• Title/Summary/Keyword: 미세주사장치

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Preparation of Monodisperse PEGDA Microparticles Using a Dispensing Needle Based Microfluidic Device (주사기 바늘 기반의 미세유체 장치를 이용한 단분산성 PEGDA 입자의 제조)

  • Jin, Si Hyung;Kim, Taewan;Oh, Dongseok;Kang, Kyoung-Ku;Lee, Chang-Soo
    • Korean Chemical Engineering Research
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    • v.57 no.1
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    • pp.58-64
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    • 2019
  • This study presents a novel method for preparing monodisperse polyethylene glycol diacrylate (PEGDA) microparticles in a dispensing needle based microfluidic device. The microfluidic devices are manufactured by manually assembling various off-the-shelf products without using additional equipment. In this microfluidic device, the volumetric flow rates of the dispersed phase of PEGDA solution and the continuous phase of oil are controlled to generate monodisperse PEGDA droplets. The PEGDA droplet contains photo-initiator thus it is crosslinked to microparticle by photopolymerization at the ends of the device. The particle size is easily controlled by adjusting the volume flow rate and the size of the microfluidic device. The monodispersity of the particles is calculated by a coefficient of variation of 2.57%. To demonstrate the biological applications of PEGDA particles, cells are encapsulated and observed for proliferation and viability.

Scene-based non-uniformity correction for thermal imaging system using microscanning effect (미세주사효과를 이용한 배경기반 열영상 불균일 보정 기법)

  • Song, In-Seob;Ra, Sung-Woong
    • Journal of the Institute of Electronics Engineers of Korea SP
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    • v.37 no.3
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    • pp.11-16
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    • 2000
  • In this paper, a real-time implementation of scene-based non-uniformity correction by digital technique is proposed for microscan-mode staring infrared cameras. Most scene-based non-uniformity correction algorithms, without sensor motion, can not be applied to stationary scenes because of image blurring and fading. Using microscanning effect, coupled with a modified version of Scribner's algorithm, the proposed technique can correct the artifacts and non-uniformities in real time Computer simulations and hardware experiments demonstrate substantial Improvement of image qualities in stationary as well as moving scenes.

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Construction of Nano-meter Scale Linear Translation System (직선 이동용 나노 미세 이동장치의 제작)

  • Jung, Goo-Eun;Kahng, Se-Jong
    • Journal of the Korean Vacuum Society
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    • v.15 no.5
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    • pp.512-517
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    • 2006
  • A reliable linear translation system was constructed. The system has six piezo legs, attached to a main body, holding a hexagonal sapphire rod. The sapphire rod moves either forward or backward with the sequential motion of the piezo legs, driven by characteristic electric voltage waves. The translational system was tested in vertical direction. The speed of the sapphire rod was turned out to be constant during several mm travel. The slowest upward speed was measured to be ${\sim}1.7{\times}10^{-6}m/s$, yielding ${\sim}28.3nm/step$, while the slowest upward speed was ${\sim}3.7{\times}10^{-6}m/s$, with ${\sim}61.7nm/step$, due to gravitational force. The velocity increases linearly, as the amplitude of the voltage waves increases. The linear translation system will be used as a coarse approach part for a scanning tunneling microscope.

Fault Analysis of Semiconductor Device (반도체 장치의 결함해석)

  • Park, S.J.;Choi, S.B.;Oh, C.S.
    • Journal of Energy Engineering
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    • v.25 no.1
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    • pp.192-197
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    • 2016
  • We have surveyed on technical method of fault analysis of semiconductor device. Fault analysis of semiconductor should first be found the places of fault spots. For this process they are generally used the testers; EB(emission beam tester), EM(emission microscope), OBIRCH(optical beam induced resistance change method) and LVP(laser voltage probing) etc. Therefore we have described about physical interpretation and technical method in using scanning electron microscope, transmission electron microscope, focused ion beam tester and Nano prober.

