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http://dx.doi.org/10.6117/kmeps.2012.19.3.043

Error Analysis for Microwave Permittivity Measurement using Post Resonator Method  

Cho, Mun-Seong (Department of Electronic Engineering, Korea National University of Transportation)
Lim, Donggun (Department of Electronic Engineering, Korea National University of Transportation)
Park, Jae-Hwan (Department of Electronic Engineering, Korea National University of Transportation)
Park, Jae-Gwan (Nanophotonics Research Center, Korea Institute of Science and Technology)
Publication Information
Journal of the Microelectronics and Packaging Society / v.19, no.3, 2012 , pp. 43-48 More about this Journal
Abstract
Errors of relative permittivity calculation caused by the variation of sample aspect ratio (diameter/height) and measuring geometry were analyzed by computer simulation and measurement. Firstly, the $S_{21}$ spectrum of the sample (permittivity 38) was simulated in the post resonator measuring apparatus by HFSS simulation. Then, the relative permittivity was calculated from the $TE_{011}$ mode resonant frequency. The relative permittivity varied by ca. 0.3% with sample aspect ratio variation (D/H=0.8~1.6). The relative permittivity varied by ca. 1~10% when the 1~10% of air-gap was introduced in between the dielectric disk and upper conductor. All the simulation results showed consistent tendency with real measurement.
Keywords
post resonator; permittivity; HFSS; microwave dielectrics;
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