• Title/Summary/Keyword: $TiO_2-Si$ interface

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Effects of Catalysts on Properties of Sol-Gel Derived $PbTiO_3$ Thin Film ($PbTiO_3$ 졸-겔 박막의 특성에 미치는 촉매의 영향)

  • 김승현;김창은;정형진;오영제
    • Journal of the Korean Ceramic Society
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    • v.33 no.7
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    • pp.793-801
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    • 1996
  • The effect of catalysts which was catalyzed by acid($HNO_3$) and base ($NH_4OH$) or not on the surface microst-ructures and consequent dielectric characteristics of the $PbTiO_3$ thin films prepared by sol-gel method were investigated. The result indicated that bse catalyst promoted the phase transformation of perovskite phase while acid catalyst was found to produce most uniform surface microstructure and improved dielectric properties However degradation of properties due to secondary phase formation and non-uniform microstructure at high annealing temperature (>75$0^{\circ}C$) by rapid diffusion of lead was unavoidable in any case as long as $Si_{(100)}$ \ $SiO_2$ \Pt substrate used.

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Epitaxial Cobalt Silicide Formation using Co/Ti/(100) Si Structure (Co/Ti(100)Si 이중층을 이용한 에피텍셜 Co 실리사이드의 형성)

  • Kwon, Young-Jae;Lee, Chong-Mu;Bae, Dae-Lok;Kang, Ho-Kyu
    • Korean Journal of Materials Research
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    • v.8 no.6
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    • pp.484-492
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    • 1998
  • The formation mechanism of the epitaxial cobalt silicide from Co/Ti/OOO) Si structure has been investigated. The transition temperature of CoSi to CoSi, was found to increase with increasing the Ti interlayer thickness, which may be owing to the occupation of the tetrahedral sites by Ti atoms in the CoSi crystal structure as well as the blocking effect of the Ti interlayer on the diffusion of Co. Also, the Co- Ti-O ternary compound formed at the metal! Si interface at the begining of silicidation, which seems to play an important role in epitaxial growth of Co silicide. The final layer structures obtained after a rapid thermal annealing of the Cot Ti/( 100) Si bi-layer structure turned out to be Ti oxide/Co- Ti-Si/epi-$CoSi_2$/OOO)

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Deposition $Ba_{1-x}Sr_xTiO_3$Thin Films and Electrical Properties with Various Materials Top Electrodes (강유전체$Ba_{1-x}Sr_xTiO_3$ 박막의 제조 및 상부전극재료에 따른 전기적 특성)

  • Park, Choon-Bae;Kim, Deok-Kyu;Jeon, Jang-Bae
    • The Transactions of the Korean Institute of Electrical Engineers C
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    • v.48 no.6
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    • pp.410-415
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    • 1999
  • $Ba_{1-x}Sr_xTiO_3$ thin films with various ratio of Sr (X = 0.4, 0.5, 0.6) were grown $Pt/TiN/SiO_2/Si$ subastrate by RF magnetron sputtering deposition. As, Ag, and Cu films were deposited on $Ba_{1-x}Sr_xTiO_3$ thin films as top electrodes by using a thermal evaporator. The electrical properties of $Ba_{1-x}Sr_xTiO_3$ thin films for various compositions were characterized and the physical properties at interface between $Ba_{1-x}Sr_xTiO_3$ thin films and top electrodes were evaluated in terms of the work function difference. At x =0.5, the degradation of capacitance is lower to the other compositions. As negative biasapplied, the specimen with Cu top electrode has board saturation region and low leakage current since work function of Cu is bigger than other electrodes.$ Ba_{0.5}Sr_{0.5}TiO_3$ thin films with Cu top electrode, the dielectric constant was measured to the value of 354 at 1 kHz and the leakage current was obtained to the value of $5.26\times10^{-6}A/cm2$ at the forward bias of 2 V.

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Growth of Ti on Si(111)-)-$7{\times}7$ Surface and the Formation of Epitaxial C54 $TiSi_2$ on Si(111) Substrate (Si(111)-$7{\times}7$ 면에서 Ti 성장과 C54 $TiSi_2$/Si(111) 정합 성장에 관하여)

  • Kun Ho Kim;In Ho Kim;Jeoung Ju Lee;Dong Ju Seo;Chi Kyu Choi;Sung Rak Hong;Soo Jeong Yang;Hyung Ho Park;Joong Hwan Lee
    • Journal of the Korean Vacuum Society
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    • v.1 no.1
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    • pp.67-72
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    • 1992
  • The growth of Ti on Si(111)-$7{\times}7$ and the formation of epitaxial C54 $TiSi_2$ were investigated by using reflection high energy electron diffraction(RHEED) and high resolution transmission electron microscopy(HRTEM). Polycrystalline Ti layer is grown on the amorphous Ti-Si interlayer which is formed at the Ti/Si interface by Ti deposition on Si(111)-$7{\times}7$ at room temperature (RT). HRTEM lattice image and transmission electron diffraction(TED) showed that epitaxial C54 $TiSi_2$ grown on Si substrate with 160 ML of Ti on Si(111)-$7{\times}7$ surface at RT, followed by annealing at $750^{\circ}C$ for 10 min in UHV. Thin single crystal Si overlayer with [111] direction is grown on $TiSi_2$ surface when $TiSi_2$/Si(111) is annealed at ${\sim}900^{\circ}C$ in UHV, which was confirmed by Si(111)-$7{\times}7$ superstructure.

