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http://dx.doi.org/10.6117/kmeps.2017.24.4.053

Mechanical and Electrical Failure of ITO Film with Different Shape during Twisting Deformation  

Kwon, Y.Y. (School of Materials Science & Engineering, Andong National University)
Kim, Byoung-Joon (School of Materials Science & Engineering, Andong National University)
Publication Information
Journal of the Microelectronics and Packaging Society / v.24, no.4, 2017 , pp. 53-57 More about this Journal
Abstract
The most representative transparent electrode in the modern society is ITO (Indium Tin Oxide). ITO is widely used in general for touch panels and displays due to its high electrical and optical properties. However, in general, mechanical deformation causes deterioration and destruction of device properties because ITO is basically vulnerable to mechanical deformation. Therefore, the in-depth understanding on the stability of ITO film during various mechanical deformations is necessary. In this study, the reliability and mechanical properties ITO sample having different length, width, and area were investigated. The electrical stability was estimated according to electrical resistance change. The stability was dropped as the sample length, and width increased and the sample area decreased. The electrical stability of ITO film was correlated with twisting strain including tensile, compressive and shear stress.
Keywords
Flexible; ITO; Twisting; Strain; Reliability;
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Times Cited By KSCI : 3  (Citation Analysis)
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