Optimum Growth Condition of Phase Change GeSbTe Thin Films as an Optical Recording Medium using in situ Ellipsometry (In situ 타원법을 사용한 광기록매체용 GeSbTe 박막의 최적성장조건 연구)
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- Proceedings of the Optical Society of Korea Conference
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- 2003.02a
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- pp.78-79
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- 2003