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http://dx.doi.org/10.5757/JKVS.2010.19.4.287

Structural, Morphological, and Optical Properties of AlN Thin Films Subjected to Oxygen Flow Ratio  

Cho, Shin-Ho (Center for Green Fusion Technology and Department of Electronic Materials Engineering, Silla University)
Kim, Moon-Hwan (Department of Automotive Mechanical Engineering, Silla University)
Publication Information
Journal of the Korean Vacuum Society / v.19, no.4, 2010 , pp. 287-292 More about this Journal
Abstract
We have investigated the effects of oxygen flow ratios on the structural, morphological, and optical properties of AlN thin films grown by using radio-frequency reactive magnetron sputtering. The AlN thin films were deposited at $300^{\circ}C$ of substrate temperature, and the reactive gas were supplied with both nitrogen and oxygen. The oxygen flow ratio was varied by controlling the amount of oxygen with respect to the total mixed gases, 0%, 10%, 15%, 20%, 25%, and 30%. The structural, morphological, and optical properties of the deposited AlN thin films were examined by using X-ray diffractometer, scanning electron microscopy, and ultraviolet-visible spectrophotometer. The AlN thin film grown at 10% of oxygen flow ratio indicated an average transmittance of 91.3% in the wavelength range of 350~1,100 nm and an optical band gap of 4.30 eV. The experimental results suggest that AlN thin films can be deposited optionally by varying the oxygen flow ratio.
Keywords
AlN thin film; RF reactive magnetron sputtering; Oxygen flow ratio;
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