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http://dx.doi.org/10.6117/kmeps.2011.18.4.011

Characterization and observation of Cu-Cu Thermo-Compression Bonding using 4-point bending test system  

Kim, Jae-Won (Department of Nano-Mechanics, Korea Institute of Machinery & Materials)
Kim, Kwang-Seop (Department of Nano-Mechanics, Korea Institute of Machinery & Materials)
Lee, Hak-Joo (Department of Nano-Mechanics, Korea Institute of Machinery & Materials)
Kim, Hee-Yeon (Sa-FPA Team, National Nanofab Center)
Park, Young-Bae (School of Materials Science and Engineering, Andong National University)
Hyun, Seung-Min (Department of Nano-Mechanics, Korea Institute of Machinery & Materials)
Publication Information
Journal of the Microelectronics and Packaging Society / v.18, no.4, 2011 , pp. 11-18 More about this Journal
Abstract
The quantitative interfacial adhesion energy of the Cu-Cu direct bonding layers was evaluated in terms of the bonding temperature and Ar+$H_2$ plasma treatment on Cu surface by using a 4-point bending test. The interfacial adhesion energy and bonding quality depend on increased bonding temperature and post-annealing temperature. With increasing bonding temperature from $250^{\circ}C$ to $350^{\circ}C$, the interfacial adhesion energy increase from $1.38{\pm}1.06$ $J/m^2$ to $10.36{\pm}1.01$ $J/m^2$. The Ar+$H_2$ plasma treatment on Cu surface drastically increase the interfacial adhesion energy form $1.38{\pm}1.06$ $J/m^2$ to $6.59{\pm}0.03$ $J/m^2$. The plasma pre-treatment successfully reduces processing temperature of Cu to Cu direct bonding.
Keywords
Adhesion; 4-point bending test; 3-D Chip stacking; Bonding temperature effect; Ar-$H_2$ plasma pre-treatment;
Citations & Related Records
Times Cited By KSCI : 5  (Citation Analysis)
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