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JSTS:Journal of Semiconductor Technology and Science  

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1 Investigations on the Optimal Support Vector Machine Classifiers for Predicting Design Feasibility in Analog Circuit Optimization
Lee, Jiho;Kim, Jaeha; / The Institute of Electronics and Information Engineers , v.15, no.5, pp.437-444,
2 An Efficient Error Detection Technique for 3D Bit-Partitioned SRAM Devices
Yoon, Heung Sun;Park, Jong Kang;Kim, Jong Tae; / The Institute of Electronics and Information Engineers , v.15, no.5, pp.445-454,
3 EMI Issues in Pseudo-Differential Signaling for SDRAM Interface
Jang, Young-Jae;Yi, Il-Min;Kim, Byungsub;Sim, Jae-Yoon;Park, Hong-June; / The Institute of Electronics and Information Engineers , v.15, no.5, pp.455-462,
4 Realistic Circuit Model of an Impact-Based Piezoelectric Energy Harvester
Kim, Sunhee;Ju, Suna;Ji, Chang-Hyeon;Lee, Seungjun; / The Institute of Electronics and Information Engineers , v.15, no.5, pp.463-469,
5 A Class-C Type Wideband Current-Reused VCO With Two-Step Automatic Amplitude Calibration Loop
Choi, Jin-Wook;Choi, Seung-Won;Kim, InSeong;Lee, DongSoo;Park, HyungGu;Pu, YoungGun;Lee, Kang-Yoon; / The Institute of Electronics and Information Engineers , v.15, no.5, pp.470-475,
6 Efficient Management of PCM-based Swap Systems with a Small Page Size
Park, Yunjoo;Bahn, Hyokyung; / The Institute of Electronics and Information Engineers , v.15, no.5, pp.476-484,
7 Large-Signal Output Equivalent Circuit Modeling for RF MOSFET IC Simulation
Hong, Seoyoung;Lee, Seonghearn; / The Institute of Electronics and Information Engineers , v.15, no.5, pp.485-489,
8 Growth of AlN/GaN HEMT structure Using Indium-surfactant
Kim, Jeong-Gil;Won, Chul-Ho;Kim, Do-Kywn;Jo, Young-Woo;Lee, Jun-Hyeok;Kim, Yong-Tae;Cristoloveanu, Sorin;Lee, Jung-Hee; / The Institute of Electronics and Information Engineers , v.15, no.5, pp.490-496,
9 Frequency-dependent C-V Characteristic-based Extraction of Interface Trap Density in Normally-off Gate-recessed AlGaN/GaN Heterojunction Field-effect Transistors
Choi, Sungju;Kang, Youngjin;Kim, Jonghwa;Kim, Jungmok;Choi, Sung-Jin;Kim, Dong Myong;Cha, Ho-Young;Kim, Hyungtak;Kim, Dae Hwan; / The Institute of Electronics and Information Engineers , v.15, no.5, pp.497-503,
10 A Single-Ended ADC with Split Dual-Capacitive-Array for Multi-Channel Systems
Cho, Seong-Jin;Kim, Ju Eon;Shin, Dong Ho;Yoon, Dong-Hyun;Jung, Dong-Kyu;Jeon, Hong Tae;Lee, Seok;Baek, Kwang-Hyun; / The Institute of Electronics and Information Engineers , v.15, no.5, pp.504-510,
11 An Analytical Approach to Evaluation of SSD Effects under MapReduce Workloads
Ahn, Sungyong;Park, Sangkyu; / The Institute of Electronics and Information Engineers , v.15, no.5, pp.511-518,
12 Comparative Analysis on Positive Bias Stress-Induced Instability under High VGS/Low VDS and Low VGS/High VDS in Amorphous InGaZnO Thin-Film Transistors
Kang, Hara;Jang, Jun Tae;Kim, Jonghwa;Choi, Sung-Jin;Kim, Dong Myong;Kim, Dae Hwan; / The Institute of Electronics and Information Engineers , v.15, no.5, pp.519-525,
13 Analysis of Instability Mechanism under Simultaneous Positive Gate and Drain Bias Stress in Self-Aligned Top-Gate Amorphous Indium-Zinc-Oxide Thin-Film Transistors
Kim, Jonghwa;Choi, Sungju;Jang, Jaeman;Jang, Jun Tae;Kim, Jungmok;Choi, Sung-Jin;Kim, Dong Myong;Kim, Dae Hwan; / The Institute of Electronics and Information Engineers , v.15, no.5, pp.526-532,
14 Thermal Characterization of Individual Pixels in Microbolometer Image Sensors by Thermoreflectance Microscopy
Ryu, Seon Young;Choi, Hae Young;Kim, Dong Uk;Kim, Geon Hee;Kim, Taehyun;Kim, Hee Yeoun;Chang, Ki Soo; / The Institute of Electronics and Information Engineers , v.15, no.5, pp.533-538,
15 Offline Deduplication for Solid State Disk Using a Lightweight Hash Algorithm
Park, Eunsoo;Shin, Dongkun; / The Institute of Electronics and Information Engineers , v.15, no.5, pp.539-545,
16 Preventing Fast Wear-out of Flash Cache with An Admission Control Policy
Lee, Eunji;Bahn, Hyokyung; / The Institute of Electronics and Information Engineers , v.15, no.5, pp.546-553,
17 Design and Analysis of Gate-recessed AlGaN/GaN Fin-type Field-Effect Transistor
Jang, Young In;Seo, Jae Hwa;Yoon, Young Jun;Eun, Hye Rim;Kwon, Ra Hee;Lee, Jung-Hee;Kwon, Hyuck-In;Kang, In Man; / The Institute of Electronics and Information Engineers , v.15, no.5, pp.554-562,
18 Process-Variation-Adaptive Charge Pump Circuit using NEM (Nano-Electro-Mechanical) Relays for Low Power Consumption and High Power Efficiency
Byeon, Sangdon;Shin, Sanghak;Song, Jae-Sang;Truong, Son Ngoc;Mo, Hyun-Sun;Lee, Seongsoo;Min, Kyeong-Sik; / The Institute of Electronics and Information Engineers , v.15, no.5, pp.563-569,
19 Optimizing Fsync Performance with Dynamic Queue Depth Adaptation
Park, Daejun;Kim, Min Ji;Shin, Dongkun; / The Institute of Electronics and Information Engineers , v.15, no.5, pp.570-576,
20 Correlation between Reverse Voltage Characteristics and Bypass Diode Operation with Different Shading Conditions for c-Si Photovoltaic Module Package
Lim, Jong-Rok;Min, YongKi;Jung, Tae-Hee;Ahn, Jae-Hyun;Ahn, Hyung-Keun; / The Institute of Electronics and Information Engineers , v.15, no.5, pp.577-584,