• Transactions of the Korean Society of Mechanical Engineers A
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• v.36 no.7
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• pp.777-787
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• 2012

The transient analysis for the output voltage of a piezoresistive microaccelerometer takes a relatively high computation time because at least two iterations are required to calculate the piezoresistive-structural coupled response at each time step. In this study, the high computational cost for calculating the transient output voltage is considerably reduced by an approach integrating the mode superposition method and the least square method. In the approach, data on static displacement and output voltage calculated by piezoresistive-structural coupled simulation for three acceleration inputs are used to develop a quadratic regression model, relating the output voltage to the displacement at a certain observation point. The transient output voltage is then approximated by a regression model using the displacement response cheaply calculated by the mode superposition method. A high-impact microaccelerometer subject to several types of acceleration inputs such as 100,000 G shock, sine, step, and square pulses are adopted as a numerical example to represent the efficiency and accuracy of the suggested approach.

• Journal of the Korea Society of Computer and Information
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• v.1 no.1
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• pp.95-104
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• 1996

The Hough transform Is a robust technique Which Is useful in defecting straight lines in an picture. However, the extension of the conventional Hough transform to recover circles and ellipses has been limited by slow speed and excessive memory .This paper presents a method of detecting ellipses from the Image by using Least Square Method. This method Is reduced calculation cost and memory requirement .When detecting ellipse. Instead of obtaining accumulation of Hough transform for determination of ellipse parameters. particular points containing geometric properties of ellipse are selected. Parameters of the ellipse are calculated by Least Square Method using those particular points.

• Proceedings of the Korean Society of Precision Engineering Conference
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• 1996.04a
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• pp.714-718
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• 1996

The interference phenomenonof a dynamic crack propagation in a inclined DEN(double edge notched) specimen has been investigated by using the dynamic photoelasticity. One crack initiated by static loading is propagated dynamically and experiences a mixed mode condition(interference) as the crack approaches to the inclined edge notch. We use the overdeterministic least-square method to extract dynamic $K_{Id}$ K sub IId/and .sigma. $_{ox}$from the recorded dynamic photoelastic pattern surounding a running crack. The evaluated $K_{Id}$ $K_{IId}$and .sigma. $_{ox}$together with the crack propagation velocity estimate the dynamic crack interference phenomenonenonon