• Title/Summary/Keyword: 삽입형 커넥터

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A study on the characteristics of wide bandwidth connector for automotive communication (자동차 통신을 위한 광대역 커넥터 특성 연구)

  • Kim, Byeong-Woo
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.13 no.1
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    • pp.33-38
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    • 2012
  • In this paper, helical wave wire have been proposed as the vehicle connector for the wireless access in vehicular environments(5.925GHz) communication. This helical slow wave connector is design by considering the properties of critical parameter like helical mean radius, helical pitch, helical wire radius and distance of helical wire to shield. The design simulation and results can be used to determine the most suitable helical wave wire dimensions for vehicle communication connector. The optimized WAVE connector inserted the helical wave wire has insertion loss less than -0.76dB at 5.925GHz. It provides 31% of insertion loss with good performance. Therefore, the simulated results can be effectively used for optimum design of high frequency connector for vehicle communication.

Flow Safety Assessment by CFD Analysis in One-touch Insertion Type Pipe Joint for Refrigerant (CFD 해석을 이용한 냉매용 원터치 삽입식 파이프 조인트의 안전성 평가)

  • Kim Eun-Yonung;Park Dong-sam;Kim, Hong-Yong
    • Proceedings of the Korean Society of Disaster Information Conference
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    • 2022.10a
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    • pp.303-304
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    • 2022
  • 파이프는 기계, 전자, 전기, 플랜트 등 많은 산업 분야에서 응용기기로 널리 사용되고 있으며, 소방, 화학 등 안전 관련 분야에서도 널리 사용되고 있다. 제품의 다양화에 따라 배관 분야에서도 기술의 중요성이 높아지고 있다. 특히 기존 동관을 스테인리스강으로 변경하는 경우 구조해석이나 유동 해석을 통해 안전성과 유동특성을 평가할 필요가 있다. 자체 개발한 일체형 인서트형 커넥터인 6.35 소켓 모델의 유동 안전성은 CFD 해석을 이용하여 유동유발진동(FIV)평가 과정의 4단계를 통해 진행하였다. 배관계 벽면에 작용하는 압력변동의 진폭은 3,780Pa이하의 수준으로 형성되며, 이는 냉매 배관의 운전압력이나 설계응력과 비교했을 때 매우 작은 수준의 압력으로, 난류에 의한 진동이 배관의 구조안전성에 미치는 영향은 미미한 수준인 것으로 나타났다.

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Structural Stability Analysis of One-Touch Insertion Type Pipe Joint for Refrigerant (냉매용 원터치 삽입식 파이프 조인트의 안전성 구조해석)

  • Kim, Eun-young;Park, Dong-sam
    • Journal of the Society of Disaster Information
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    • v.18 no.3
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    • pp.542-549
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    • 2022
  • Purpose: Pipes are widely used as applied devices in many industrial fields such as machinery, electronics, electricity, and plants, and are also widely used in safety-related fields such as firefighting and chemistry. With the diversification of products, the importance of technology in the piping field is also increasing. In particular, when changing the existing copper pipe to stainless steel, it is necessary to evaluate safety and flow characteristics through structural analysis or flow analysis. Method: This study investigated the structural stability of the 6.35 and 15.88 socket models, which are integrated insert type connectors developed by a company, using FEM. For structural analysis, HyperMesh as pre-processor, HYPER VIEW as post-processor, and LS-DYNA as solver were used. Result: In the case of 6.35 socket, the maximum stresses at hook, holder and hinge were 95.02MPa, 19.59MPa and 44.01MPa, respectively, and in case of 15.88 socket, it was 127.7 MPa, 40.09MPa and 45.23MPa, respectively. Conclusion: Comparing the stress distribution of the two socket models, the stress in the 15.88 socket, which has a relatively large outer diameter, appears to be large overall, but it is significantly lower than the yield stress of each material, indicating that there is no problem in structural safety in both models.

Flow Safety Assessment by CFD Analysis in One-Touch Insertion Type Pipe Joint for Refrigerant (CFD 해석을 이용한 냉매용 원터치 삽입식 파이프 조인트의 유동 안전성 평가)

  • Kim, Eun-young;Park, Dong-sam
    • Journal of the Society of Disaster Information
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    • v.18 no.3
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    • pp.550-559
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    • 2022
  • Purpose: Pipes are widely used as applied devices in many industrial fields such as machinery, electronics, electricity, and plants, and are also widely used in safety-related fields such as firefighting and chemistry. With the diversification of products, the importance of technology in the piping field is also increasing. In particular, when changing the existing copper pipe to stainless steel, it is necessary to evaluate safety and flow characteristics through structural analysis or flow analysis. Method: This study investigated the safety by flow analysis of the 6.35 inch socket model, which are integrated insert type connectors developed by a company, using CFD analysis technique. For CDF analysis, RAN model and LES model are used. Result: As results of the analysis, amplitude of the pressure fluctuation acting on the wall of the piping system is formed at a level of 3,780 Pa or less, which is a very small level of pressure compared with the operating pressure or design stress of the refrigerant piping. Conclusion: These results mean that the effect of vibration caused by turbulence on the structural safety of the pipe is negligible.

