• 제목/요약/키워드: $O_2$ Plasma treatment

검색결과 523건 처리시간 0.034초

RF 스퍼터링 증착된 $TiO_{2}$ 박막의 염료감응형 태양전지 적용 연구 (Sputter Deposition and Surface Treatment of $TiO_{2}$ films for Dye-Sensitized Solar Cells using Reactive RF Plasma)

  • 김미정;서현웅;최진영;조재석;김희제
    • 한국신재생에너지학회:학술대회논문집
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    • 한국신재생에너지학회 2007년도 춘계학술대회
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    • pp.309-312
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    • 2007
  • Sputter deposition followed by surface treatment was studied using reactive RF plasma as a method for preparing titanium oxide($TiO_{2}$) films on indium tin oxide(ITO) coated glass substrate for dye-sensitized solar cells(DSSCs). Anatase structure $TiO_{2}$ films deposited by reactive RF magnetron sputtering under the conditions of $Ar/O_{2}$(5%) mixtures, RF power of 600W and substrate temperature of $400^{\circ}C$ were surface-treated by inductive coupled plasma(ICP) with $Ar/O_{2}$ mixtures at substrate temperature of $400^{\circ}C$, and thus the films were applied to the DSSCs, The $TiO_{2}$ Films made on these exhibited the BET specific surface area of 95, the pore volume of $0.3cm^{2}$ and the TEM particle size of ${\sim}25$ nm. The DSSCs made of this $TiO_{2}$ material exhibited an energy conversion efficiency of about 2.25% at $100mW/cm^{2}$ light intensity.

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Plasma nitridation of atomic layer deposition-Al2O3 by NH3 in PECVD

  • Cha, Ham cho rom;Cho, Young Joon;Chang, Hyo Sik
    • 한국진공학회:학술대회논문집
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    • 한국진공학회 2016년도 제50회 동계 정기학술대회 초록집
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    • pp.304.1-304.1
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    • 2016
  • We have investigated the effect of plasma nitridation of atomic layer deposited-Al2O3 films of monocrystalline Si wafers and the thermal properties of nitridated Al2O3 films. Nitridation was performed on Al2O3 to form aluminum oxynitride (AlON) using NH3 plasma treatment in a plasma-enhanced chemical vapor deposition and it was conducted at temperature of $400^{\circ}C$ with various plasma power condition. After nitridation, we performed firing and forming gas annealing (FGA). For each step, we have observed the minority carrier lifetime and the implied Voc by using quasi-Steady-State photoconductance (QSSPC). We confirmed a tendency to increase the minority carrier lifetime and the implied Voc after the nitridation. On the other hand, the minority carrier lifetime and the implied Voc was decreased after Firing and forming gas annealing (FGA). To get more information, we studied properties of the plasma treated Al2O3 films by using Secondary Ion Mass Spectroscopy (SIMS) and X-ray Photoelectron Spectroscopy (XPS).

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대기압 플라즈마를 이용한 TiO2 광촉매의 효율향상을 위한 표면 개질 연구 (Surface Modification of TiO2 by Atmospheric Pressure Plasma)

  • 조상진;정충경;김성수;부진효
    • 한국진공학회지
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    • 제19권1호
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    • pp.22-27
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    • 2010
  • $TiO_2$의 표면의 친수성을 증가시키기 위하여 dielectric barrier discharge (DBD)에 의해 발생된 대기압 플라즈마 (atmospheric pressure plasma: APP)를 이용 RF power 50~200 W 범위에서 Ar과 $O_2$ 가스를 사용 대기압 플라즈마로 광촉매 표면을 개질하였다. Ar 가스 단독으로 처리한 시료의 접촉각은 20도에서 10도로 감소하였으며, $O_2$ 가스를 반응성 가스로 하여 처리한 경우에는 접촉각이 20도에서 1도 미만으로 감소하였다. 동일한 RF power에서 $O_2$ 플라즈마 처리 시 더 낮은 접촉각을 확인하였는데, 이는 $TiO_2$ 표면과 산소원자의 결합으로 인하여 표면의 polar force의 증가에 의한 것으로 판단되어 대기압 플라즈마로 처리된 시료의 X-ray photoelectron spectroscopy (XPS)의 스펙트럼 분석결과 OH 작용기의 증가로 표면의 친수성이 증가됨을 확인하였다. 대기압 플라즈마로 처리된 시료와 처리하지 않은 시료의 접촉각은 모두 시간이 지남에 따라 증가하지만 플라즈마 처리 된 시료의 접촉각 증가는 플라즈마 처리하지 않은 시료의 접촉각 보다 작은 것을 확인하였다. 또한, 페놀 분해 실험을 통하여 플라즈마 표면처리를 통하여 $TiO_2$ 광촉매의 분해 효율이 크게 향상되는 것을 확인하였다.

