• Title/Summary/Keyword: 동적 전압 제어

Search Result 92, Processing Time 0.016 seconds

Implementation of a Simulation Tool for Monitoring Runtime Thermal Behavior (실시간 온도 감시를 위한 시뮬레이션 도구의 구현)

  • Choi, Jin-Hang;Lee, Jong-Sung;Kong, Joon-Ho;Chung, Sung-Woo
    • Journal of the Korea Society of Computer and Information
    • /
    • v.14 no.1
    • /
    • pp.145-151
    • /
    • 2009
  • There are excessively hot units of a microprocessor in today's nano-scale process technology, which are called hotspots. Hotspots' heat dissipation is not perfectly conquered by mechanical cooling techniques such as heatsink, heat spreader, and fans; Hence, an architecture-level temperature simulation of microprocessors is evident experiment so that designers can make reliable chips in high temperature environments. However, conventional thermal simulators cannot be used in temperature evaluation of real machine, since they are too slow, or too coarse-grained to estimate overall system models. This paper proposes methodology of monitoring accurate runtime temperature with Hotspot[4], and introduces its implementation. With this tool, it is available to track runtime thermal behavior of a microprocessor at architecture-level. Therefore, Dynamic Thermal Management such as Dynamic Voltage and Frequency Scaling technique can be verified in the real system.

1V 1.6-GS/s 6-bit Flash ADC with Clock Calibration Circuit (클록 보정회로를 가진 1V 1.6-GS/s 6-bit Flash ADC)

  • Kim, Sang-Hun;Hong, Sang-Geun;Lee, Han-Yeol;Park, Won-Ki;Lee, Wang-Yong;Lee, Sung-Chul;Jang, Young-Chan
    • Journal of the Korea Institute of Information and Communication Engineering
    • /
    • v.16 no.9
    • /
    • pp.1847-1855
    • /
    • 2012
  • A 1V 1.6-GS/s 6-bit flash analog-to-digital converter (ADC) with a clock calibration circuit is proposed. A single track/hold circuit with a bootstrapped analog switch is used as an input stage with a supply voltage of 1V for the high speed operation. Two preamplifier-arrays and each comparator composed of two-stage are implemented for the reduction of analog noises and high speed operation. The clock calibration circuit in the proposed flash ADC improves the dynamic performance of the entire flash ADC by optimizing the duty cycle and phase of the clock. It adjusts the reset and evaluation time of the clock for the comparator by controlling the duty cycle of the clock. The proposed 1.6-GS/s 6-bit flash ADC is fabricated in a 1V 90nm 1-poly 9-metal CMOS process. The measured SNDR is 32.8 dB for a 800 MHz analog input signal. The measured DNL and INL are +0.38/-0.37 LSB, +0.64/-0.64 LSB, respectively. The power consumption and chip area are $800{\times}500{\mu}m2$ and 193.02mW.