• Title/Summary/Keyword: $O_2/Ar$

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MgFe$_2$/GeO$_2$ AR Coating on o-type(100) Cz Silicon Solar Cells

  • Lim, D.G.;Lee, I.;Lee, U.J.;Yi, J.
    • Transactions on Electrical and Electronic Materials
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    • v.1 no.4
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    • pp.11-15
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    • 2000
  • This paper presents a process optimization of antireflection (AR) coating on crystalline Si solar cells. Theoretical and experimental investigations were performed on a double-layer AR(DLAR) coating of MgFe$_2$/GeO$_2$. We investigated GeO$_2$ films as an AR layer because they have a proper refractive index of 2.46 and demonstrate the same lattice constant as Si substrate. RF sputter grown GeO$_2$ film showed deposition temperature strong dependence. The GeO$_2$ at 400$\^{C}$ exhibited a strong (111) preferred orientation and the lowest surface roughness of 6.87 $\AA$. Refractive index of MgFe$_2$film was measured as 1.386 for the most of growth temperature. An optimized DLAR coating showed a reflectance as low as 2.04% in the wavelengths ranged from 0.4 ㎛ to 1.1 ㎛. Solar cells with a structure of MgFe$_2$/GeO$_2$/Ag/N$\^$+//p-type Si/P$\^$+//Al were investigated with the without DLAR coatings. We achieved the efficiency of solar cells greater than 15% with 3.12% improvement with DLAR coatings. Further details about MgFe$_2$,GeO$_2$ films, and cell fabrication parameters are presented in this paper.

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Electro-optical characteristics of MgO protective layer after RF plasma treatment using Ar, $O_2$ and $H_2$ gases

  • Son, Chang-Gil;Lee, H.J.;Jung, J.C.;Park, W.B.;Moon, M.W.;Oh, P.Y.;Jeong, J.M.;Ko, B.D.;Lee, J.H.;Lim, J.E.;Han, Y.G.;Lee, S.B.;Yoo, N.L.;Jeong, S.H.;Choi, E.H.
    • 한국정보디스플레이학회:학술대회논문집
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    • 2005.07b
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    • pp.1211-1214
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    • 2005
  • One of the important problems in recent AC-PDP technology is high efficiency. In this research, we have been investigated electro-optical characteristics of MgO protective layer after radio frequency(RF) plasma treatment using Ar, $O_2$, and $H_2$ gases. The breakdown voltage order was $O_2$ > Ar > Nontreatment > $H_2$. Also, brightness order was $O_2$ > Ar > Non-treatment > $H_2$. In this experiment, the best result was obtained after $O_2-plasma$ treatment.

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Study of dry etching chrateristics of freeoelectric $YMnO_{3}$ thin films (강유전체 $YMno_{3}$ 박막의 건식식각 특성연구)

  • Kim, In-Pyo;Park, Jae-Hwa;Kim, Kyoung-Tae;Kim, Chang-Il;Jang, Eui-Goo;Eom, Joon-Chul
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2002.11a
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    • pp.159-162
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    • 2002
  • Ferroelectric $YMnO_{3}$ thin films were etched with $Ar/Cl_{2}$ and $CF_{4}/Cl_{2}$ inductivly coupled plasma (ICP). The maximum etch rate of $YMnO_{3}$ thin film was $300{\AA}/min$ at a $Ar/Cl_{2}$ gas mixing ratio of 2/8, a RF power of 800 W, a dc bias of 200 V, a chamber pressure of 15 mTorr, and a substrate temperature of ${30^{\circ}C}$. From the X-ray photoelectron spectroscopy (XPS) analysis , yttrium not only etched by chemical reactions with Cl radicals, but also assisted by Ar ion bombardments in $Ar/Cl_{2}$ plasma. In $CF_{4}/Cl_{2}$ plasma, yttrium are remained on the etched surface of $YMnO_{3}$ and formed of nonvolatile YFx compounds Manganese etched effectively by chemical reactions with Cl and F radicals. From the X-ray diffraction (XRD) analysis, the (0004) diffraction peak intensity of the $YMnO_{3}$ thin film etched in $Ar/Cl_{2}$ plasma shows lower value than that in $CF_{4}/Cl_{2}$ plasma. It is indicates that the crystallinty of $YMnO_{3}$ thin film is more easily damaged by the Ar ion bombardment than the changes of stoichiometry due to nonvolatile etch by-products.