Optimized O2 Plasma Surface Treatment for Uniform Sphere Lithography on Hydrophobic Photoresist Surfaces

  • Yebin Ahn;Jongchul Lee;Hanseok Kwon;Jungbin Hong;Han-Don Um
    • 한국전기전자재료학회논문지
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    • 제37권2호
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    • pp.188-194
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    • 2024
  • This paper introduces an optimized oxygen (O2) plasma surface treatment technique to enhance sphere lithography on hydrophobic photoresist surfaces. The focus is on semiconductor manufacturing, particularly the creation of finer structures beyond the capabilities of traditional photolithography. The key breakthrough is a method that makes substrate surfaces hydrophilic without altering photoresist patterns. This is achieved by meticulously controlling the O2 plasma treatment duration. The result is the consistent formation of nano and microscale patterns across large areas. From an academic perspective, the study deepens our understanding of surface treatments in pattern formation. Industrially, it heralds significant progress in semiconductor and precision manufacturing sectors, promising enhanced capabilities and efficiency.

유도결합플라즈마 표면 처리 및 SnO2 증착에 따른 폴리카보네이트 특성 연구 (Influence of Inductive Coupled Plasma Treatment and SnO2 Deposition on the Properties of Polycarbonate)

  • 엄태영;최동혁;손동일;엄태용;김대일
    • 한국전기전자재료학회논문지
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    • 제31권3호
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    • pp.156-159
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    • 2018
  • Inductively coupled plasma (ICP) treatment with argon and a mixture of argon and oxygen gases has been used to modify the surface of polycarbonate (PC) substrates. The results showed that the surface contact angle was inversely proportional to the plasma discharge power and that the mixed-gas plasma (gas flow 10:10 sccm, discharge power 60 W) decreased the surface contact angle as low as $18.3^{\circ}$, indicating a large increase in the surface hydrophilicity. In addition, $SnO_2$ thin films deposited on the PC substrate effectively enhanced the ICP plasma treatment, and could also enhance the usefulness of PC in the inner parts of automobiles.

ZnO 나노막대의 표면이 광학적 특성에 미치는 영향 (The Effect of the ZnO Nanorod Surface on the Optical Property)

  • 조현민;이석주;조재원
    • 한국전기전자재료학회논문지
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    • 제23권2호
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    • pp.93-97
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    • 2010
  • We have studied the effect of the chemical composition of the ZnO nanorod surface on the optical characteristics. The surface was treated with H- and O-plasma at different surface temperatures. The chemical composition of the surface of the ZnO nanorod, being investigated by Auger Electron Spectroscopy(AES), was related to the Photoluminescence(PL) data reported in our previous results. The AES showed the opposite results for the $H_2$ and $O_2$ plasma treatments. The ratio of Zn to O on the surface of the ZnO nanorod increased in the case of $H_2$ plasma, while the composition rate of O increased after $O_2$ plasma treatment. The AES results seems to be correlated to the shift in PL peaks. The increase in the composition rate of Zn on the surface of ZnO nanorod is considered to cause the blue shift of the UV peak. On the contrary, the relative increase of O is considered to cause the red shift in PL peaks.

산소 플라즈마 처리후의 이차전자방출계수(γ)를 이용한 MgO 보호막의 일함수(φW) 변화 (Work Function Changes on MgO Protective Layer after O2plasma Treatment from Ion-induced Secondary Electron Emission Coefficient)

  • 정재천;유세기;조재원
    • 한국전기전자재료학회논문지
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    • 제18권3호
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    • pp.259-263
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    • 2005
  • The changes in secondary electron emission coefficient(${\gamma}$) and work function($\Phi$$_{\omega}$) have been studied on the surface of MgO protective layer aster plasma(Ar. $O_2$) treatment using ${\gamma}$-focused ion beam (${\gamma}$-FIB) system. The values of ${\gamma}$ varied as follows: $O_2$-treated MgO > Ar-treated MgO > Non-treated MgO, and the work functions varied in the reverse order. The result indicates that both the physical etching and the chemical reaction of $O_2$-plasma removed the contaminating materials from the surface of MgO.

