor, and the electrodes were adjusted, as the first step, by means of the measured capacitance. In the second step, the symmetrical adjustment up to $\pm 1.2\mu m$ was performed by using a ball sensor, ball-type movable sensor, non-contacting capacitive sensor and upper guard sensor which were developed in this project.

vMOS 기반의 DLC와 MUX를 이용한 용량성 감지회로 (Design of a Capacitive Detection Circuit using MUX and DLC based on a vMOS)

  • 정승민
    • 한국ITS학회 논문지
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    • 제11권4호
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    • pp.63-69
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    • 2012
  • 본 논문에서는 용량성 지문센서의 회색조 이미지를 얻기 위한 새로운 회로를 제안하고 있다. 기존의 회로는 회색조 이미지를 얻기 위해 많은 칩 면적을 차지하는 DAC를 적용하거나 전력소모가 많고 전역 클럭을 적용하는 비휘발성 메모리에 적용되는 승압회로를 픽셀별로 적용하였다. 개선된 전하분할 방식의 용량성 지문센서 감지회로는 뉴런모스(vMOS) 기반의 DLC(down literal circuit) 회로와 단순화된 아날로그 MUX(multiplexor)를 적용하였다. 설계된 감지회로는 0.3V, $0.35{\mu}m$ CMOS공정을 적용하여 동작을 검증하였다. 제안된 회로는 기존의 비교기와 주변회로를 필요로하지 않으므로 단위 픽셀의 레이아웃 면적을 줄이고 이미지의 해상도를 향상 시킬 수 있다.

4채널 원통형 정전용량 변위센서의 자동ㆍ정밀 검보정 (Automatic and precise calibration of 4-channel cylindrical capacitive displacement sensor)

  • 김종혁;김일해;박만진;장동영;한동철;백영종
    • 한국공작기계학회:학술대회논문집
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    • 한국공작기계학회 2004년도 춘계학술대회 논문집
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    • pp.387-393
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    • 2004
  • General purpose of cylindrical capacitive displacement sensor(CCS) is measuring run-out motion and deflection of rotor. If CCS has narrow sensing range, its sensitivity coefficients must be calibrated precisely. And x, y component of CCS output can be coupled. In this research, CCS calibration procedure is automated with automatic calibration program and PC-controlled stage. And, coupled-terms of CCS signals were removed and the errors between measured position and mapped CCS signal were reduced obviously by sensitivity matrix that linearly.

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포신 강선의 마모 깊이 측정을 위한 정전용량 방식의 MEMS 간극센서 (MEMS Capacitive Gap Sensor for Measuring Abrasion Depth of Gun Barrel Rifling)

  • 이석찬;이승섭;이창화
    • 대한기계학회논문집A
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    • 제33권9호
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    • pp.976-981
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    • 2009
  • MEMS capacitive gap sensor is developed for measuring abrasion depth of gun barrel rifling. Measuring abrasion depth of gun barrel rifling is very important because it is related with exactness of firing and life of arms. The method using a gap sensor is not to hurt rifling. And it can measure abrasion depth through minimum shooting, because the developed gap sensor can measure from $1{\mu}m{\sim}12{\mu}m$ using Polydimethylsiloxane(PDMS) material and making a stretchable electrode on PDMS. And it's resolution is 1 ${\mu}m$ using capacitive method and MEMS technology.

5 차원 변위 측정용 원판형 정전용량 센서 (A Disk-type Capacitive Sensor for Five-dimensional Motion Measurements)

  • 안형준;박정호;엄창용
    • 한국소음진동공학회:학술대회논문집
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    • 한국소음진동공학회 2007년도 춘계학술대회논문집
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    • pp.655-662
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    • 2007
  • This paper presents a disk-type capacitive sensor for simultaneous measurement of five-dimensional motions of a target. The sensor can be manufactured with a printed circuit board (PCB) such that the sensor can be integrated with its electronics in a single PCB board, whereby the manufacturing costs is considerably reduced. The sensor is optimally designed through an error analysis of possible mechanical errors. Furthermore, the sensor can correct the horizontal motion measurement errors due to the sensor installation tilting error. A proto-type PCB sensor, electronics and a test rig were built, and the effectiveness of the developed sensor was proved through experiments.

