• Title/Summary/Keyword: 결함 검출

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Defect Detection and Cause Analysis for Copper Filter Dryer Quality Assurance (Copper Filter Dryer 품질보증을 위한 결함 검출 및 원인 분석)

  • SeokMin Oh;JinJe Park;Van-Quan Dao;ByungHo Jang;HeungJae Kim;ChangSoon Kim
    • Journal of Korea Society of Industrial Information Systems
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    • v.29 no.1
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    • pp.107-116
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    • 2024
  • Copper Filter Dryer (CFD) are responsible for removing impurities from the circulation of refrigerant in refrigeration and cooling systems to maintain clean refrigerant, and defects in CFD can lead to product defects such as leakage and reduced lifespan in refrigeration and cooling systems, making quality assurance essential. In the quality inspection stage, human inspection and defect judgment methods are traditionally used, but these methods are subjective and inaccurate. In this paper, YOLOv7 object detection algorithm was used to detect defects occurring during the CFD Shaft pipe and welding process to replace the existing quality inspection, and the detection performance of F1-Score 0.954 and 0.895 was confirmed. In addition, the cause of defects occurring during the welding process was analyzed by analyzing the sensor data corresponding to the Timestamp of the defect image. This paper proposes a method for manufacturing quality assurance and improvement by detecting defects that occur during CFD process and analyzing their causes.

Application of Fourier Optics to Defect Inspection of Display Substrates (푸리에 광학의 디스플레이 기판 결함 검출에의 활용)

  • Jung, Young Jin;Lee, Kwang
    • Korean Journal of Optics and Photonics
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    • v.28 no.1
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    • pp.1-8
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    • 2017
  • A method for inspecting defects in display substrates utilizing Fourier optics is proposed in this paper. A cost-effective inspection system can be realized with the proposed method, because it does not require a high-magnification microscope. Also, the proposed method can avoid tight tolerance for variations in displacement between substrate and camera, which is stems from shallow depth of field of the high-magnification microscope. In addition, possible damage caused by collisions between substrate and the inspection equipment can be avoided. The decision algorithm can be simpler than for a conventional inspection system, because spatial shift of periodic substrate patterns does not affect the intensity distribution of the diffracted light, by the Fourier transform property. The proposed method is explained with numerical studies, and experiments are carried out to check its feasibility for color-filter substrates of a liquid-crystal display.

A Study on Measurement of Internal Defects of Pressure Vessel by Digital Shearography(I) (전자 전단 간섭법을 이용한 압력용기의 내부결함 측정에 관한 연구(I))

  • Kang, Young-June;Park, Nak-Kyu;Ryu, Won-Jae;Kim, Kyung-Suk
    • Journal of the Korean Society for Nondestructive Testing
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    • v.22 no.4
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    • pp.393-401
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    • 2002
  • Pipelines in power plants, nuclear facilities and chemical industries are often affected by corrosion effects. It is important to inspect the internal defects in pipelines in oder to guarantee safe operational condition. We have taken relatively much time, cost and manpower to use conventional NDT methods because these methods are contact measuring methods. In this paper, we used digital shearography, a laser-based optical method which allows full-field measurement of surface displacement derivatives. This method has many advantages in practical use, such as low sensitivity to environmental noise, simple optical configuration and real time measurement. The experiment was performed with pressure vessels which has different internal cracks and detected internal cracks in the pressure vessels at a real time using phase shifting method.

Defect Inspection of FPD Panel Based on B-spline (B-spline 기반의 FPD 패널 결함 검사)

  • Kim, Sang-Ji;Hwang, Yong-Hyeon;Lee, Byoung-Gook;Lee, Joon-Jae
    • Journal of Korea Multimedia Society
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    • v.10 no.10
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    • pp.1271-1283
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    • 2007
  • To detect defect of FPD(flat panel displays) is very difficult due to uneven illumination on FPD panel image. This paper presents a method to detect various types of defects using the approximated image of the uneven illumination by B-spline. To construct a approximated surface, corresponding to uneven illumination background intensity, while reducing random noises and small defect signal, only the lowest smooth subband is used by wavelet decomposition, resulting in reducing the computation time of taking B-spline approximation and enhancing detection accuracy. The approximated image in lowest LL subband is expanded as the same size as original one by wavelet reconstruction, and the difference between original image and reconstructed one becomes a flat image of compensating the uneven illumination background. A simple binary thresholding is then used to separate the defective regions from the subtracted image. Finally, blob analysis as post-processing is carried out to get rid of false defects. For applying in-line system, the wavelet transform by lifting based fast algorithm is implemented to deal with a huge size data such as film and the processing time is highly reduced.

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A Defect Inspection Method in TFT-LCD Panel Using LS-SVM (LS-SVM을 이용한 TFT-LCD 패널 내의 결함 검사 방법)

  • Choi, Ho-Hyung;Lee, Gun-Hee;Kim, Ja-Geun;Joo, Young-Bok;Choi, Byung-Jae;Park, Kil-Houm;Yun, Byoung-Ju
    • Journal of the Korean Institute of Intelligent Systems
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    • v.19 no.6
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    • pp.852-859
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    • 2009
  • Normally, to extract the defect in TFT-LCD inspection system, the image is obtained by using line scan camera or area scan camera which is achieved by CCD or CMOS sensor. Because of the limited dynamic range of CCD or CMOS sensor as well as the effect of the illumination, these images are frequently degraded and the important features are hard to decern by a human viewer. In order to overcome this problem, the feature vectors in the image are obtained by using the average intensity difference between defect and background based on the weber's law and the standard deviation of the background region. The defect detection method uses non-linear SVM (Supports Vector Machine) method using the extracted feature vectors. The experiment results show that the proposed method yields better performance of defect classification methods over conveniently method.

