• Title/Summary/Keyword: $TiO_2(x_1)$

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백두산 화산군 환경과 동굴 암석의 년대측정 및 성분분석

  • 김경훈
    • Journal of the Speleological Society of Korea
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    • v.34 no.35
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    • pp.32-42
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    • 1993
  • The Paektu-san mountains are geographically situated in the Korea strait to the north of the main peninsula, coordinated between the longitudes of W(127$^{\circ}$15'~128$^{\circ}$00')and E(128$^{\circ}$15'~129$^{\circ}$00'), and between the latitudes of S(41$^{\circ}$15'~42$^{\circ}$00') and N(42$^{\circ}$10'~42$^{\circ}$40'). The volcanic group of the Paektu-san mountains can be devided into 2 main kinds of volcanos by the method investigation, The ashes are mainly made of tremolite, trachte, basalt and pumice, or, a little quartz, labradorite and volcanic glass. These sorts, ratios and forms of the rocks are respectively similar. The Haeven lake is surrounded by 19 peaks. The central volcanic cone is a secant cone in shape, with an altitude of the 1800m to 2749,2m (Chang-kun-bong), an average diameter of 10km, and a shape of an ellipse seen high from the plane. They say there were several eruptions in 1668, 1700 and 1702 A. D. The crystal structure of the rock sample collected at the cave of Mt. Paektu-san is monoclinic. The quantitative analysis of the rock samples in the cave is done by using XRF this time. The chemical compositions by XRF fundamamental parameter analysis is : SiO$_2$: 50.72Wt%, TiO = 2.422Wt%, $Al_2$O$_3$= 17.65Wt%, Fe$_2$O$_3$= 9.371Wt%, CaO = 8.711Wt%, MgO = 4.l19Wt%, MnO = 0.l15Wt%, $K_2$O = 1.369Wt%, Na$_2$O : 3.028Wt% and P$_2$O$_{5}$ = 0.365Wt%. The K-Ar age of the rock sample is also determined to be 0.16Ma. This paper describes some problems experienced in dating young volcanic rocks, and then discusses chemical compositions, X-ray fluorescence analyses and the age of the formation of a lava tunnel such as in Mt. Paektu-san.n.

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Microtube Light-Emitting Diode Arrays with Metal Cores

  • Tchoe, Youngbin;Lee, Chul-Ho;Park, Junbeom;Baek, Hyeonjun;Chung, Kunook;Jo, Janghyun;Kim, Miyoung;Yi, Gyu-Chul
    • Proceedings of the Korean Vacuum Society Conference
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    • 2016.02a
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    • pp.287.1-287.1
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    • 2016
  • Three-dimensional (3-D) semiconductor nanoarchitectures, including nano- and micro- rods, pyramids, and disks, are emerging as one of the most promising elements for future optoelectronic devices. Since these 3-D semiconductor nanoarchitectures have many interesting unconventional properties, including the use of large light-emitting surface area and semipolar/nonpolar nano- or micro-facets, numerous studies reported on novel device applications of these 3-D nanoarchitectures. In particular, 3-D nanoarchitecture devices can have noticeably different current spreading characteristics compared with conventional thin film devices, due to their elaborate 3-D geometry. Utilizing this feature in a highly controlled manner, color-tunable light-emitting diodes (LEDs) were demonstrated by controlling the spatial distribution of current density over the multifaceted GaN LEDs. Meanwhile, for the fabrication of high brightness, single color emitting LEDs or laser diodes, uniform and high density of electrical current must be injected into the entire active layers of the nanoarchitecture devices. Here, we report on a new device structure to inject uniform and high density of electrical current through the 3-D semiconductor nanoarchitecture LEDs using metal core inside microtube LEDs. In this work, we report the fabrications and characteristics of metal-cored coaxial $GaN/In_xGa_{1-x}N$ microtube LEDs. For the fabrication of metal-cored microtube LEDs, $GaN/In_xGa_{1-x}N/ZnO$ coaxial microtube LED arrays grown on an n-GaN/c-Al2O3 substrate were lifted-off from the substrate by wet chemical etching of sacrificial ZnO microtubes and $SiO_2$ layer. The chemically lifted-off layer of LEDs were then stamped upside down on another supporting substrates. Subsequently, Ti/Au and indium tin oxide were deposited on the inner shells of microtubes, forming n-type electrodes of the metal-cored LEDs. The device characteristics were investigated measuring electroluminescence and current-voltage characteristic curves and analyzed by computational modeling of current spreading characteristics.

