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http://dx.doi.org/10.7735/ksmte.2013.22.6.931

Finite Element Analysis of Large-Electron-Beam Polishing-Induced Temperature Distribution  

Kim, J.S. (Ulsan National Institute of Science and Technology (UNIST))
Kim, J.S. (Korea Institute of Industrial Technology (KITECH))
Kang, E.G. (Korea Institute of Industrial Technology (KITECH))
Lee, S.W. (Korea Institute of Industrial Technology (KITECH))
Park, H.W. (Ulsan National Institute of Science and Technology (UNIST))
Publication Information
Journal of the Korean Society of Manufacturing Technology Engineers / v.22, no.6, 2013 , pp. 931-936 More about this Journal
Abstract
Recently, the use of large-electron-beam polishing for polishing complex metal surfaces has been proposed. In this study, the temperature induced by a large electron beam was predicted using the heat transfer theory. A finite element (FE) model of a continuous wave (CW) electron beam was constructed assuming Gaussian distribution. The temperature distribution and melting depth of an SUS304 sample were predicted by changing electron-beam polishing process parameters such as energy density and beam velocity. The results obtained using the developed FE model were compared with experimental results for verifying the melting depth prediction capability of the developed FE model.
Keywords
Electron beam polishing; Finite element model; Temperature distribution; Melting depth; SUS304;
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