1984~1985 미국 100대 발명, 발견

  • Korean Federation of Science and Technology Societies
    • The Science & Technology
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    • v.19 no.2 s.201
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    • pp.79-84
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    • 1986
  • - 환경내의 유전물질 빈도를 모니터 하기 위한 DNA 탐지장치 - RRV1 및 RRV2 로보트 - 기능적 특성을 예견하기 위한 비천연 단백질의 설계와 합성 - 고분해능의 주사 이온 미세탐침 - 에크타켐 DT60 혈액분석기 - 뇌일혈 치료시스템 - 레일건 - 소프트스트립 - 고수준 핵폐기물 저장용 납-철-인산염 유리공정 - 단백질과 DNA의 합성 및 분석 - 물의 광전해용 전극 - 애버트 비루스용 고급휴지 - 3480 자기테이프 서브시스템

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Fine Structural Analysis of the Attachment Devices in the Jumping Spider Plexippus setipes (깡충거미 표면 접착장치의 미세구조 분석)

  • Moon, Myung-Jin;Park, Jong-Gu
    • Applied Microscopy
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    • v.39 no.2
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    • pp.149-156
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    • 2009
  • Fine structure of the dry adhesion system in the tarsal appendages of the jumping spider Plexippus setipes (Araneae: Salticidae) with examined using field emission scanning electron microscope (FESEM). The jumping spiders have the distinctive attachment apparatus for adhesion on smooth dry surface without sticky fluids. They attach to rough substrates using tarsal claws, however attachment on smooth surfaces is achieved by means of a tuft-like hair called a scopula. All eight legs have the scopulae with a pair of claws on the tip of feet, and each scopula is composed of two groups of setae that are capable of dry adhesion on smooth surface. The apex of each seta is flattened pad bearing many specialized adhesive setules on one side. The cuticular sensillae are interspersed at the dorsal surface of the seta. It has been revealed by this research that the contact area of the setule is always a triangular shape, and these cuticular surfaces are connected by the elongated stalks from the underlying setae. Moreover, adhesion between the numerous setules and the setae was prevented by the microscopic hairs, since these were interspersed on the upper side of the setae.

Laser-Induced Wet Etching of Mn-Zn Ferrite (페라이트의 레이저 유도 습식 에칭)

  • Lee, Cheon;Lee, Kyoung-Chul
    • Proceedings of the KIEE Conference
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    • 1996.11a
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    • pp.248-250
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    • 1996
  • VTR 자기헤드의 핵심소재로 사용되는 ferrite는 VTR 의 주기능인 영상의 기록 및 재생역할에 가장 중요한 소재이다. 이러한 종류의 head는 지금까지 mask wet chemical etching과 mechanical Process 에 의해 제작 되어왔다. 그러나 기록용량의 중가로 자기장치의 recording density를 높일것이 요구됨에 따라 자기헤드의 gap width를 줄일 필요가 있게 되었다. 본 연구는 mask와 photoresist를 사용하지 않고 ferrite를 직접 미세가공 하는 laser-induced wet etching을 이용하여 자기헤드의 기록용량을 높이고자 하였다. $Ar^+$ laser ( 파장 514 nm )를 빔 확장기와 렌즈를 사용 하여 직경 $1.8{\mu}m$ 로 집속하고, $100{\sim}500\;mW$의 출력 변화를 주어 실험을 하였다. 인산 수용액 (45, 65, 85 %)을 etchant로 사용하여 $5{\sim}30{\mu}m/sec$의 주사속도로 etching 하여, 미세선폭과 high aspect ratio를 갖는 groove를 얻을 수 있었다.

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High Resolution Electronic Processor Design for Thermal Imager with 320x240 Staring Array Infrared Detector (320x240 적외선 배열검출기를 이용한 고분해능 열상 신호처리기 구현)

  • Hong, Seok-Min;Yu, Wee-Kyung;Yoon, Eun-Suk
    • Journal of the Korea Institute of Military Science and Technology
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    • v.9 no.2 s.25
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    • pp.111-117
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    • 2006
  • This paper describes the design principles and methods of electronic processor for thermal imager with 320$\times$240 staring array infrared detector. For the detector's nonuniformity correction and excellent image quality, we have designed the multi-point correction method using the defocusing technique of the optics. And to enhance the image of low contrast and improve the detection capability, the new technique of histogram processing has been designed. Through these image processing techniques, we have developed the high quality thermal imager and acquired a satisfactory thermal image. The result of MRTD(Minimum Resolvable Temperature Difference) is $0.1^{\circ}C$ at 4cycles/mard.