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Electrical Properties of 50% Pb-excess PZT Thin Films Deposited on the Glass Substrates (유리기판위에 증착한 50% Pb-excess PZT박막의 전기적특성)

  • Jeong, Kyu-Won;Park, Young;Ju, Pil-Yeon;Park, Ki-Yup;Song, Joon-Tae
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.14 no.5
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    • pp.370-375
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    • 2001
  • PZT thin films (3500${\AA}$) ahve been prepared onto Pt/Ti/corning glass (1737) substrates with a RF magnetron sputtering system using Pb$\sub$1.50/(Zr$\sub$0.52/,Ti$\sub$0.48)O$_3$ ceramic target. We used two-step annealing techniques, PZT thin films were grown at a 300$^{\circ}C$ substrate temperature and then subjected to an RTA treatment. In case of 500$^{\circ}C$ RTA temperature show pyrochlore phase. The formation of Perovskite phase started above 600$^{\circ}C$ and PZT thin films generated (101) preferred orientation. As the RTA time and temperature increased, crystallization of PZT films were enhanced. The PZT capacitors fabricated at 650$^{\circ}C$ for 10 minutes RTA treatment showed remanent polarization 30 ${\mu}$C/$\textrm{cm}^2$, saturation polarization 42${\mu}$C/$\textrm{cm}^2$, coercive field 110kV/cm, leakage current density 2.83x10$\^$-7/A/$\textrm{cm}^2$, remanent polarization were decreased by 30% after 10$\^$9/ cycles.

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Full and Partial Polarization Switching Characteristics of Sol-Gel derived Pb(ZrxTi1-x)O3 This Films

  • Kim, Joon-Han;Park, Chang-Yub
    • Electrical & Electronic Materials
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    • v.11 no.10
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    • pp.46-52
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    • 1998
  • In this study, polarization switching characteristics of Pb(ZrxTil-x)O3 (PZT) thin films were investigated. Switching times(ts) were found to be decreased as the Zr mol% was increased. But, the switching peak currents(Imax) showed the largest value at 50 mol% Zr. As a result of this experiment, ts was found to be depended on the remanent polarization and coercive field and also Imax strongly depended on the dielectric constant of PZT thin films. In order to investigate the partial switching kinetics of PZT thin films, short and relatively small voltage pulses were applied to the MFM(metalferroelectric metal) PZT capacitors and polarization switching curves were measured with a variation of the total width of the applied pulses. Also, the switching curves were measured at different applied voltages(4, 8, 10, 12 and 14 volts). As the applied voltages increased, ts and Imax were found to be decreased and increased, respectively. In case of fatigued specimen which we applied $\pm$10 volts square pulse for 1010 cycles, ts and Imax were found to be shorter and smaller than those of virgin specimens. This is due to the decrease of the remanent polarization and the increase of the coercive field.

