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http://dx.doi.org/10.3807/KJOP.2015.26.2.115

Ellipsometric Expressions for Two Uniaxially Anisotropic Layers Coated on a Multilayered Substrate  

Kim, Sang Youl (Department of Physics, Ajou University)
Publication Information
Korean Journal of Optics and Photonics / v.26, no.2, 2015 , pp. 115-120 More about this Journal
Abstract
Explicit expressions are derived for the effective reflection coefficients of obliquely incident light on a multilayered substrate coated with two uniaxially anisotropic films. Based on these reflection coefficients, ellipsometric constants are obtained as function of the tilt and azimuthal angles of the optical axes of the uniaxial films. Explicit expressions are provided, which can be used to separate the effects of surface anisotropy for anisotropic film from that of its bulk anisotropy, so that these expressions may be utilized in characterizing the surface anisotropy of alignment layers.
Keywords
Reflection ellipsometry; Two uniaxial layers; Surface anisotropy; Uniaxial anisotropy; Tilt angle of optic axis;
Citations & Related Records
Times Cited By KSCI : 1  (Citation Analysis)
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