Measurement of a refractive index and thickness of silicon-dioxide thin film on LCD glass substrate using a variable angle ellipsometry (가변입사각 타원해석법을 사용한 유리기판위의 이산화규소박막의 굴절율 및 두께 측정)
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- Proceedings of the Optical Society of Korea Conference
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- 1996.09a
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- pp.3-3
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- 1996