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정전용량센서를 이용한 대구경 비구면 형상의 기상측정에 관한 연구 (A Study on the On-machine Profile Measurement of Large Aspheric Form using Capasitive Sensor)

  • 김건희;원종호
    • 한국기계가공학회지
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    • 제2권3호
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    • pp.56-61
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    • 2003
  • This paper described about on-machine profile measurement of aspheric surfaces using contact probing technique in ultra precision machine. A contact probe has been designed as a sensing device to obtain measuring resolutions in nanometer regime using a circle leaf spring mechanism and a capacitive-type sensor. The contact probe which is installed on the z-axis is In touch with the aspheric objects which is fixed on the spindle of the diamond turning machine(DTM) during the measuring procedure. The x, z-axis motions of the machine are monitored by a set of two orthogonal plane mirror type laser interferometers. As a results, the developed contact probe on-machine measurement system showed 10 nanometers repeatability with a ${\pm}2{\sigma}$ and uncertainty of 200 nmPv.

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정전용량센서를 이용한 레이저 간섭계 오차보정 (Error Correction of Laser Interferometer Using Capacitive Sensor)

  • 김재천;서석현;전재욱;박기헌;유관호
    • 대한전기학회:학술대회논문집
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    • 대한전기학회 2006년도 심포지엄 논문집 정보 및 제어부문
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    • pp.342-344
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    • 2006
  • During last years, large investments have been directed to development and research of nano-technological products like semiconductor, display panel, optic-fiber communication components, life technology, and ultra-precision components. All quantitative measurements at nanometre scale should guarantees accurate results and high quality. Laser interferometer is one of most famous nanometre scale devices to be able to measure metre-scale distance with nanometre scale resolution, but it is easily affected by various error causes like geometrical, instrumental and environmental factor. On the other side, capacitive sensor is robust to above error factors, but it is able to measure relatively shorter distance, under $100{\mu}m$, than laser interferometer. New error correction method for laser interferometry using capacitive sensor will be introduced in this paper.

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집중 소자를 이용한 표면 탄성파 장치 기반의 용량 성 센서 보정 및 이를 이용한 초정밀 간극 측정 (Calibration of SAW Based Capacitive Sensor Using Lumped Component and High Precision Gap Measurement)

  • 김재근;고병한;박영필;박노철
    • 정보저장시스템학회논문집
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    • 제8권1호
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    • pp.16-21
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    • 2012
  • SAW device is widely used as filters, sensors, actuators in various technologies. And capacitive sensor is tremendously used to measure pressure, gap, etc. The application of SAW device as signal conditioner of capacitive sensor reduces noise level and enables high precision measurement. The response increase of SAW based capacitive sensor is produced just before the two capacitive electrode contacts by the existence of parasitic resistance of capacitive electrode. In this paper, we analyze the effects of parasitic resistance and propose the calibrating method using lumped component and execute the high precision gap measurement using calibrated system. And xx nm resolution and yy ${\mu}m$ stroke was attained.

자기베어링의 실시간 정밀제어를 위한 원통형 정전용량 변위센서의 새로운 설계 (New Design of Cylindrical Capacitive Sensor for On-line Precision Control of AMB Spindles)

  • 전수;안형준;한동철
    • 대한기계학회:학술대회논문집
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    • 대한기계학회 2000년도 추계학술대회논문집A
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    • pp.548-553
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    • 2000
  • A new design of cylindrical capacitive sensor(CCS) for the displacement measurement of precision active magnetic bearing(AMB) spindle is presented in this paper. This research is motivated by the problem that existing 4-segment CCS is still sensitive to the $3^{rd}$ harmonic component of the geometric errors of a rotor. The procedure of designing new CCS starts from the modeling and error analysis of CCS. The angular size of CCS is set up as a design parameter, and new 8-segment CCS is introduced to possess an arbitrary angular size. The optimum geometry of CCS to minimize the effect of geometric errors is determined through minimum norm approach. Experimental results with test rotors have confirmed the improvement in geometric error suppression.

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정전용량형 센서를 이용한 기상계측시스템의 개발 (Development of On-machine Measurement System utilizing a Capacitive-type Sensor)

  • 김건희;박순섭;박원규;원종호
    • 한국정밀공학회:학술대회논문집
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    • 한국정밀공학회 2002년도 추계학술대회 논문집
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    • pp.391-395
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    • 2002
  • This paper described about the ultra-precision profile measurement of aspheric surfaces using contact probing technique. A contact probe has been designed as a sensing device to obtain measuring resolutions in nanometer regime utilizing a leaf spring mechanism and a capacitive-type sensor. The contact probe is attached on the z-axis during measurement while aspheric objects are supported on the single point diamond turning machine(SPDTM). The machine xz-axis motions are monitored by a set of two orthogonal plane mirror type laser interferometers. Experimental results show that the contact probing technique developed of On-machine Measurement System in this investigation is capable of providing a repeatability of 20 nanometers with a $\pm$20 uncertainty of 300 nanometers.

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