Thermal Characterization of Individual Pixels in Microbolometer Image Sensors by Thermoreflectance Microscopy |
Ryu, Seon Young
(Division of Scientific Instrumentation, Korea Basic Science Institute)
Choi, Hae Young (Division of Scientific Instrumentation, Korea Basic Science Institute) Kim, Dong Uk (Division of Scientific Instrumentation, Korea Basic Science Institute) Kim, Geon Hee (Division of Scientific Instrumentation, Korea Basic Science Institute) Kim, Taehyun (National NanoFab Center) Kim, Hee Yeoun (National NanoFab Center) Chang, Ki Soo (Division of Scientific Instrumentation, Korea Basic Science Institute) |
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