• Title/Summary/Keyword: 공정 검사

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Evaluation of Microbes through Microfiltration within the Water Treatment Processes (정밀여과막 및 입상활성탄을 이용한 수처리 공정에 따른 박테리아 거동 평가)

  • Shim, Moon Jung;Lim, Jae Won;Kim, Tae Ue
    • Korean Journal of Clinical Laboratory Science
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    • v.48 no.3
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    • pp.230-236
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    • 2016
  • Economic growth has increased the living standards around the world. Water pollution, in particular, is a public relations issue because it poses a direct threat to everyone's lives. As of recently, the production of taste and odor (T&O) compounds has been a common problem in the water industry. The adsorption process using granular activated carbon (GAC) has been the most widely used process. The objectives of this study were to evaluate the microorganisms before and after the backwashing of GAC and to identify the species of the microorganisms found. Five dominants microorganisms were confirmed after the microfiltration process from backwashing of GAC, and the dominant bacterial species were found to be ${\beta}$-proteobacterium species, Porphyrobacter donghaensis, Polaromonas rhizophaerae, Hydrogenophaga species, and Pseudonocardia species. However, when UV treatment after microfiltration was performed, Hydrogenophaga species and Psedonocardia species were eliminated. Herein, I conclude that the UV treatment post microfiltration process is more efficient than microfiltration process alone. The findings of this study may provide useful information regarding the management of microfiltration process.

Development of the Mechenical System and Vision Algorithm for the External Appearance Test Using Vision Image Processing (비전 이미지 프로세싱을 이용한 외관검사가 가능한 기계시스템 및 비전 알고리즘 개발)

  • Kim, Young-Choon;Kim, Young-Man;Kim, Sung-Gil;Kim, Hong-Bae;Cho, Moon-Taek
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.17 no.2
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    • pp.202-208
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    • 2016
  • In this study, the defect in connection with a C-tray was inspected using a low-cost camera. The four test items were the device overlapping in the tray, the bending of the tray, the loaded quantity of the tray, and the device pocket leaving, an algorithm was developed for defining and detecting the above defect types. Therefore, the developed handling system could extend the application of the stack of the c-tray and provide a quantity verification inspection on the packing processing. The machine operation control program, which can ensure the optimal inspection image to match the scan speed, was developed and the control program that can process the user gui and the vision image utilizing the control was developed. Overall, a mechanical system that is practicable for obtaining an image and processing the vision data was designed.

CTIS: Cross-platform Tester Interface Software for Memory Semiconductor (메모리 반도체 검사 장비 인터페이스를 위한 크로스플랫폼 소프트웨어 기술)

  • Kim, Dong Su;Kang, Dong Hyun;Lee, Eun Seok;Lee, Kyu Sung;Eom, Young Ik
    • KIISE Transactions on Computing Practices
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    • v.21 no.10
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    • pp.645-650
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    • 2015
  • Tester Interface Software (TIS) provides all software functions that are necessary for a testing device to perform the test process on a memory semiconductor package from the time the device is put into the test equipment until the device is discharged from the equipment. TIS should perform the same work over all types of equipment regardless of their tester models. However, TIS has been developed and managed independently of the tester models because there are various equipment and computer models that are used in the test process. Therefore, more maintenance, time and cost are required for development, which adversely affects the quality of the software, and the problem becomes more serious when the new tester model is introduced. In this paper, we propose the Cross-platform Tester Interface Software (CTIS) framework, which can be integrated and operated on heterogeneous equipment and OSs.

A Study on Alignment Correction Algorithm for Detecting Specific Areas of Video Images (영상 이미지의 특정 영역 검출을 위한 정렬 보정 알고리즘 연구)

  • Jin, Go-Whan
    • Journal of the Korea Convergence Society
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    • v.9 no.11
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    • pp.9-14
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    • 2018
  • The vision system is a device for acquiring images and analyzing and discriminating inspection areas. Demand for use in the automation process has increased, and the introduction of a vision-based inspection system has emerged as a very important issue. These vision systems are used for everyday life and used as inspection equipment in production processes. Image processing technology is actively being studied. However, there is little research on the area definition for extracting objects such as character recognition or semiconductor packages. In this paper, define a region of interest and perform edge extraction to prevent the user from judging noise as an edge. We propose a noise-robust alignment correction model that can extract the edge of a region to be inspected using the distribution of edges in a specific region even if noise exists in the image. Through the proposed model, it is expected that the product production efficiency will be improved if it is applied to production field such as character recognition of tire or inspection of semiconductor packages.

Three-stage Sampling Inspection Plans (삼단계(三段階) 샘플링 검사방식(檢査方式))

  • Ryu, Mun-Chan;Bae, Do-Seon
    • Journal of Korean Institute of Industrial Engineers
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    • v.6 no.2
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    • pp.37-47
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    • 1980
  • A system of conditional sampling plans composed of three stages is developed. In the first stage, the decision to accept or reject the lot is based on the information obtained from the current lot. When a decision is not made in the first stage, a second stage is introduced and the information from the immediately preceding lot as well as the information from the current lot is used for the decision. When a decision is not made in the first stage, a second stage is introduced and the information from the immediately preceding lot as well as the information from the current lot is used for the decision. When a decision is not made in the second stage either, the decision is deferred until the information from the immediately following lot is obtained. Existing tables for constructing double sampling plans with $_2$=$2n_1$ can be used to find the parameters of these plans. These sampling plans can bring sizable savings in the amount of inspection when the process is relatively stable. The response delay to the change in process quality and the deferred events may be considered as shortcomings of these plans. However, these are not serious in practical applications, and the reduction in sample size may more than offset these shortcomings.

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A New Design-for-Testability Circuit for Low Noise Amplifiers (저잡음 증폭기를 위한 새로운 구조의 검사용 설계회로)

  • Ryu Jee-Youl;Noh Seok-Ho
    • Journal of the Institute of Electronics Engineers of Korea TC
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    • v.43 no.3 s.345
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    • pp.68-77
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    • 2006
  • This paper presents a new Design-for-Testability (DfT) circuit for 4.5-5.5GHz low noise amplifiers (LNAs). The DfT circuit measures gain, noise figure, input impedance, input return loss, and output signal-to-noise ratio for the LNA without external expensive equipment. The DfT circuit is designed using 0.18m SiGe technology. The circuit utilizes input impedance matching and DC output voltage measurements. The technique is simple and inexpensive.