Experimental Study on Reduction of Temporal Dark Image Sticking on Bright Screen in AC-PDPs Using RF-Plasma Treatment on MgO layer

  • Park, Choon-Sang;Kim, Jae-Hyun;Tae, Heung-Sik
    • 한국정보디스플레이학회:학술대회논문집
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    • 한국정보디스플레이학회 2009년도 9th International Meeting on Information Display
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    • pp.101-103
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    • 2009
  • Minimizing the residual impurity level on the MgO layer is the key factor for reducing temporal dark image sticking on bright screen. In this paper, to reduce the residual impurity level on the MgO layer of 50-in. full-HD ac-PDP with He (35%) - Xe (11%) contents, RF-plasma treatments on the MgO layer are adopted under various gases for plasma treatment. As a result of monitoring the difference in the display luminance between the before and after 5-min. sustain discharge with a square-type image at peak luminance, the Ar and Ar>$O_2$ plasma treatments can reduce the temporal dark image sticking on the bright screen in an ac-PDP.

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Effect of an temperatures of post-spray heat treatment on wear behavior of $8%Y_2O_3-ZrO_2$ coating

  • Chae, Y.H.;Kim, S.S.
    • 한국윤활학회:학술대회논문집
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    • 한국윤활학회 2002년도 proceedings of the second asia international conference on tribology
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    • pp.181-182
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    • 2002
  • Most recent, Plasma ceramic spray is used on parts of tribosystem, has been investigated on the tribological performance. The application of ceramic coatings by plasma spray has become essential in tribosystems to produce better wear resistance and longer life in various conditions. The purpose of this work was to investigate the wear behavior of $8%Y_2O_3-ZrO_2$ coating due to temperatures of post-spay heat treatment. The plasma-sprayed $8%Y_2O_3--Zirconia$ coating was idiscussed to know the relationship between phase transformations and temperatures of post- spray heat treatment. Wear tests was carried out with ball on disk type on normal load of 50N, 70N and 90N under room temperature. The transformation of phase and the value of residual stress were measured by X-ray diffraction method(XRD). Tribological characteristics and wear mechanisms of coatings was observed by SEM. The tribologieal wear performance was discussed a point of view for residual stress. Consequently. post-spray heat treatment plays an important role in decreasing residual stress. Residual stress in coating system has a significant influence on the wear mechanism of coating.

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Ar Ion Beam 처리를 통한 Organic Thin Film Transistor의 성능향상 (Performance enhancement of Organic Thin Film Transistor by Ar Ion Beam treatment)

  • 정석모;박재영;이문석
    • 대한전자공학회논문지SD
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    • 제44권11호
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    • pp.15-19
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    • 2007
  • OTFTs (Organic Thin Film Transistors)의 구동에 있어, 게이트 절연막 표면과 채널의 계면상태가 소자의 전기적 특성에 큰 영향을 미치게 된다. OTS(Octadecyltrichlorosilane)등과 같은 습식 SAM(Self Assembly Monolayer)를 이용하거나, $O_2$ Plasma와 같은 건식 표면 처리등 여러 표면 처리법에 대한 연구가 진행되고 있다. 본 논문에서는 pentacene을 진공 증착하기 전에 게이트 절연막을 $O_2$ plasma와 Ar ion beam을 이용하여 건식법으로 전처리 한 후 표면 특성을 atomic force microscope (AFM) and X-ray photoelectron spectroscopy (XPS)를 사용하여 비교 분석하였고, 각 조건으로 OTFT를 제작하여 전기적 특성을 확인하였다. Ar ion beam으로 표면처리 했을 때, $O_2$ plasma처리했을 때 보다 향상된 on/off ratio 전기적 특성을 얻을 수 있었다. 표면 세정을 위하여 $O_2$ plasma 처리시 $SiO_2$ 표면의 OH-기와 반응하여 oxide trap density가 높아지게 되고 이로 인하여 off current가 증가하는 문제가 발생한다. 불활성 가스인 Ar ion beam 처리를 할 경우 게이트 절연막의 세정 효과는 유지하면서, $O_2$ Plasma 처리했을 때 증가하게 되는 계면 trap을 억제할 수 있게 되어, mobility 특성은 동등 수준으로 유지하면서 off current를 현저하게 줄일 수 있게 되어, 결과적으로 높은 on/off ratio를 구현할 수 있다는 것을 확인하였다.