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Development of Multi-layered TiO2/Al, Cr/TiO2 Pearl Pigment Processed by DC and RF Magnetron Sputtering Process (DC와 RF Magnetron Sputtering 공법을 이용한 다층 TiO2/Al, Cr/TiO2 진주안료 개발)

  • Jeong Jae-Il;Lee Jeong-Hun;Jang Gun-Eik
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.19 no.8
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    • pp.764-768
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    • 2006
  • For the possible application of pearl pigment, multi-layered $TiO_2/Al,\;Cr/TiO_2$ thin film were deposited on $SiO_2$ substrate by using sputtering method, $TiO_2$ and Al or Cr was selected as a possible high and low refraction material at the film interface respectively. Optical properties including color effect were systematically studied in terms of different film thickness and film layers by using spectrometer. In order to expect the experimental results, the simulation program, the Essential Macleod Program(EMP) was adopted and compared with the experimental data. The film consisting of $TiO_2/Al,\;Cr/TiO_2$ layers shows a wavelength range of $430{\sim}760nm$, typically color ranges between bluish purple and red. It was confirmed that this experimental result was quite well consistent with the experimental one.

Resistive Switching Characteristics of TiO2 Films with -Embedded Co Ultra Thin Layer

  • Do, Young-Ho;Kwak, June-Sik;Hong, Jin-Pyo
    • JSTS:Journal of Semiconductor Technology and Science
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    • v.8 no.1
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    • pp.80-84
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    • 2008
  • We systematically investigated the resistive switching properties of thin $TiO_2$ films on Pt/Ti/$SiO_2$/Si substrates that were embedded with a Co ultra thin layer. An in-situ sputtering technique was used to grow both films without breaking the chamber vacuum. A stable bipolar switching in the current-voltage curve was clearly observed in $TiO_2$ films with an embedded Co ultra thin layer, addressing the high and low resistive state under a bias voltage sweep. We propose that the underlying origin involved in the bipolar switching may be attributed to the interface redox reaction between the Co and $TiO_2$ layers. The improved reproducible switching properties of our novel structures under forward and reverse bias stresses demonstrated the possibility of future non-volatile memory elements in a simple capacitive-like structure.

The effects of TCO/a-Si:H interface on silicon heterojunction solar cell (실리콘 이종접합 태양전지의 TCO/a-Si:H 계면 특성 연구)

  • Tark, Sung-Ju;Kang, Min-Gu;Park, Sung-Eun;Lee, Seung-Hun;Jeong, Dae-Young;Kim, Chan-Seok;Lee, Jeong-Chul;Kim, Won-Mok;Kim, Dong-Hwan
    • 한국신재생에너지학회:학술대회논문집
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    • 2009.06a
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    • pp.88-88
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    • 2009
  • 실리콘 이종접합 태양전지 제작을 위한 주요 요소기술 중 TCO/a-Si:H 간의 계면 특성은 태양전지 효율을 결정하는 주요 인자이다. 일반적으로 투명전도 산화막으로는 ZnO:Al 또는 ITO 가 사용되고 있으며 Zn, In, Sn, O 등의 확산과 Si원소의 확산으로 TCO/a-Si:H 계면에서 $SiO_x$가 생성되어 태양전지 충진률을 감소시키는 영향을 미친다. 따라서 본 연구에서는 TCO/a-Si 계면에서 확산을 방지 하면서 패시베이션 역할을 하는 완충층을 삽입하여 실리콘 이종접합 태양전지의 효율을 높이는 연구를 수행하였다. 완충층으로 사용된 ZnO:Al의 수소화와 Zn 박막, $TiO_2$ 박막의 전기 광학적 특성을 분석하였고 AES 분석을 통해 $SiO_x$의 생성과 각 원소의 확산정도를 분석하고, CTLM을 이용하여 TCO/완충층/a-Si 간의 접촉저항을 측정하였다. 결과적으로 완충층으로 사용된 $TiO_2$(5nm)는 광특성에 큰 감소요인 없이 전기적 특성과 접촉저항 특성이 우수하였으며, 원소들간의 확산방지층으로도 우수한 특성을 보였다. ZnO:Al의 수소화는 SIMS 분석 결과 수소원소들이 계면쪽에 위치하지 않고 표면쪽에 다수 존재함으로써 패시베이션 특성을 크게 보이지 않았으나 AZO 박막의 전기적 특성은 크게 향상 시켰다. 그밖에 완충층으로 사용된 Zn 박막은 두께가 두꺼원 질수록 접촉저항의 감소를 가져왔으나 광학적 특성이 크게 감소하면서 효율적인 광포획 특성을 가지지 못하였다. 본 연구를 통하여 TCO/a-Si:H 간의 완충층 삽입을 통해 접촉저항을 낮추고 원소간의 확산을 억제하여 계면 패시베이션 특성을 향상 시킬수 있었다.