Design of a Planar Wideband Microwave Bias-Tee Using Lumped Elements (집중 소자를 이용한 광대역 평판형 마이크로파 바이어스-티의 설계)

  • Jang, Ki-Yeon;Oh, Hyun-Seok;Jeong, Hae-Chang;Yeom, Kyung-Whan
    • The Journal of Korean Institute of Electromagnetic Engineering and Science
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    • v.24 no.4
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    • pp.384-393
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    • 2013
  • In this paper, a design of planar microwave bias-tee using lumped elements was presented. The bias-tee is composed of 2 blocks; DC block and RF choke. For this design of the bias-tee, a wideband capacitor was used for DC block. For a RF choke, a series connection of inductors which have different SRFs is used for a RF choke. In the RF choke, a series connection of resistor and capacitor was added in shunt to eliminate a loss from a series resonance. The designed bias-tee was implemented by using 1608 SMT chip components. The fabricated bias-tee was measured using Anritsu 3680K fixture which enables to remove an effect of a connector. The fabricated bias-tee presented -15 dB of return loss and -1.5 dB insertion loss at 10 MHz~18 GHz.

Design and Fabrication of Ka-Band Microstrip to Waveguide Transitions Using E-Plane Probes (E-평면 프로브를 이용한 Ka 대역 마이크로스트립-도파관 변환기의 설계 및 제작)

  • Shin, Im-Hyu;Kim, Choul-Young;Lee, Man-Hee;Joo, Ji-Han;Lee, Sang-Joo;Kim, Dong-Wook
    • The Journal of Korean Institute of Electromagnetic Engineering and Science
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    • v.23 no.1
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    • pp.76-84
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    • 2012
  • In this paper, two kinds of E-plane microstrip-to-waveguide transitions are optimally designed and fabricated for combining output power from multiple small-power amplifiers in a WR-28 waveguide because conventional K connectors cause unnecessary insertion loss and adaptor loss. The transition design is based on target specifications such as a center frequency of 35 GHz, bandwidth of ${\pm}500MHz$, 0.1 dB insertion loss and 20 dB return loss. Performance variation caused by mechanical tolerance and assembly deviation is fully evaluated by three dimensional electromagnetic simulation. The fabricated back-to-back transitions with 16 mm and 26.57 mm interstage microstrip lines show insertion loss per transition of ~0.1 dB at 35 GHz and average 0.2 dB over full Ka band. Also the back-to-back transition shows return loss greater than 15 dB, which implies that the transition itself has return loss better than 20 dB.

Measurement of the Noise Parameters of On-Wafer Type DUTs Using 8-Port Network (8-포트회로망을 이용한 온-웨이퍼형 DUT의 잡음파라미터 측정)

  • Lee, Dong-Hyun;Ahmed, Abdule-Rahman;Lee, Sung-Woo;Yeom, Kyung-Whan
    • The Journal of Korean Institute of Electromagnetic Engineering and Science
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    • v.25 no.8
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    • pp.808-820
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    • 2014
  • In this paper, we fabricated two on-wafer type DUT(Device-Under-Test)s; a 10-dB attenuator and an amplifier using commercially available MMIC and we proposed the measurement method of the noise parameters for the two fabricated DUTs. Since the 10-dB attenuator DUT is a passive device, its noise parameters can be accurately determined when its S-parameters are measured. In the case of the amplifier DUT, its noise parameters are available in the datasheet. Hence, the measured noise parameters using the proposed method can be assessed by comparing with the known noise parameters. The noise parameter measurement method having been presented by the authors requires the S-parameters of the 8-port network used in the measurement and limited to coaxial type DUTs. When on-wafer probes are included in the 8-port network, the 8-port S-parameters requires the measurements with different kinds of connectors. In this paper, we obtained the 8-port S-parameters using the Smart-Cal function in the network analyzer. The measured noise parameters shows about ${\pm}0.2dB$ fluctuations for $NF_{min}$. Other noise parameters with the frequency change show good agreement with the expected results.