Properties of TiN Thin Films Synthesized with HiPIMS and DC Sputtering (HiPIMS와 DC 스퍼터링으로 제조한 TiN 박막 특성)

  • Yang, Ji-Hun;Byeon, In-Seop;Kim, Seong-Hwan;Jeong, Jae-In
    • Proceedings of the Korean Institute of Surface Engineering Conference
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    • 2017.05a
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    • pp.93-93
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    • 2017
  • 고전력 펄스 전원공급장치를 이용한 마그네트론 스퍼터링(high-power impulse magnetron sputtering; HiPIMS)과 직류(direct current; DC) 전원공급장치를 이용한 마그네트론 스퍼터링(DC 스퍼터링)을 이용하여 제조한 티타늄 질화물(titanium nitride; TiN) 박막의 특성을 비교하였다. HiPIMS와 DC 스퍼터링 공정 중에 빗각증착을 적용하여 TiN 박막의 미세구조와 기계적 특성의 변화를 확인하였다. TiN 박막을 코팅하기 위한 기판으로 스테인리스 강판(SUS304)과 초경(cemented carbide; WC-10wt.%Co)을 사용하였다. 기판은 알코올과 아세톤으로 초음파 처리를 실시하여 기판 표면의 불순물을 제거하였다. 기판 청정 후 진공용기 내부의 기판홀더에 기판을 장착하고 $2.0{\times}10^{-5}torr$의 기본 압력까지 진공배기를 실시하였다. 진공 용기의 압력이 기본 압력에 도달하면 아르곤(Ar) 가스를 진공용기 내부로 ${\sim}10^{-2}torr$의 압력으로 주입하고 기판홀더에 라디오 주파수(radio frequency; rf) 전원공급장치를 이용하여 - 800 V의 전압을 인가하여 글로우 방전을 발생시켜 30 분간 기판 표면의 산화막을 제거하는 기판청정을 실시하였다. 기판청정이 완료되면 기본 압력까지 진공배기를 실시하고 Ar과 질소($N_2$)의 혼합 가스를 진공용기 내부로 ${\sim}10^{-3}torr$의 압력으로 주입하여 HiPIMS와 DC 스퍼터링으로 TiN 박막 제조를 실시하였다. 빗각의 크기는 $45^{\circ}$$-45^{\circ}$이었다. 제조된 TiN 박막은 주사전자 현미경, 비커스 경도 측정기 그리고 X-선 회절 분석기를 이용하여 특성을 분석하였다. HiPIMS로 제조한 TiN 박막은 기판 전압을 인가하지 않아도 색상이 노란색을 보이지만, DC 스퍼터링으로 제조한 TiN 박막은 기판 전압을 인가하지 않으면 노란색을 보이지 않고 어두운 갈색에 가까운 색을 보였다. TiN 박막의 경도는 HiPIMS로 제조한 TiN 박막이 DC 스퍼터링으로 제조한 TiN 박막보다 높았다. 이러한 TiN 박막의 특성 차이는 DC 스퍼터링과 비교하여 높은 HiPIMS의 이온화율에 의한 결과로 판단된다. 빗각을 적용한 TiN 박막은 미세구조 변화를 보였으며 이러한 미세구조 변화는 TiN 박막의 특성에 영향을 미치는 것을 확인하였다.

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Fine Structural Analysis of the Venom Apparatus in the Spider Araneus ventricosus (산왕거미 (Araneus ventricosus) 독 생성장치의 미세구조 분석)

  • Moon, Myung-Jin;Yu, Min-Hee
    • Applied Microscopy
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    • v.37 no.2
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    • pp.53-63
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    • 2007
  • The culticular substructure of the venom apparatus in the orb-web spider Araneus ventricosus are studied with scanning electron microscopy. The apparatus is composed of chelicera and paired venom glands in the cephalothorax. Each chelicera consists of a basal segment and a movable fang that articulates with each other. The chelicera of this spider is labidognathous form that moves at right angles to the body axis, and has two segments similar to that of a folding jackknife. Each cylindrical fang has a specialized hinge joint which articulate with the cheliceral groove which contains numerous small protrusions. In addition, each side of cheliceral groove is covered with a total of 7 cuticular teeth in two rows which composed of 4 promarginal and 3 retromarginal teeth. It has been also observed that a single venom pore is always located toward the direction of retromarginal teeth, and surface cuticular pits are distributed on the cuticular depressive area of cheliceral groove.