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The characteristics of MIS BST thin film capacitor

  • Park, Chi-Sun;Kim, In-Ki
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.11 no.1
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    • pp.38-42
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    • 2001
  • Electric and dielectric(Ba,Sr)$TiO_3$[BST] thin films for emtal-Insulator-Semiconductor(MIS) capacitors have been studied. BST thin films wre deposted on p-Si(100) substrates bythe RF magnetron sputtering with tempratue range of 500~$600^{\circ}C$. The dielectric properties of MIS capacitors consisting of Al/BST/$SiO_2$/Si sandwich structure were evaluated ot redcue the leakage current density. The charge state densities of the MIS capacitors were determined by high frequency (1 MHz) C-V measurement. In order to reduce the leakage current in MIS capacitor, high quality $SiO_2$ layer was deposited on bare p-Si substrate. Depending on the oxygen pressure and substrate temperature both positive and negative polarities of effective oxide charge in the MIS capacitors were evaluated. It is considered that the density of electronic states, generated at the BST/$SiO_2$/p-Si interface due to the asymmetric structure within BST/$SiO_2$/Si structure, and the oxygen vacancy content has influence on the behavior of oxide charge.

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Synthesis and Photocatalytic Properties of Thermally Stable Metal-Oxide Hybrid Nanocatalyst with Ultrathin Oxide Encapsulation

  • Naik, Brundabana;Moon, Song Yi;Kim, Sun Mi;Jung, Chan Ho;Park, Jeong Young
    • Proceedings of the Korean Vacuum Society Conference
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    • 2013.08a
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    • pp.317.2-317.2
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    • 2013
  • Ultrathin oxide encapsulated metal-oxide hybrid nanocatalysts have been fabricated by a soft chemical and facile route. First, SiO2 nanoparticles of 25~30 nm size have been synthesized by modified Stobber's method followed by amine functionalization. Metal nanoparticles (Ru, Rh, Pt) capped with polymer/citrate have been deposited on functionalized SiO2 and finally an ultrathin layer of TiO2 coated on surface which prevents sintering and provides high thermal stability while maximizing the metal-oxide interface for higher catalytic activity. TEM studies confirmed that 2.5 nm sized metal nanoparticles are well dispersed and distributed throughout the surface of 25 nm SiO2 nanoparticles with a 3-4 nm TiO2 ultrathin layer. The metal nanoparticles are still well exposed to outer surface, being enabled for surface characterization and catalytic activity. Even after calcination at $600^{\circ}C$, the structure and morphology of hybrid nanocatalysts remain intact confirm the high thermal stability. XPS spectra of hybrid nanocatalyst suggest the metallic states as well as their corresponding oxide states. The catalytic activity has been evaluated for high temperature CO oxidation reaction as well as photocatalytic H2 generation under solar simulation. The design of hybrid structure, high thermal stability, and better exposure of metal active sites are the key parameters for the high catalytic activity. The maximization of metal-TiO2 interface interaction has the great role in photocatalytic H2 production.

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A Study on the MOCVD $PbTiO_3$ Thin Films (MOCVD $PbTiO_3$ 박막의 특성에 관한 연구)

  • 송한상;최두진;유광수;정형진;김창은
    • Journal of the Korean Crystal Growth and Crystal Technology
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    • v.2 no.2
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    • pp.40-52
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    • 1992
  • $PbTi0_3$ thin films were deposited at $550^{\circ}C$ by MOCVD method using titanium-iso-propoxide [$Ti(OC_3H_7)_4$] and tetra-ethyl-lead $[Pb(C_2H_5)_4]$as starting materials. In the present study, Ar and $O_2$were used as a carrier gas and a reaction gas, respectively, and the change of thickness and refractive index, Xray diffraction analysis, and CV characteristic measurements of the films were systematically investigated. As a result of CV characteristic analysis of the annealed $PbTiO_3$ thin films, it is assumed that the films interact with Si substrate at the interface, and X-ray diffraction patterns of the films show characteristic peaks for $PbTiO_3$ With increasing the annealing temperature and time, the thickness of the films tends to decrease but their refractive index increases.

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