• Title/Summary/Keyword: 결함분류

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Classification of Surface Defects on Cold Rolled Strips by Probabilistic Neural Networks (확률신경회로망에 의한 냉연 강판 표면결함의 분류)

  • Song, S.J.;Kim, H.J.;Choi, S.H.;Lee, J.H.
    • Journal of the Korean Society for Nondestructive Testing
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    • v.17 no.3
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    • pp.162-173
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    • 1997
  • Automatic on-line surface inspection systems have been applied for monitoring a quality of steel strip surfaces. One of the important issues in this application is the performance of on-line defect classifiers. Rule-based classification table methods which are conventionally used for this purpose have been suffered from their low performances. In this work, probabilistic neural networks and the enhanced classification tables which are newly proposed here are applied as alternative on-line classifiers to identify types of surface defects on cold rolled strips. Probabilistic neural networks have shown very excellent performance for classification of surface defects.

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An effective classification method for TFT-LCD film defect images using intensity distribution and shape analysis (명암도 분포 및 형태 분석을 이용한 효과적인 TFT-LCD 필름 결함 영상 분류 기법)

  • Noh, Chung-Ho;Lee, Seok-Lyong;Zo, Moon-Shin
    • Journal of Korea Multimedia Society
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    • v.13 no.8
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    • pp.1115-1127
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    • 2010
  • In order to increase the productivity in manufacturing TFT-LCD(thin film transistor-liquid crystal display), it is essential to classify defects that occur during the production and make an appropriate decision on whether the product with defects is scrapped or not. The decision mainly depends on classifying the defects accurately. In this paper, we present an effective classification method for film defects acquired in the panel production line by analyzing the intensity distribution and shape feature of the defects. We first generate a binary image for each defect by separating defect regions from background (non-defect) regions. Then, we extract various features from the defect regions such as the linearity of the defect, the intensity distribution, and the shape characteristics considering intensity, and construct a referential image database that stores those feature values. Finally, we determine the type of a defect by matching a defect image with a referential image in the database through the matching cost function between the two images. To verify the effectiveness of our method, we conducted a classification experiment using defect images acquired from real TFT-LCD production lines. Experimental results show that our method has achieved highly effective classification enough to be used in the production line.

Fault Classification for Rotating Machinery Using Support Vector Machines with Optimal Features Corresponding to Each Fault Type (결함유형별 최적 특징과 Support Vector Machine 을 이용한 회전기계 결함 분류)

  • Kim, Yang-Seok;Lee, Do-Hwan;Kim, Seong-Kook
    • Transactions of the Korean Society of Mechanical Engineers A
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    • v.34 no.11
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    • pp.1681-1689
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    • 2010
  • Several studies on the use of Support Vector Machines (SVMs) for diagnosing rotating machinery have been successfully carried out, but the fault classification depends on the input features as well as a multi-classification scheme, binary optimizer, kernel function, and the parameter to be used in the kernel function. Most of the published papers on multiclass SVM applications report the use of the same features to classify the faults. In this study, simple statistical features are determined on the basis of time domain vibration signals for various fault conditions, and the optimal features for each fault condition are selected. Then, the optimal features are used in the SVM training and in the classification of each fault condition. Simulation results using experimental data show that the results of the proposed stepwise classification approach with a relatively short training time are comparable to those for a single multi-class SVM.

Early Multiple Fault Identification of Low-Speed Rolling Element Bearings (저속 구름 베어링의 다중 결함 조기 검출)

  • Kang, Hyunjun;Jeong, In-Kyu;Kang, Myeongsu;Kim, Jong-Myon
    • Proceedings of the Korea Information Processing Society Conference
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    • 2014.04a
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    • pp.749-752
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    • 2014
  • 본 논문에서는 저속으로 동작하는 구름 베어링의 다중 결함 조기 검출을 위해 결함 특징 추출, 효과적인 특징 선택, 선택된 특징을 이용한 결함 분류의 세 단계로 구성된 결함 진단 기법을 제안한다. 1단계에서 이산 웨이블릿 변환을 이용하여 미세성분으로부터 통계적 결함 특징을 추출하고, DET(distance evaluation technique)를 이용하여 추출한 결함 특징 가운데 베어링 다중 결함 검출에 효과적인 특징을 선택한다. 마지막으로 선택된 특징을 k-NN(k-Nearest Neighbors) 분류기 입력으로 사용함으로써 결함을 진단한다. 본 논문에서는 제안한 결함 진단 기법의 성능을 분류 정확도 측면에서 평가한 결과 95.14%의 높은 분류 정확도를 보였다.

CNN Analysis for Defect Classification (결함 분류를 위한 CNN 분석)

  • Oh, Joon-taek;Kang, Hyeon-Woo;Kim, Soo-Bin;Jang, Byoung-Lok
    • Proceedings of the Korean Society of Computer Information Conference
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    • 2021.07a
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    • pp.65-66
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    • 2021
  • 본 논문에서는 Smart Factory의 자동 공정에서 결함의 분류를 실시간으로 시도하여 자동 공정 제어를 위한 결함 분류 딥러닝 기법을 제안하고, Pooling 종류에 따른 분류 성능을 비교한다. Smart Factory 구축에 있어서 CNN을 이용한 공정 제어를 통해 제품 생산에 있어서 생산량의 증가와 불량률의 감소를 이루어내는 것이 가능하다. Smart Factory는 자동화 공정이므로 결함의 분류 속도가 중요하지만, 생산량의 증가와 불량률의 감소를 위해서는 정확하게 결함의 종류를 분류하여 Smart Factory의 공정을 제어하는 것이 더욱 중요하다. 본 논문에서는 Pooling을 Max Pooling과 Averrage Pooling을 복합적으로 설정하였을 때 높은 성능을 보였다.

