• Journal of the Korean Vacuum Society
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• v.19 no.3
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• pp.224-229
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• 2010

Indium oxide $(In_2O_3)$ thin films have been prepared on glass substrate by using radio-frequency reactive magnetron sputtering with changing the oxygen flow ratio. The substrate temperature was kept at a fixed value of $400^{\circ}C$, and the sputtering gas and reactive gas were supplied with argon and oxygen, respectively. The oxygen partial flow ratio was varied by controlling the amount of oxygen with respect to the total mixed gases, 10%, 20%, 30%, 40%, and 50%. The optical, electrical, and structural properties of the deposited thin films were investigated by using ultraviolet-visible-near infrared spectrophotometer, Hall measurement, and X-ray diffractometer and scanning electron microscopy. The $In_2O_3$ thin film deposited at 20% of oxygen flow ratio showed an average transmittance of 86% in the wavelength range of 430~1,100 nm, an electrical resistivity of $1.1{\times}10^{-1}{\Omega}cm$. The results show that the transparent conducting films with optimum conditions can be achieved by controlling the oxygen flow ratio.

• Journal of the Korean Vacuum Society
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• v.19 no.4
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• pp.287-292
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• 2010

We have investigated the effects of oxygen flow ratios on the structural, morphological, and optical properties of AlN thin films grown by using radio-frequency reactive magnetron sputtering. The AlN thin films were deposited at $300^{\circ}C$ of substrate temperature, and the reactive gas were supplied with both nitrogen and oxygen. The oxygen flow ratio was varied by controlling the amount of oxygen with respect to the total mixed gases, 0%, 10%, 15%, 20%, 25%, and 30%. The structural, morphological, and optical properties of the deposited AlN thin films were examined by using X-ray diffractometer, scanning electron microscopy, and ultraviolet-visible spectrophotometer. The AlN thin film grown at 10% of oxygen flow ratio indicated an average transmittance of 91.3% in the wavelength range of 350~1,100 nm and an optical band gap of 4.30 eV. The experimental results suggest that AlN thin films can be deposited optionally by varying the oxygen flow ratio.

• Journal of the Korean Vacuum Society
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• v.20 no.1
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• pp.30-34
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• 2011

We investigated the structural, electrical and optical characteristics of thin films with ITO deposited by a low temperature RF reactive magnetron sputtering. The deposited thin films were annealed for 2 hours at various temperatures of $50^{\circ}C$, $100^{\circ}C$, $150^{\circ}C$, $200^{\circ}C$ and $250^{\circ}C$ and were analyzed by using X-ray diffractometer, scanning electron microscopy and 4 point probe. The films annealed at temperatures higher than $150^{\circ}C$ were found to be crystallized and their electrical resistance were decreased from $40{\Omega}cm$to $18{\Omega}cm$. The optical transmittance of the film annealed at $150^{\circ}C$ was increased by over 87% in the 450 nm ~ 900 nm wavelength range. Our results indicate that the films with ITO deposited at even a low temperature can show better optical and electrical properties through a proper heat treatment.

• Proceedings of the Korean Vacuum Society Conference
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• 2011.08a
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• pp.243-244
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• 2011

최근에 산화물 반도체를 평판 디스플레이와 태양 전지의 투명 전극으로 응용하기 위해 많은 연구가 진행중에 있다. 특히, $In_2O_3$ 박막은 투명 전도 산화막으로써 3.7 eV의 직접 전이 밴드갭 에너지를 갖고 가시광 영역에서 높은 투과도를 갖는 반도체이어서 다양한 영역에서 응용 가능하다. 본 연구는 낮은 비저항과 높은 투과율을 갖는 최적의 투명 전도막을 성장시키기 위하여 라디오파 반응성 마그네트론 스퍼터링 방법을 사용하여 질소 도핑된 $In_2O_3$ 박막을 유리 기판 상부에 증착하였고, 후열처리로 온도 400, 450, 500, 550$^{\circ}C$에서 급속 열처리를 수행하여, 증착된 박막의 구조, 표면, 광학, 전기적 특성을 조사하였다. 증착된 박막은 XRD를 사용하여 구조적 특성을 조사한 결과, $2{\theta}=30.2^{\circ}$와 43.95$^{\circ}$에서 상대적으로 강한 피크가 관측되었다(Fig. 1). 전자는 (222)면에서 회절된 피크이며, 후자는 (100)면에서 발생한 회절 피크이다. 열처리 온도가 0$^{\circ}C$에서 500$^{\circ}C$로 증가함에 따라 (222) 면의 회절 신호의 세기는 상대적으로 증가하였고, 550$^{\circ}C$에서 급격하게 감소하였다. 박막의 광학적 특성은 자외선-가시광선 분광기를 사용하여 광학 흡수율과 투과율을 측정하였다(Fig. 2). 열처리를 하지 않은 박막의 경우에, 파장 200~1,100 nm 범위에서 측정된 평균투과율은 76%이었다. 광학 흡수 계수와 광자 에너지의 관계를 나타내는 포물선 관계식을 기초로 하여 광학 밴드갭 에너지를 계산하였다. 박막의 전기적 특성의 경우에, Hall 효과를 측정하여 전하 운반자 농도, 홀 이동도, 전기 비저항을 조사한 결과, 전기적 특성은 열처리 온도에 상당한 의존성을 나타냄을 알 수 있었고, 열처리 온도 500$^{\circ}C$에서 박막의 비저항값은 $4.0{\times}10^{-3}{\Omega}cm$이었다.