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The Effects of PZT Ratio and Sr Doping on the Piezoelectric Properties in PZN-PNN-PZT (PZN-PNN-PZT계 압전 조성에서 PZN 함량과 Sr Doping이 압전 특성에 미치는 영향)

  • Choi, Jeoung Sik;Lee, Chang Hyun;Shin, Hyo Soon;Yeo, Dong Hun;Lee, Joon Hyung
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.31 no.1
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    • pp.19-23
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    • 2018
  • In a Pb-included piezoelectric composition, $Sr_yPb_{1-y}[(Zn_{1/3}Nb_{2/3})_x-(Ni_{1/3}Nb_{2/3})_{0.2}-(Zr_{0.46}Ti_{0.54})_{0.8-x}]O_3$ was selected in order to attain high piezoelectric properties. According to the PZN ratio (x) and the amount of Sr doping (y), the crystal structure, microstructure and piezoelectric properties were measured and evaluated. In the case of Sr 4 mol% doping, the piezoelectric properties were the highest for a PZN ratio of 0.1. In this condition, the grain size was larger and the intensity was higher. With the PZN ratio fixed and varying the Sr doping, the piezoelectric properties increased until 10 mol% doping and then decreased for over 12 mol% doping. In the case of x=0.1 and y=10 mol%, the best piezoelectric properties were obtained, i.e., $d_{33}=660pC/N$ and $k_p=68.5%$, and these values seem to be related to the grain size and crystal structure.

Flowering and Pod Setting Characteristics of Peanut Varieties as Affected by Planting Date (파종기에 따른 땅콩 품종의 개화 및 결협 특성)

  • 정영근;오윤섭;김종태;오명규;박기훈;박문수
    • KOREAN JOURNAL OF CROP SCIENCE
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    • v.42 no.4
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    • pp.410-415
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    • 1997
  • To investigate the flowering and pod setting characteristics of peanut, Dae-kwangtangkong and Shinnamkwangtangkong were planted on April 20 and May 10 in 1994 at National Honam Agricultural Experiment Station. Number of days from planting to the maximum flowering in Daekwangtangkong were shorter than those of Shinnamkwangtangkong by 6 days in April 20 planting and by 13 days in May 10 planting. Flowering durations of Daekwangtangkong and Shinnamkwangtangkong in April 10 planting were 73 and 71 days, respectively, while those of both varieties were 64 days in May 10 planting. The rates of matured pods on cotyledonary, primary or secondary, and third branches were 58∼78, 6∼15 and 0∼2%, respectively. The rates of effective flowers in Daekwantangkong and Shinnamkwangtangkong were 10% and 8%, respectively, in April 20 planting. The rates of matured pods were 100% in Daekwangtangkong and 97% in Shinnamkwangtangkong when pods were set within 15 days after the initial flowering, while the rate was decreased markedly when pods were set later than 35 days after the initial flowering.

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Effects of Two-Step Annealing Process on the Pulsed Laser Ablated Lead Zirconate Titanate Thin Films

  • Rhie, Dong-Hee
    • KIEE International Transactions on Electrophysics and Applications
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    • v.3C no.2
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    • pp.43-47
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    • 2003
  • Lead zirconate titanate (PZT) thin films were fabricated by the pulsed laser ablation deposition (PLAD) method onto Pt/Ti/SiO$_2$/Si substrates. Crystalline phases as well as preferred orientations in PZT films were investigated by X-ray diffraction analysis (XRD). The well-crystallized perovskite phase and the (101) preferred orientation were obtained by two-step annealing at the conditions of $650^{\circ}C$, 1 hour. It was found that the temperature for the pulsed laser ablated PZT films annealed via a two-step annealing process can be reduced 20$0^{\circ}C$ compared to that of the conventional three-step annealing temperature profile for enhancing the transformation of the perovskite phase. The remanent polarization and the coercive field of this film were about 20 $\mu$C/$\textrm{cm}^2$ and 46 kV/cm, while the dielectric constant and loss values measured at 1 KHz were approximately 860 and 0.04, respectively. The interesting phenomena of this film, such as vertical shift in hysteresis curve, are also discussed.