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The dielectric properties of the PZT(30/70)/(70/30) heterolayered thin films with Ar/$O_2$ rates (Ar/$O_2$ 비에 따른 PZT(30/70)/(70/30) 이종층 박막의 유전 특성)

  • Nam, Sung-Pill;Lee, Sang-Chul;Lee, Sang-Heon;Lee, Sung-Gap;Bae, Seon-Gi;Lee, Young-Hie
    • Proceedings of the KIEE Conference
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    • 2003.10a
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    • pp.117-119
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    • 2003
  • The $Pb(Zr_{0.3}Ti_{0.7)O_3/Pb(Zr_{0.7}/Ti_{0.3})O_3$ [PZT(30/70)/(70/30)] heterolayered thin films were deposited by RF sputtering method on the $Pt/TiO_2/SiO_2/Si$ substrate. Sputter gas ratio(AR/O2) was changed form 90/10 to 50/50. The structural properties and electrical properties of the PZT(30/70)/ (70/30) heterolayered thin films were studied. The relative dielectric constant and dielectric loss at 100Hz of the PZT(30/70)/PZT(70/30) heterolayered thin films with Ar/$O_2$(80/20) ratio were about 982 and 0.036, respectively.

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Effects of Heat Treatment Conditions of FeC2O4·2H2O on the Formation of Fe3O4-δ (FeC2O4·2H2O의 열처리 조건이 Fe3O4-δ 형성에 미치는 영향)

  • Oh, Kyoung-Hwan;Park, Won-Shik;Rhee, Sang-In;Suhr, Dong-Soo
    • Korean Journal of Materials Research
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    • v.22 no.11
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    • pp.620-625
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    • 2012
  • A general synthetic method to make $Fe_3O_{4-{\delta}}$ (activated magnetite) is the reduction of $Fe_3O_4$ by $H_2$ atmosphere. However, this process has an explosion risk. Therefore, we studied the process of synthesis of $Fe_3O_{4-{\delta}}$ depending on heat-treatment conditions using $FeC_2O_4{\cdot}2H_2O$ in Ar atmosphere. The thermal decomposition characteristics of $FeC_2O_4{\cdot}2H_2O$ and the ${\delta}$-value of $Fe_3O_{4-{\delta}}$ were analyzed with TG/DTA in Ar atmosphere. ${\beta}-FeC_2O_4{\cdot}2H_2O$ was synthesized by precipitation method using $FeSO_4{\cdot}7H_2O$ and $(NH_4)_2C_2O_4{\cdot}H_2O$. The concentration of the solution was 0.1 M and the equivalent ratio was 1.0. ${\beta}-FeC_2O_4{\cdot}2H_2O$ was decomposed to $H_2O$ and $FeC_2O$4 from $150^{\circ}C$ to $200^{\circ}C$. $FeC_2O4$ was decomposed to CO, $CO_2$, and $Fe_3O_4$ from $200^{\circ}C$ to $250^{\circ}C$. Single phase $Fe_3O_4$ was formed by the decomposition of ${\beta}-FeC_2O_4{\cdot}2H_2O$ in Ar atmosphere. However, $Fe_3C$, Fe and $Fe_4N$ were formed as minor phases when ${\beta}-FeC_2O_4{\cdot}2H_2O$ was decomposed in $N_2$ atmosphere. Then, $Fe_3O_4$ was reduced to $Fe_3O_{4-{\delta}}$ by decomposion of CO. The reduction of $Fe_3O_4$ to $Fe_3O_{4-{\delta}}$ progressed from $320^{\circ}C$ to $400^{\circ}C$; the reaction was exothermic. The degree of exothermal reaction was varied with heat treatment temperature, heating rate, Ar flow rate, and holding time. The ${\delta}$-value of $Fe_3O_{4-{\delta}}$ was greatly influenced by the heat treatment temperature and the heating rate. However, Ar flow rate and holding time had a minor effect on ${\delta}$-value.

Study of High Temperature of Inconel 740 Alloy in Air and Ar-0.2%SO2 Gas (대기 및 Ar-0.2%SO2가스에서 Inconel 740 합금의 고온부식 연구)

  • Lee, Dong Bok;Kim, Min Jung
    • Journal of the Korean institute of surface engineering
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    • v.54 no.2
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    • pp.43-52
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    • 2021
  • The Ni-based superalloy, Inconel 740, was corroded between 800 and 1100℃ for up to 100 hr in air and Ar-0.2%SO2 gas in order to study its corrosion behavior in air and sulfur/oxygen environment. It displayed relatively good corrosion resistance in both environment, because its corrosion was primarily dominated by not sulfidation but oxidation especially in Ar-0.2%SO2 gas. Such was attributed to the thermodynamic stability of oxides of alloying elements when compared to corresponding sulfides. The scales consisted primarily of Cr2O3, together with some NiAl2O4, MnCr2O4, NiCrMnO4, and rutile-TiO2. Sulfur from SO2 gas made scales prone to spallation, and thicker. It also widened the internal corrosion zone when compared to air. The corrosion resistance of IN740 was mainly indebted to the formation of protective Cr2O3-rich oxides, and suppression of the sulfide formation.

