• Proceedings of the Korean Nuclear Society Conference
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• 1998.10a
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• pp.167-167
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• 1998

• Proceedings of the KIEE Conference
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• 2006.10d
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• pp.101-103
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• 2006

외전형 유도전동기 모터는 내전형에 비해 소형화 및 경량화 시킬 수 있는 장점이 있다. 하지만 회전자와 고정자간의 공극사이에 이심률이 있을 때, 불균형 모멘트로 인한 토크 리플이 내 전형보다 더 크게 일어나는 단점이 있다. 이러한 토크리플은 모터의 정속적인 운전을 방해시킬 뿐만 아니라 불규칙한 출력토크로 인한 작동상의 오류를 초래한다. 본 논문에서는 의전형 모터에서 이심률에 따른 불균형력이 최소화 될 수 있는 슬롯 형태에 대해서 연구하기 위해, 전폐형, 반폐형, 개구형태의 3가지 슬롯 형태에 대한 특성을 비교 하였다. 개구형의 경우 슬롯 누설 리액턴스가 낮아져 토크 형성율이 매우 높아 높은 토크를 발생시킬 것을 예상 하였지만, 토크 리플에 따른 출력 감소로 오히려 출력토크가 감소할 뿐만 아니라 이심률 증가에 따른 불균형력 또한 매우 컸다. 이에 비해 전폐형태의 슬롯은 누설리엑턴스의 영향으로 토크 형성 자체는 10% 정도 저감 되었으나, 이심률 증가에 따른 분균형력이 가장 적어 의전형 모터에 가장 적함한 형태임을 알 수 있었다.

• Journal of the Korean Society for Nondestructive Testing
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• v.13 no.3
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• pp.31-38
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• 1993

The storage ring vacuum system for the Pohang Light Source (PLS) has been designed to maintain the vacuum pressure of $10^{-10}Torr$ which requires UHV welding to have helium leak rate less than $1{\times}10^{-10}Torr{\cdot}{\ell}/sec$. In order to develop new technique (PLS) welding technique), a prototype vacuum chamber has been welded by using Tungsten Inert Gas welding method and all the welded joints have been tested with a non-destructive method, so called helium leak detection, to investigate the vacuum tightness of the weld joints. The test was performed with a detection limit of $1{\times}10^{-10}Torr{\cdot}{\ell}/sec$ for helium and no detectable leaks were found for all the welded joints. Thus the performance of welding technique is proven to meet the criteria of helium leak rate required in the PLS Storage Ring. Both the principle and the procedure for the helium leak detection are also discussed.

• Transactions of the Korean Society of Pressure Vessels and Piping
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• v.8 no.2
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• pp.42-47
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• 2012

The containment local leakage rate testing in nuclear power plants is performed in accordance with ANSI/ANS 56.8-1994 in Korea. Two methods, the make-up flow rate and the pressure decay, are used for local leakage rate testing. Though ANSI/ANS 56.8-1994 does not define clearly the minimum test duration for the make-up flow rate method, it requires obtaining the data after reaching the stable condition. Thus the prerequisite stable condition for data acquisition and the testing time is differently applied to each NPPs. Therefore, this study presents a standardized test procedure for data stabilization and testing time through experiments to improve the test reliability.

• Journal of the Korean Vacuum Society
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• v.11 no.2
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• pp.81-86
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• 2002

With a specific model for the Helicoflex type metal gasket expected to be used in large ports of the KSTAR vacuum vessel, a sealing curve was obtained by measuring the flange tightening properties such as the correlations of the tightening torque(or linear load), displacement to the leak rate. From the experiment results it was found that the leak rate of the Helicoflex seal in the room temperature was bellow $2\times10^{-1}\textrm{mbar\cdot L/s}$ with a tightening torque of 2500kgf . cm using Ml8 bolts.

• Korean Journal of Optics and Photonics
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• v.13 no.6
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• pp.473-478
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• 2002

Circular slab waveguides are conformally mapped into straight waveguides. In the outer cladding region with monotonically increasing index profile, modified Airy functions (MAF) of traveling-wave form are introduced to express the leaky mode. Field distributions and losses calculated by the proposed method are compared with those obtained by the WKB (Wentzel-Kramers-Brillouin) method. Detailed numerical examples are presented and compared with the conventional WKB methods, demonstrating our method not only allows a converging field at turning points but also guarantees fine accuracy.

• Proceedings of the Korean Nuclear Society Conference
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• 2004.05a
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• pp.158-158
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• 2004

• Proceedings of the Korean Nuclear Society Conference
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• 1999.10a
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• pp.201.2-201
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• 1999

• Journal of the Institute of Electronics Engineers of Korea SD
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• v.49 no.8
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• pp.10-15
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• 2012

This letter proposes a low-leakage SRAM using power-gating and voltage-level control. The power-gating scheme significantly reduces leakage power by shutting off the power supply to blank memory cell blocks. The voltage-level control scheme saves leakage power by raising the ground line voltage of SRAM cells and word line decoders in data-stored memory cell blocks. A $4K{\times}8bit$ SRAM chip was fabricated using a 1.2V $0.13{\mu}m$ CMOS process. The leakage powers are $1.23{\sim}9.87{\mu}W$ and $1.23{\sim}3.01{\mu}W$ for 0~100% memory usage in active and sleep modes, respectively. During the sleep mode, the proposed SRAM consumes 12.5~30.5% leakage power compared to the conventional SRAM.

• Korean Journal of Materials Research
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• v.6 no.5
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• pp.489-493
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• 1996

다공질 실리콘층(Porous Silicon LayerLPSL)을 사용하여 저온 열산화 (50$0^{\circ}C$, 1시간)와 급속 열산화공정(rapid thermal oxidationLRTO)(115$0^{\circ}C$, 1분)을 통하여 저온 산화막을 제조하였다. 제조된 산화막의 특성을 IR흡수 스펙트럼, C-V 곡선, 절연파괴전압, 누설전류, 그리고 굴절률을 조사함으로써 알아보았다. 절연파괴전압은 2.7MV/cm, 누설전류는 0-50V 범위에서 100-500pA의 값을 보였다. 산화막의 굴절률은 1.49의 값으로서 열산화막의 굴절률에 근접한 값을 나타냈다. 이 결과로부터 다공질 실리콘층을 저온산화막으로 제조할 때, RTO공정이 산화막의 치밀화(densification)에 크게 기여함을 알 수 있었다.