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http://dx.doi.org/10.6117/kmeps.2012.19.3.021

Electrically Programmable Fuse - Application, Program and Reliability  

Kim, Deok-Kee (세종대학교 전자공학과)
Publication Information
Journal of the Microelectronics and Packaging Society / v.19, no.3, 2012 , pp. 21-30 More about this Journal
Abstract
Technology trend and application of laser fuse, anti-fuse, and eFUSE as well as the structure, programming mechanism, and reliability of eFUSE have been reviewed. In order to ensure eFUSE reliability in the field, a sensing circuit trip point consistent with the fuse resistance distribution, process variation, and device degradation in the circuit such as hot carrier or NBTI, as well as fuse resistance reliability must be considered to optimize and define a reliable fuse programming window.
Keywords
eFUSE; Electromigration; Thermomigration; Joule heating; Reliability;
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Times Cited By KSCI : 1  (Citation Analysis)
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