Microstructures and Electrical Properties of PSN-PZT Ceramics for Piezoelectric Speaker (압전 스피커 응용을 위한 PSN-PZT계 세라믹스의 미세구조 분석 및 전기적 특성 평가)

  • Kim, Sung-Jin;Kweon, Soon-Yong
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.32 no.2
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    • pp.110-115
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    • 2019
  • $Pb(Sb_{0.5}Nb_{0.5})_x(Zr_{0.51}Ti_{0.49})_{1-x}O_3$ (abbreviation: PSN-PZT) ceramics were synthesized, using conventional bulk ceramic processing technology, with various PSN doping contents. The maximum density of PSN-PZT was 97% of the theoretical density in the samples sintered at $1,250^{\circ}C$. The maximum values of the piezoelectric properties achieved using the conventional processes were: $k_p$ of 0.625, $d_{33}$ of 531 pC/N, and $g_{33}$ of $33mV{\cdot}m/N$. Finally, we fabricated a piezo-speaker with the optimized PSN-PZT ceramics. The SPL of the speaker was measured at a distance of 1 m, with a driving voltage of $40V_{rms}$ in the frequency range of ~300 Hz to 9 kHz. The measured $SPL_{max}$ was at a very high level (95 dB), which was superior in quality in comparison with those of other commercial products.

SHAPE EFFECT ON PERFORMANCE OF MULTILAYER CERAMIC ACTUATOR

  • Wee, S. B.;Jeong, S. J.;Song, J. S.
    • Proceedings of the Korean Society Of Semiconductor Equipment Technology
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    • 2003.12a
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    • pp.163-168
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    • 2003
  • In the present study, the piezoelectricity and polarization of multilayer ceramic actuator, being designed to stack PMN-PZ-PT ceramic layers and Ag-Pd electrode layers alternatively, were investigated under a consideration of geometric factor, the volume ratio of the ceramic to the electrode layers. The actuators were fabricated by tape casting of $0.2Pb(Mg_{1/3}Nb_{2/3)O_3-0.38PbZrO_3-0,42PbTiO_3$ followed by lamination and burnout & co-firing processes. The actuators of $10\times10\times0.6~2\textrm{mm}^3$ in size were formed in a way that $60 ~ 200\mu\textrm{m}$ thick were stacked alternatively with $5\mu\textrm{m}$ thick electrode layer. Increases in polarization and electric field-induced displacement with thickness of the ceramic layer were attributed to change of $90^{\circ}$/$180^{\circ}$ domain ratio, which was affected by interlayer internal stress. The piezoelectricity and actuation behaviors were found to depend upon the volume ratio (or thickness ratio) of ceramic to electrode layers.

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Popping Mechanism and Shape Moulding Factor of Popcorn (튀김옥수수의 파열방향 및 튀김형태 결정요인)

  • Kim, Sun-Lim;Park, Seung-Ue;Kim, E-Hun
    • KOREAN JOURNAL OF CROP SCIENCE
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    • v.40 no.1
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    • pp.98-102
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    • 1995
  • Popped popcorn generally have a regular popping direction and typical shape. But the reason and mechanism are not clear yet. This experiment was carried out to investigate the shape moulding factor of popped popcorn. Pericarp thickness of tip-cap section of kernels is slightly thicker than that of top section and this fact provides the important information to the reason. Popping starts when the moisture pressure of heated popcorn is increased and reaches at the critical pressure. Therefore, in the same moisture pressure conditions, top sections are bursted first because their pericarp section is thinner than that of tip-cap section. At the very moment tip-cap sections pull down the top sections of peri carp as bi-metal does. So kernels which removed tip-cap section showed the irregular popping shape because they lost the tip-cap pericarp function. How-ever, kernels which removed embryo showed the typical popping shape but their popping volume was small due to emition and shortage of critical moisture pressure. But kernels which removed the whole pericarp and top pericarp were not popped at all because moisture was entirely emitting out of kernels. These results suggest that the shape moulding factor of popped popcorn is the pericarp thickness differences between the top and tip-cap section of kernels.

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