• Korean Journal of Optics and Photonics
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• v.26 no.2
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• pp.115-120
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• 2015

Explicit expressions are derived for the effective reflection coefficients of obliquely incident light on a multilayered substrate coated with two uniaxially anisotropic films. Based on these reflection coefficients, ellipsometric constants are obtained as function of the tilt and azimuthal angles of the optical axes of the uniaxial films. Explicit expressions are provided, which can be used to separate the effects of surface anisotropy for anisotropic film from that of its bulk anisotropy, so that these expressions may be utilized in characterizing the surface anisotropy of alignment layers.

• Korean Journal of Optics and Photonics
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• v.24 no.5
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• pp.271-278
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• 2013

The effective reflection coefficients of an obliquely incident wave on a multi-layered substrate coated with a uniaxially anisotropic alignment layer are derived. The effective reflection coefficients as well as explicit ellipsometric expressions are provided as a function of film constants of multiple layers together with magnitude of anisotropy, direction of optic axis, and thickness of the alignment layer. It is expected that by adapting these expressions to the conventional modelling technique, the ordinary refractive index, the extra-ordinary refractive index, the azimuth angle and the tilt angle of the optic axis, and the thickness of the aligned surface can be determined simultaneously together with the thickness and volume fraction of each layer beneath the alignment layer.