The etching properties of $Al_2O_3$ thin films in $N_2/Cl_2/BCl_3$ and Ar/$Cl_2/BCl_3$ gas chemistry (유도결합 플라즈마를 이용한 $Al_2O_3$ 식각 특성)

  • Koo, Seong-Mo;Kim, Dong-Pyo;Kim, Kyoung-Tae;Kim, Chang-Il
    • Proceedings of the KIEE Conference
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    • 2004.11a
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    • pp.72-74
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    • 2004
  • In this study, we used a inductively coupled plasma (ICP) source for etching $Al_2O_3$ thin films because of its high plasma density, low process pressure and easy control bias power. $Al_2O_3$ thin films were etched using $Cl_2/BCl_3$, $N_2/Cl_2/BCl_3$, and Ar/$Cl_2/BCl_3$ plasma. The experiments were carried out measuring the etch rates and the selectivities of $Al_2O_3$ to $SiO_2$ as a function of gas mixing ratio, rf power, and chamber pressure. When $Cl_2$ 50% was added to $Cl_2/BCl_3$ plasma, the etch rate of the $Al_2O_3$ films was 118 nm/min. We also investigated the effect of gas addition. In case of $N_2$ addition, the etch rate of the $Al_2O_3$ films decreased while $N_2$ was added into $Cl_2/BCl_3$ plasma. However, the etch rate increased slightly as Ar added into $Cl_2/BCl_3$ plasma, and then further increase of Ar decreased the etch rate. The maximum etch rate was 130 nm/min at Ar 20% in $Cl_2/BCl_3$ plasma, and the highest etch selectivity was 0.81 in $N_2$ 20% in $Cl_2/BCl_3$ plasma. And, we obtained the results that the etch rate increases as rf power increases and chamber pressure decreases. The characteristics of the plasmas were estimated using optical emission spectroscopy (OES).

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Reduction Behavior of MoO3 to MoO2 by Ar+H2 Gas Mixture (Ar+H2 혼합(混合)가스에 의한 MoO3의 MoO2로의 환원거동(還元擧動))

  • Sohn, Ho-Sang;Yi, Hyang-Jun;Park, Jong-Il
    • Resources Recycling
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    • v.20 no.4
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    • pp.71-77
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    • 2011
  • $MoO_3$ powders were reduced to $MoO_2$ under Ar+$H_2$ gas mixture in a tubular furnace at temperature range 723~873 K. Reaction rate was quantitatively deduced by measuring relative humidity of off gas. Observed reaction rate increased significantly with hydrogen partial pressure and reaction temperature and the rate of $H_2O$ evolution increased drastically during the initial period of reduction. As reduction proceeded, however, $H_2O$ partial pressure decreased noticeably. During the initial period of the reduction, a linear relationship for time dependence of the reduction fraction was observed. The activation energy for the reduction of $MoO_3$ to $MoO_2$was 73.56 kJ/mol during the initial period of reduction.

Etching Characteristics of $SrBi_{2}Ta_{2}O_{9}$ Thin Film with Adding $Cl_2$ into $CF_4$/Ar Plasma ($CF_4$/Ar 플라즈마 내 $Cl_2$첨가에 의한 $SrBi_{2}Ta_{2}O_{9}$ 박막의 식각 특성)

  • 김동표;김창일;이원재;유병곤;김태형;장의구
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.14 no.9
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    • pp.714-719
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    • 2001
  • SrBi$_2$Ta$_2$$O_{9}$ thn films were etched in inductively coupled Cl$_2$/CF$_4$/Ar plasma. THe maximum etch rate was 1060 $\AA$/min at a Cl$_2$/(Cl$_2$+CF$_4$+Ar)=0.2. The 20% additive Cl$_2$ into CF$_4$/Ar plasma decreased carbon and fluorine radicals, but increased Cl radicals. Sr was effectively removed by reacting with Cl radical because the boiling point of SrCl$_2$(125$0^{\circ}C$) is lower than that of SrF$_2$(246$0^{\circ}C$). The chemical reactions on the etched surface were studied with x-ray photoelectron spectroscopy and secondary ion mass spectrometry. The etching profile was evaluated by using scanning electron microscopy.y.

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Electrical characteristics of ZnO Thin Film according to deposition conditions (증착조건에 따른 ZnO 박막의 전기적 특성)

  • Lee, Dong-Yoon
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2003.05c
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    • pp.131-135
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    • 2003
  • Zinc Oxide(ZnO) thin films on Si (100) substrate were deposited by RF magnetron sputter with changing sputtering conditions such as argon/oxygen gas ratios, RF power, and substrate temperature, chamber pressure and target-substrate distance. To analyze a crystallographic properties of the films, $\theta/2\theta$ mode X-ray diffraction, SEM, and AFM analyses. C-axis preferred orientation, resistivity, and surface roughness highly depended on $Ar/O_2$ gas ratios. The resistivity of ZnO thin films rapidly increased with increasing oxygen ratio and the resistivity value of $9{\times}10^7{\Omega}cm$ was obtained at a working pressure of 10 mTorr with $Ar/O_2$=50/50. The surface roughness was also improved with increasing oxygen ratio and the ZnO films deposited with $Ar/O_2$=50/50 showed the excellent roughness value of $28.7{\AA}$.

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