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A Film Inspection System based on Texture Analysis Techniqe (텍스쳐 분석 방법을 이용한 필름 결함 검사 시스템)

  • Han, Jong-Woo;Son, Heong-Kwan;NO, Jae-Hyun;Choi, Young-Kyu
    • Proceedings of the Korea Information Processing Society Conference
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    • 2011.11a
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    • pp.277-278
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    • 2011
  • 본 논문에서는 공압출 다층 필름 제조공정에서 수지의 품질에 영향을 주는 외관상의 결함을 검사하는 비젼 시스템을 제안한다. 필름 생산 과정에서는 흑점이나 주름 등을 포함한 다양한 결함이 발생할 수 있는데, 명암이 명확히 구별되는 결함도 있지만 그렇지 않은 결함들은 필름의 특성에 의해 검출 및 분류가 어려운 경우가 많다. 제안된 논문에서는 전체 검사시스템의 소개와 함께 결함의 종류 분류와 검출 및 분류 방법을 제안하는데, 특히 애매한 결함의 구분을 위해 지역적 이진패턴(LBP)에 기반한 텍스쳐 분석 방법을 이용한다. 실험을 통해 제안된 시스템 및 방법이 필름 생산과정의 다양한 결함들을 잘 검출하고 분류하는 것을 알 수 있었다.

Aberration Extraction Algorithm for LCD Defect Detection (대면적 LCD 결함검출을 위한 수차량 추출 알고리즘)

  • Ko, Jung-Hwan;Lee, Jung-Suk;Won, Young-Jin
    • 전자공학회논문지 IE
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    • v.48 no.4
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    • pp.1-6
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    • 2011
  • In this paper we show the LCD simulator for defect inspection using image processing algorithm and neural network. The defect inspection algorithm of the LCD consists of preprocessing, feature extraction and defect classification. Preprocess removes noise from LCD image, using morphology operator and neural network is used for the defect classification. Sample images with scratch, pinhole, and spot from real LCD color filter image are used. From some experiments results, the proposed algorithms show that defect detected and classified in the ratio of 92.3% and 94.5 respectively. Accordingly, in this paper, a possibility of practical implementation of the LCD defect inspection system is finally suggested.

LCD Defect Detection using Neural-network based on BEP (BEP기반의 신경회로망을 이용한 LCD 패널 결함 검출)

  • Ko, Jung-Hwan
    • 전자공학회논문지 IE
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    • v.48 no.2
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    • pp.26-31
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    • 2011
  • In this paper we show the LCD simulator for defect inspection using image processing algorithm and neural network. The defect inspection algorithm of the LCD consists of preprocessing, feature extraction and defect classification. Preprocess removes noise from LCD image, using morphology operator and neural network is used for the defect classification. Sample images with scratch, pinhole, and spot from real LCD color filter image are used. From some experiments results, the proposed algorithms show that defect detected and classified in the ratio of 92.3% and 94.5 respectively. Accordingly, in this paper, a possibility of practical implementation of the LCD defect inspection system is finally suggested.

Development of an Effective Defect Classification System for Inspection of QFN Semiconductor Packages (QFN 반도체 패키지의 외형 결함 검사를 위한 효과적인 결함 분류 시스템 개발)

  • Kim, Hyo-Jun;Lee, Jung-Seob;Joo, Hyo-Nam;Kim, Joon-Seek
    • Journal of the Institute of Convergence Signal Processing
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    • v.10 no.2
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    • pp.120-126
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    • 2009
  • There are many different types of surface defects on semiconductor Integrated Chips (IC's) caused by various factors during manufacturing process, such as cracks, foreign materials, chip-outs, chips, and voids. These defects must be detected and classified by an inspection system for productivity improvement and effective process control. Among defects, in particular, foreign materials and chips are the most difficult ones to classify accurately. A vision system composed of a carefully designed optical system and a processing algorithm is proposed to detect and classify the defects on QFN(Quad Flat No-leads) packages. The processing algorithm uses features derived from the defect's position and brightness value in the Maximum Likelihood classifier and the optical system is designed to effectively extract the features used in the classifier. In experiments we confirm that this method gives more effective result in classifying foreign materials and chips.

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A Study on Pattern Classification of HDD Defect Distribution (HDD 결함분포의 패턴 분류에 관한 연구)

  • 강경훈;문운철
    • Proceedings of the Korean Information Science Society Conference
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    • 1999.10b
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    • pp.545-547
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    • 1999
  • 본 논문에서는 불량 하드디스크 드라이브의 수리판정 자동화를 위해 필요한 하드디스크 드라이브(Hard Disk Drive, HDD) 결함이 분포패턴의 분류에 관한 연구 결과를 소개한다. HDD 제조공정에서는 테스트 진행중 검출된 결함에 관한 정보를 HDD 내부에 기록한다. 불량으로 판별된 HDD는 내부에 기록된 결함의 분포를 관찰한 후, 불량의 종류 및 그에 따르는 처리방안을 결정한다. 본 논문에서는 효율적인 결함분포 패턴의 특징추출을 위해, 하드디스크의 물리적 특성에 대한 분석을 바탕으로 극좌표(Polar Coordinates) 방식으로 표현된 결함 위치데이터를 직교좌표(Cartesian Coordinates)로 변환한다. 그리고 디스크 상의 두 동심원 사이의 공간을 정해진 회전각별로 등분한 후, 나누어진 구간별로 결함 발생빈도 히스토그램(Histogram) 분석을 수행하여 결함분포의 패턴을 분류하는 알고리즘을 제시한다. 설계된 알고리즘은 실제 HDD 제조공정에서 발생한 불량 HDD Set을 대상으로 적용한 결과, 그 효용성이 검증되었다.

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