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| 1 |
Cross-Sectional Transmission Electron Microscopy Specimen Preparation Technique by Backside Ar Ion Milling
Yoo, Jung Ho;Yang, Jun-Mo;
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Korean Society of Microscopy
, v.45, no.4, pp.189-194,
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| 2 |
Preparation Method of Plan-View Transmission Electron Microscopy Specimen of the Cu Thin-Film Layer on Silicon Substrate Using the Focused Ion Beam with Gas-Assisted Etch
Kim, Ji-Soo;Nam, Sang-Yeol;Choi, Young-Hwan;Park, Ju-Cheol;
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Korean Society of Microscopy
, v.45, no.4, pp.195-198,
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| 3 |
Transmission Electron Microscopy Sample Preparation of Ge2Sb2Te5 Nanowire Using Electron Beam
Lee, Hee-Sun;Lee, Jun-Young;Yeo, Jong-Souk;
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Korean Society of Microscopy
, v.45, no.4, pp.199-202,
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| 4 |
Transmission Electron Microscope Sampling Method for Three-Dimensional Structure Analysis of Two-Dimensional Soft Materials
Lee, Sang-Gil;Lee, Ji-Hyun;Yoo, Seung Jo;Datta, Suvo Jit;Hwang, In-Chul;Yoon, Kyung-Byung;Kim, Jin-Gyu;
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Korean Society of Microscopy
, v.45, no.4, pp.203-207,
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| 5 |
Advanced Methodologies for Manipulating Nanoscale Features in Focused Ion Beam
Kim, Yang-Hee;Seo, Jong-Hyun;Lee, Ji Yeong;Ahn, Jae-Pyoung;
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Korean Society of Microscopy
, v.45, no.4, pp.208-213,
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| 6 |
Specimen Preparation for Scanning Electron Microscope Using a Converted Sample Stage
Kim, Hyelan;Kim, Hyo-Sik;Yu, Seungmin;Bae, Tae-Sung;
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Korean Society of Microscopy
, v.45, no.4, pp.214-217,
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| 7 |
Technical Overview on the Electron Backscattered Diffraction Sample Preparation
Kim, Dong-Ik;Kim, Byung-Kyu;Kim, Ju-Heon;
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Korean Society of Microscopy
, v.45, no.4, pp.218-224,
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| 8 |
Atomic Resolution Scanning Transmission Electron Microscopy of Two-Dimensional Layered Transition Metal Dichalcogenides
Lu, Ning;Wang, Jinguo;Oviedo, uan Pablo;Lian, Guoda;Kim, Moon Jea;
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Korean Society of Microscopy
, v.45, no.4, pp.225-229,
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| 9 |
Crystallography Analysis of the β-Mg17Al12 Precipitates by the Secondary Constrained Coincident Site Lattice Model
Huang, Xuefei;Huang, Weigang;
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Korean Society of Microscopy
, v.45, no.4, pp.230-235,
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| 10 |
Characterization and Electrical Conductivity of Carbon-Coated Metallic (Ni, Cu, Sn) Nanocapsules
Wang, Dong Xing;Shah, Asif;Zhou, Lei;Zhang, Xue Feng;Liu, Chun Jing;Huang, Hao;Dong, Xing Long;
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Korean Society of Microscopy
, v.45, no.4, pp.236-241,
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| 11 |
Characterization of SiC/C Nanocomposite Powders Synthesized by Arc-Discharge
Zhou, Lei;Yu, Jie Yi;Gao, Jian;Wang, Dong Xing;Gan, Xiao Rong;Xue, Fang Hong;Huang, Hao;Dong, Xing Long;
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Korean Society of Microscopy
, v.45, no.4, pp.242-248,
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| 12 |
Scanning Electron Microscopic Study of Slime Formations in a Water Injection Station of Oil India Limited in Assam, India
Bhagobaty, Ranjan K.;Purohit, S.;Nihalani, M.C.;
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Korean Society of Microscopy
, v.45, no.4, pp.249-253,
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| 13 |
The Structure of Visual Cells in the Retina of the Pond Loach, Misgurnus anguillicaudatus (Pisces; Cobitidae)
Kim, Chi-Hong;Kim, Jae-Goo;Park, Jong-Young;
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Korean Society of Microscopy
, v.45, no.4, pp.254-258,
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