A Study on the S/W Quality Improvement, Considering Fault Detection Rate (결함 검출비를 고려한 소프트웨어의 품질 향상에 관한 연구)

  • Che, Gyu-Shik
    • Proceedings of the Korean Information Science Society Conference
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    • 2005.11b
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    • pp.376-378
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    • 2005
  • 일반적으로, 소프트웨어결함검출/제거메카니즘은 이전의 검출/제거결함과 테스트노력을 어떻게 활용하느냐에 달려있다. 실제 현장 연구로부터 우리는 테스트노력소모패턴을 추론하여 FDR의 경향을 예측할 수 있을 것으로 생각된다. 결함검출이 증가, 감소 및 일정한 것 등 광범위에 걸쳐서 나타나는 경향을 잡아내는 고유의 융통성을 가지는 하나의 시변수집합인 FDR모델에 근거한 테스트노력을 개발하였다. 본 논문에서는 FDR을 기술하고, 관련된 테스트 행위를 이러한 새로운 모델링접근법에 연합시킬 수 있다. 우리의 모델과 그리고 이것과 관련된 파라미터 분해기법을 적용한 것을 여러 가지 소프트웨어 프로젝트에서 도출한 실제 데이터집합을 통하여 시연한다. 모델들이 가중 산술, 가중 기하, 또는 가중 조화평균의 개념을 적용하여 어떻게 유도되는가를 기술한다. 그 외에도, 이러한 3개의 가중치 평균에 근거하여 유사산술의 관점으로부터 좀더 일반적인 NHPP 모델을 제안한다. 상기 3개 평균 외에 변환의 파라미터 계열을 포함한 좀더 일반적인 변환을 공식화한다.

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A Study of Pattern Defect Data Augmentation with Image Generation Model (이미지 생성 모델을 이용한 패턴 결함 데이터 증강에 대한 연구)

  • Byungjoon Kim;Yongduek Seo
    • Journal of the Korea Computer Graphics Society
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    • v.29 no.3
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    • pp.79-84
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    • 2023
  • Image generation models have been applied in various fields to overcome data sparsity, time and cost issues. However, it has limitations in generating images from regular pattern images and detecting defects in such data. In this paper, we verified the feasibility of the image generation model to generate pattern images and applied it to data augmentation for defect detection of OLED panels. The data required to train an OLED defect detection model is difficult to obtain due to the high cost of OLED panels. Therefore, even if the data set is obtained, it is necessary to define and classify various defect types. This paper introduces an OLED panel defect data acquisition system that acquires a hypothetical data set and augments the data with an image generation model. In addition, the difficulty of generating pattern images in the diffusion model is identified and a possibility is proposed, and the limitations of data augmentation and defect detection data augmentation using the image generation model are improved.

A Film Inspection System based on Texture Analysis Techniqe (텍스쳐 분석 방법을 이용한 필름 결함 검사 시스템)

  • Han, Jong-Woo;Son, Heong-Kwan;NO, Jae-Hyun;Choi, Young-Kyu
    • Proceedings of the Korea Information Processing Society Conference
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    • 2011.11a
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    • pp.277-278
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    • 2011
  • 본 논문에서는 공압출 다층 필름 제조공정에서 수지의 품질에 영향을 주는 외관상의 결함을 검사하는 비젼 시스템을 제안한다. 필름 생산 과정에서는 흑점이나 주름 등을 포함한 다양한 결함이 발생할 수 있는데, 명암이 명확히 구별되는 결함도 있지만 그렇지 않은 결함들은 필름의 특성에 의해 검출 및 분류가 어려운 경우가 많다. 제안된 논문에서는 전체 검사시스템의 소개와 함께 결함의 종류 분류와 검출 및 분류 방법을 제안하는데, 특히 애매한 결함의 구분을 위해 지역적 이진패턴(LBP)에 기반한 텍스쳐 분석 방법을 이용한다. 실험을 통해 제안된 시스템 및 방법이 필름 생산과정의 다양한 결함들을 잘 검출하고 분류하는 것을 알 수 있었다.

Determination of PCB film of Un-peeling Defect Using Deep Learning (딥러닝을 이용한 PCB 필름 미박리 양품 판정)

  • Jeong-Gu, Lee;Young-Chul, Bae
    • The Journal of the Korea institute of electronic communication sciences
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    • v.17 no.6
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    • pp.1075-1080
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    • 2022
  • Recently, the effort is continuously applied in machine learning and deep learning algorithm which is represented as artificial intelligence algorithm in the varies field such as prediction, classification and clustering. In this paper, we propose detection algorithm for un-peeling status of PCB protection film by using Dectron2. We use 42 images of data as training and 19 images of data as testing based on 61 images which was taken under the condition of a critical reflection angel of 42.8°. As a result, we get 16 images that was detected and 3 images that was not detected among 19 images of testing data.

Measurement Uncertainty on Subsurface Defects Detection Using Active Infrared Thermographic Technique (능동 적외선열화상 기법을 이용한 이면결함 검출에서의 측정 불확도)

  • Chung, Yoonjae;Kim, Wontae;Choi, Wonjae
    • Journal of the Korean Society for Nondestructive Testing
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    • v.35 no.5
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    • pp.341-348
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    • 2015
  • Active infrared thermography methods have been known to possess good fault detection capabilities for the detection of defects in materials compared to the conventional passive thermal infrared imaging techniques. However, the reliability of the technique has been under scrutiny. This paper proposes the lock-in thermography technique for the detection and estimation of artificial subsurface defect size and depth with uncertainty measurement.